Abstract: The present disclosure relates to methods and apparatus for testing the true capabilities of devices connected to a computer. Methods consistent with the present disclosure may include generating test commands to send to a data storage device under test while storing information related to the commands sent to the data storage device in a low latency buffer. The low latency buffer may temporarily store command related data while data from a plurality of commands are organized and persistently stored in memory of a persistent data storage device. The low latency buffer may include or be comprised of high speed random access memory and the persistent data storage device may be a solid state drive or hard disk drive. Preferably, the persistent data storage device will store command test sequences that span long periods of time of hours or days.

Abstract: The present disclosure relates to methods and apparatus for testing the true capabilities of devices connected to a computer. Methods consistent with the present disclosure may include generating test commands to send to a data storage device under test while storing information related to the commands sent to the data storage device in a low latency buffer. The low latency buffer may temporarily store command related data while data from a plurality of commands are organized and persistently stored in memory of a persistent data storage device. The low latency buffer may include or be comprised of high speed random access memory and the persistent data storage device may be a solid state drive or hard disk drive. Preferably, the persistent data storage device will store command test sequences that span long periods of time of hours or days.