Tom Wright has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
Abstract: A spectral characterization method accurately characterizes an applied signal spectrum that has multiple, spectrally-separated signal peaks. The method detects signal peaks within the spectrum and measures the spectral content of that spectrum using a first measurement bandwidth that is sufficiently wide to encompass each of the signal peaks and accurately measure a signal component of the spectrum. Spectral content of the spectrum measured using a narrow measurement bandwidth that accurately characterizes a noise component of the spectrum. Signal-to-noise ratio for the signal peaks can be calculated based on the measurements performed using the first and second measurement bandwidths. The spectral characterization method is implemented using a spectral measurement instrument having an adjustable measurement bandwidth.
January 19, 2000
Date of Patent:
December 16, 2003
Agilent Technologies, Inc.
Gerard Chappell, Tom Wright, Brian Kane