Abstract: There is provided a system and method of runtime examination of a semiconductor specimen. The method includes obtaining a runtime image representative of an inspection area of the specimen, the runtime image having a relatively low signal-to-noise ratio (SNR); and processing the runtime image using a machine learning (ML) model to obtain examination data specific for a given examination application, wherein the ML model is previously trained for the given examination application using one or more training samples, each training sample representative of a respective reference area sharing the same design pattern as the inspection area and comprising: a first training image of the respective reference area having a relatively low SNR; and label data indicative of ground truth in the respective reference area pertaining to the given examination application, the label data obtained by annotating a second training image of the respective reference area having a relatively high SNR.

Abstract: A method for image segmentation includes receiving, by a processing device, an image. The method further includes applying a machine learning model to the image, wherein the machine-learning model is trained by a training process comprising evaluating training outputs generated during the training process using a loss function. The method further includes obtaining, for each pixel of multiple pixels of the image, an output of the machine learning model within a multi-dimensional domain, wherein the output is obtained by providing the machine-learning model with pixels of different classes of segments of the image that are mapped to spaced apart clusters associated with different axes of the multi-dimensional domain. The method further includes determining, using the machine-learning model and for each pixel of multiple pixels of the image, a class of a segment that comprises the pixel by finding a closest axis to the output.

Abstract: A method for computer vision based hand gesture device control, is provided. The method includes receiving a sequence of images of a field of view; applying a shape recognition algorithm on the sequence of images to detect a shape of a first posture of a hand; and generating a command to initiate device control based on the detection of the shape of the first posture of the hand.