Abstract: There is provided a computer implemented method of disabling a malicious electronic control unit (ECU) of a plurality of ECUs in communication with a controller area network (CAN) bus network, the method executed by a computing device in communication with the plurality of ECUs and the CAN bus network, the method comprising: detecting a malicious message transmitted by the malicious ECU over the CAN bus network, and injecting a plurality of bits over the CAN bus network to trigger a predefined plurality of errors for disabling the malicious ECU before the malicious ECU makes an additional attempt to retransmit an additional instance of the malicious message.

Abstract: A method for processing signals of active sensor systems including processing an emitted signal to include at least one distinguishing feature, the emitted signal emitted by an active sensor system adapted to intercept a reflection of the emitted signal, and to analyze the reflection of the emitted signal for determining at least one parameter of at least one object located in a space, analyzing an intercepted portion to verify the at least one distinguishing feature in the intercepted portion, and processing the intercepted portion as the reflection of the emitted signal when the at least one distinguishing feature is verified.

Abstract: There is provided a computer implemented method of disabling a malicious electronic control unit (ECU) of a plurality of ECUs in communication with a controller area network (CAN) bus network, the method executed by a computing device in communication with the plurality of ECUs and the CAN bus network, the method comprising: detecting a malicious message transmitted by the malicious ECU over the CAN bus network, and injecting a plurality of bits over the CAN bus network to trigger a predefined plurality of errors for disabling the malicious ECU before the malicious ECU makes an additional attempt to retransmit an additional instance of the malicious message.

Abstract: There is provided a computer implemented method of disabling a malicious electronic control unit (ECU) of a plurality of ECUs in communication with a controller area network (CAN) bus network, the method executed by a computing device in communication with the plurality of ECUs and the CAN bus network, the method comprising: detecting a malicious message transmitted by the malicious ECU over the CAN bus network, and injecting a plurality of bits over the CAN bus network to trigger a predefined plurality of errors for disabling the malicious ECU before the malicious ECU makes an additional attempt to retransmit an additional instance of the malicious message.

Abstract: There is provided a computer implemented method of disabling a malicious electronic control unit (ECU) of a plurality of ECUs in communication with a controller area network (CAN) bus network, the method executed by a computing device in communication with the plurality of ECUs and the CAN bus network, the method comprising: detecting a malicious message transmitted by the malicious ECU over the CAN bus network, and injecting a plurality of bits over the CAN bus network to trigger a predefined plurality of errors for disabling the malicious ECU before the malicious ECU makes an additional attempt to retransmit an additional instance of the malicious message.

Abstract: A method for processing signals of active sensor systems including processing an emitted signal to include at least one distinguishing feature, the emitted signal emitted by an active sensor system adapted to intercept a reflection of the emitted signal, and to analyze the reflection of the emitted signal for determining at least one parameter of at least one object located in a space, analyzing an intercepted portion to verify the at least one distinguishing feature in the intercepted portion, and processing the intercepted portion as the reflection of the emitted signal when the at least one distinguishing feature is verified.

Abstract: An inspection system for inspecting a semiconductor substrate, the inspection system may include an inspection unit that comprises a partially blocking bright field unit and a non-blocking bright field unit; wherein the partially blocking bright field unit is configured to block any specular reflection that fulfills the following: (a) the specular reflection is caused by illuminating, along a first axis, of an area of the wafer, (b) the specular reflection propagates along a second axis, (c) the first axis and the second axis are symmetrical about a normal to the area of the wafer, and (d) the normal is parallel to an optical axis of the partially blocking bright field unit; and wherein the non-blocking bright field unit is configured to pass to the image plane any specular reflection that fulfills the following: (a) the specular reflection is caused by illuminating, along the first axis, of an area of the wafer, (b) the specular reflection propagates along the second axis, (c) the first axis and the second a

Abstract: An aperture stop that includes a non-circular region that comprises at least one opaque region and at least one opening region; wherein each point in the at least one opening region is (a) mapped to an angle of illumination and (b) is associated with a corresponding point in the at least one opaque region that. mapped to an angle of specular reflectance from the angle of illumination mapped to the opening point.

Abstract: An inspection system for inspecting a semiconductor substrate, the inspection system may include an inspection unit that comprises a partially blocking bright field unit and a non-blocking bright field unit; wherein the partially blocking bright field unit is configured to block any specular reflection that fulfills the following: (a) the specular reflection is caused by illuminating, along a first axis, of an area of the wafer, (b) the specular reflection propagates along a second axis, (c) the first axis and the second axis are symmetrical about a normal to the area of the wafer, and (d) the normal is parallel to an optical axis of the partially blocking bright field unit; and wherein the non-blocking bright field unit is configured to pass to the image plane any specular reflection that fulfills the following: (a) the specular reflection is caused by illuminating, along the first axis, of an area of the wafer, (b) the specular reflection propagates along the second axis, (c) the first axis and the second a

Abstract: An aperture stop that includes a non-circular region that comprises at least one opaque region and at least one opening region; wherein each point in the at least one opening region is (a) mapped to an angle of illumination and (b) is associated with a corresponding point in the at least one opaque region that. mapped to an angle of specular reflectance from the angle of illumination mapped to the opening point.

Abstract: A system for measuring heights of multiple structures of an object, the system may include an illumination module that is configured to illuminate the object by a light strip that is spatially incoherent; multiple cameras; a collection module that is configured to collect light that is reflected from the object and to distribute the light to the multiple cameras; wherein the collection module has an elongated field of view that has a longitudinal axis that is parallel to the light strip; wherein the multiple cameras are configured to generate, during a height measurement process, detection signals indicative of heights of the multiple structures; a mechanical stage for introducing a movement, during the height measurement process, between the object and each one of the illumination module and the collection module; and a processor that is configured to process the detection signals to determine the heights of the multiple structures.

Abstract: A system for measuring heights of multiple structures of an object, the system may include an illumination module that is configured to illuminate the object by a light strip that is spatially incoherent; multiple cameras; a collection module that is configured to collect light that is reflected from the object and to distribute the light to the multiple cameras; wherein the collection module has an elongated field of view that has a longitudinal axis that is parallel to the light strip; wherein the multiple cameras are configured to generate, during a height measurement process, detection signals indicative of heights of the multiple structures; a mechanical stage for introducing a movement, during the height measurement process, between the object and each one of the illumination module and the collection module; and a processor that is configured to process the detection signals to determine the heights of the multiple structures.

Abstract: An aperture stop that include a circular region that comprises multiple points, wherein the multiple points comprise multiple opaque region points that are spread across all polar angles and multiple opening points that are spread across all polar angles; and wherein each opening point is (a) mapped to an angle of illumination and (b) is associated with a corresponding opaque region point that is mapped to an angle of specular reflectance from the angle of illumination mapped to the opening point