Patents by Inventor Tom Yu Ouyang

Tom Yu Ouyang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9064147
    Abstract: Handwriting interpretation tools, such as optical character recognition (OCR), have improved over the years such that OCR is a common tool in business for interpreting typed text and sometimes handwritten text. OCR does not apply well to non-text-only diagrams, such as chemical structure diagrams. A method according to an embodiment of the present invention of interpreting a human-drawn sketch includes determining a local metric indicating whether a candidate symbol belongs to a certain classification based on a set of features. The set of features includes, as a feature, scores generated from feature images of the candidate symbol. Also included is determining a joint metric of multiple candidate symbols based on their respective classifications and interpreting the sketch as a function of the local and joint metrics.
    Type: Grant
    Filed: March 19, 2014
    Date of Patent: June 23, 2015
    Assignee: Massachusetts Institute of Technology
    Inventors: Tom Yu Ouyang, Randall Davis
  • Publication number: 20140205188
    Abstract: Handwriting interpretation tools, such as optical character recognition (OCR), have improved over the years such that OCR is a common tool in business for interpreting typed text and sometimes handwritten text. OCR does not apply well to non-text-only diagrams, such as chemical structure diagrams. A method according to an embodiment of the present invention of interpreting a human-drawn sketch includes determining a local metric indicating whether a candidate symbol belongs to a certain classification based on a set of features. The set of features includes, as a feature, scores generated from feature images of the candidate symbol. Also included is determining a joint metric of multiple candidate symbols based on their respective classifications and interpreting the sketch as a function of the local and joint metrics.
    Type: Application
    Filed: March 19, 2014
    Publication date: July 24, 2014
    Applicant: Massachusetts Institute of Technology
    Inventors: Tom Yu Ouyang, Randall Davis
  • Patent number: 8718375
    Abstract: Handwriting interpretation tools, such as optical character recognition (OCR), have improved over the years such that OCR is a common tool in business for interpreting typed text and sometimes handwritten text. OCR does not apply well to non-text-only diagrams, such as chemical structure diagrams. A method according to an embodiment of the present invention of interpreting a human-drawn sketch includes determining a local metric indicating whether a candidate symbol belongs to a certain classification based on a set of features. The set of features includes, as a feature, scores generated from feature images of the candidate symbol. Also included is determining a joint metric of multiple candidate symbols based on their respective classifications and interpreting the sketch as a function of the local and joint metrics.
    Type: Grant
    Filed: December 2, 2011
    Date of Patent: May 6, 2014
    Assignee: Massachusetts Institute of Technology
    Inventors: Tom Yu Ouyang, Randall Davis
  • Publication number: 20120141032
    Abstract: Handwriting interpretation tools, such as optical character recognition (OCR), have improved over the years such that OCR is a common tool in business for interpreting typed text and sometimes handwritten text. OCR does not apply well to non-text-only diagrams, such as chemical structure diagrams. A method according to an embodiment of the present invention of interpreting a human-drawn sketch includes determining a local metric indicating whether a candidate symbol belongs to a certain classification based on a set of features. The set of features includes, as a feature, scores generated from feature images of the candidate symbol. Also included is determining a joint metric of multiple candidate symbols based on their respective classifications and interpreting the sketch as a function of the local and joint metrics.
    Type: Application
    Filed: December 2, 2011
    Publication date: June 7, 2012
    Applicant: Massachusetts Institute of Technology
    Inventors: Tom Yu Ouyang, Randall Davis