Patents by Inventor Tomas Trnkocy

Tomas Trnkocy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220305584
    Abstract: Deposition of debris produced in laser ablation of a workpiece situated in a vacuum chamber is reduced by introduction a background gas into the vacuum chamber prior to or during laser ablation. The background gas can be introduced diffusely into the vacuum chamber and can reduce contamination of surfaces such as a surface of an optical window that faces the workpiece during processing. Directed introduction of a background gas can be used as well and in some cases the same or a different background gas is directed to a workpiece surface at the same or different pressure than that associated with diffuse introduction of the background gas to reduce contamination of the workpiece surface with laser ablation debris.
    Type: Application
    Filed: March 24, 2021
    Publication date: September 29, 2022
    Applicant: FEI Company
    Inventors: Tomas Gancarcik, Ivan Dekan, David Krobot, Tomas Trnkocy, Steven J. Randolph, Remco Geurts
  • Patent number: 9741527
    Abstract: A specimen holder for a Charged Particle Microscope is disclosed. The holder has a support structure with an elongated member including a specimen mounting zone. The specimen mounting zone comprises a rotor with an axis perpendicular to the elongated member with a paddle connected to it which may be rotated. Specimens may be mounted on the paddle so that rotation of the paddle allows specimens to be rotated and/or inverted for microscopic observation on both sides. Specimens may either be directly mounted on the paddle, or on a grid, half-moon grid, lift-out grid, aperture frame, dielectric film, etc.
    Type: Grant
    Filed: December 21, 2015
    Date of Patent: August 22, 2017
    Assignee: FEI Company
    Inventors: Tomas Vystavel, Josef Sestak, Pavel Poloucek, Lubomir Tuma, Michal Hrouzek, Tomas Trnkocy, Martin Cafourek
  • Publication number: 20160181059
    Abstract: A specimen holder for a Charged Particle Microscope, comprising: A support structure; An elongated member, a first end of which is connected to said support structure and the second end of which comprises a specimen mounting zone, the member having a longitudinal axis that extends along its length between said first and second ends, wherein said specimen mounting zone comprises: A rotor that is rotatable about a transverse axis extending substantially perpendicular to said longitudinal axis; A paddle connected to said rotor so as to be rotatable about said transverse axis, the paddle comprising a specimen mounting area; Driving means connected to said rotor, which can be invoked to rotate said paddle through a rotational range that allows the paddle to be inverted relative to an initial orientation thereof.
    Type: Application
    Filed: December 21, 2015
    Publication date: June 23, 2016
    Applicant: FEI Company
    Inventors: Tomas Vystavel, Josef Sestak, Pavel Poloucek, Lubomir Tuma, Michal Hrouzek, Tomas Trnkocy, Martin Cafourek