Patents by Inventor Tom Q. Y. Li

Tom Q. Y. Li has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6449047
    Abstract: Swept-wavelength lasers with accurately calibrated wavelength output which can be very rapidly scanned or swept over a selected wavelength band. The invention provides lasers that generate wavelengths in the 1550 nm range that can be swept over about 50 nm. These swept-wavelength lasers are generally useful as accurately calibrated high power light sources. Calibration is achieved by use of a calibrated reference system. Swept-wavelength lasers are particularly useful as components of sensor interrogator systems which determine wavelengths reflected (or transmitted) by Fiber Bragg Gratings (FBG) in sensor arrays. Swept wavelength lasers of this invention are also generally useful for testing of WDM systems, particularly for their applications to current communication systems. the invention provides lasers, interrogator systems and systems for testing WDM components employing the lasers as a calibrated light source.
    Type: Grant
    Filed: November 12, 1999
    Date of Patent: September 10, 2002
    Assignee: Micron Optics, Inc.
    Inventors: Yufei Bao, David Daugherty, Kevin Hsu, Tom Q. Y. Li, Calvin M. Miller, Jeff W. Miller
  • Patent number: 6327036
    Abstract: A multi-wavelength reference for use in identifying and measuring wavelengths of radiation from an optical device. The invention provides an interferometer to generate a comb of accurately spaced peaks spanning a selected wavelength range combined with a fiber Bragg grating (FBG) of known Bragg wavelength to generate a peak or notch of known wavelength for use in identifying or marking a peak of the comb. The combination provides an accurate multi-wavelength reference useful in particular with high resolution wavelength scanners, such as tunable FFPI. The invention further provides systems for controlling, and/or compensating for, relative shifts in the wavelengths of the interferometer and the FBG as a function of changing temperature.
    Type: Grant
    Filed: September 5, 2000
    Date of Patent: December 4, 2001
    Assignee: Micron Optics, Inc.
    Inventors: Yufei Bao, David Daugherty, Kevin Hsu, Tom Q. Y. Li, Jeffrey W. Miller, Calvin M. Miller
  • Patent number: 6115122
    Abstract: A multi-wavelength reference for use in identifying and measuring wavelengths of radiation from an optical device. The invention provides an interferometer to generate a comb of accurately spaced peaks spanning a selected wavelength range combined with a fiber Bragg grating (FBG) of known Bragg wavelength to generate a peak or notch of known wavelength for use in identifying or marking a peak of the comb. The combination provides an accurate multi-wavelength reference useful in particular with high resolution wavelength scanners, such as tunable FFPI. The invention further provides systems for controlling, and/or compensating for, relative shifts in the wavelengths of the interferometer and the FBG as a function of changing temperature.
    Type: Grant
    Filed: April 5, 1999
    Date of Patent: September 5, 2000
    Assignee: Micron Optics, Inc.
    Inventors: Yufei Bao, David Daugherty, Kevin Hsu, Tom Q. Y. Li, Jeffrey W. Miller, Calvin M. Miller
  • Patent number: 5892582
    Abstract: A multi-wavelength reference for use in identifying and measuring wave-lengths of radiation from an optical device. The invention provides an interferometer to generate a comb of accurately spaced peaks spanning a selected wavelength range combined with a fiber Bragg grating (FBG) of known Bragg wavelength to generate a peak or notch of known wavelength for use in identifying or marking a peak of the comb. The combination provides an accurate multi-wavelength reference useful in particular with high resolution wavelength scanners, such as tunable FFPI. The invention further provides systems for controlling, and/or compensating for, relative shifts in the wavelengths of the interferometer and the FBG as a function of changing temperature.
    Type: Grant
    Filed: July 21, 1997
    Date of Patent: April 6, 1999
    Assignee: Micron Optics, Inc.
    Inventors: Yufei Bao, David Daugherty, Kevin Hsu, Tom Q. Y. Li, Calvin M. Miller, Jeffrey W. Miller