Abstract: An information processing apparatus for, to classify and detect a plurality of types of defects, detecting a defect in a target object without using data obtained by prior learning includes an acquisition unit configured to acquire an image group obtained by capturing a target object irradiated with light from a plurality of illumination units placed at a plurality of different positions, a generation unit configured to, based on luminance information of images included in the image group, generate a first luminance profile indicating a change in a luminance value of a first region, which is a region corresponding between the images, and a second luminance profile indicating a change in a luminance value of a second region, which is a region corresponding between the images, and a detection unit configured to detect a defect in the target object based on the first luminance profile and the second luminance profile.

Abstract: An information processing apparatus includes an image acquisition unit configured to acquire an image obtained by imaging a target object onto which a pattern having a bright portion and a dark portion is projected by a projection unit, an allocation unit configured to allocate, to a pixel in the image, a label corresponding to luminance of the pixel by referring to a characteristic of the pattern, and a correspondence relationship derivation unit configured to derive a correspondence relationship between a position of the pattern in a projection plane of the projection unit and a position of the pattern in the acquired image and a three-dimensional coordinate derivation unit configured to derive three-dimensional coordinates of a surface of the target object based on the derived correspondence relationship.

Abstract: An information processing apparatus includes an obtaining unit configured to obtain information of a plurality of labels applied to the learning data by a plurality of users, information regarding reliability of each applied label itself, and information regarding reliability of a user who applies the relevant label, wherein the information of the label is information regarding a result to be recognized in a case where the predetermined recognition is performed on the learning data and a determination unit configured to determine a label to the learning data from among the plurality of labels based on the reliability of the label itself and the reliability of the user who applies the relevant label.

Abstract: An information processing apparatus includes at least one projection unit configured to project a light pattern on a measuring target object, at least one imaging unit configured to capture an image of the measuring target object with the light pattern projected thereon, a measurement unit configured to measure a distance from the at least one projection unit or imaging unit to the measuring target object based on the image captured by the at least one imaging unit, a determination unit configured to determine whether a measured distance is valid, and a control unit configured to reduce luminance of a light pattern, included in a projected light pattern, which is projected on an area with respect to which the measured distance is determined by the determination unit to be valid.

Abstract: A shape of an object is measured using a plurality of space encoding patterns each of which includes a light portion and a dark portion. A first and second pattern sets are obtained. The first set comprises patterns each of which has the light portion of each space encoding pattern masked by a pattern mask. The second set comprises patterns each of which has the light portion of each of the space encoding pattern masked by a mask with varying the mask pattern. Captured images of an object on which the patterns of the first and second sets are sequentially projected are inputted. A correspondence between projection coordinates of the projected pattern and image coordinates of a captured image for the projected pattern is detected. A shape of the object is derived based on correspondences.

Abstract: A first image of a space onto which a first light pattern formed from bright and dark portions and a coordinate-detection pattern projected onto each region of the space divided by the first pattern have been projected is acquired. A second image is acquired of the space onto which a second light pattern having a boundary position between bright and dark portions that is different from that of the first pattern, and a coordinate-detection pattern projected onto each region of the space divided by the second pattern have been projected. One of the first image and the second image is selected to perform three-dimensional shape measurement of an object included in the space based on the selection image.

Abstract: An information processing apparatus for, to classify and detect a plurality of types of defects, detecting a defect in a target object without using data obtained by prior learning includes an acquisition unit configured to acquire an image group obtained by capturing a target object irradiated with light from a plurality of illumination units placed at a plurality of different positions, a generation unit configured to, based on luminance information of images included in the image group, generate a first luminance profile indicating a change in a luminance value of a first region, which is a region corresponding between the images, and a second luminance profile indicating a change in a luminance value of a second region, which is a region corresponding between the images, and a detection unit configured to detect a defect in the target object based on the first luminance profile and the second luminance profile.

Abstract: An information processing apparatus includes an image acquisition unit configured to acquire an image obtained by imaging a target object onto which a pattern having a bright portion and a dark portion is projected by a projection unit, an allocation unit configured to allocate, to a pixel in the image, a label corresponding to luminance of the pixel by referring to a characteristic of the pattern, and a correspondence relationship derivation unit configured to derive a correspondence relationship between a position of the pattern in a projection plane of the projection unit and a position of the pattern in the acquired image and a three-dimensional coordinate derivation unit configured to derive three-dimensional coordinates of a surface of the target object based on the derived correspondence relationship.

Abstract: A three-dimensional measurement apparatus including: a projection unit configured to project a pattern onto a measurement target object from one or more projection directions; and an image capturing unit configured to obtain one or more captured images by capturing an image of the measurement target object from one or more view points. The three-dimensional measurement apparatus obtains a position of the pattern projected onto the measurement target object based on the one or more captured images obtained by the image capturing unit, and calculates three-dimensional coordinates of a surface of the measurement target object based on the position of the pattern obtained from the one or more captured images and a position of the pattern estimated based on a parameter set that represents internal scattering of the measurement target object.

Abstract: A shape of an object is measured using a plurality of space encoding patterns each of which includes a light portion and a dark portion. A first and second pattern sets are obtained. The first set comprises patterns each of which has the light portion of each space encoding pattern masked by a pattern mask. The second set comprises patterns each of which has the light portion of each of the space encoding pattern masked by a mask with varying the mask pattern. Captured images of an object on which the patterns of the first and second sets are sequentially projected are inputted. A correspondence between projection coordinates of the projected pattern and image coordinates of a captured image for the projected pattern is detected. A shape of the object is derived based on correspondences.

Abstract: Images are obtained from an imaging device. The images represent patterns projected in a time series by a projection device. Each pattern comprises dashed lines each of which has a predetermined width. A longitudinal direction of each dashed line is substantially perpendicular to a base line defined by a segment connecting optical centers of the projection and imaging devices. Each dashed line repeats light and dark in the longitudinal direction. The dashed lines are discriminated based on combinations of the light and dark in the images. Correspondences between projected coordinates and image coordinates of the dashed lines are detected based on information regarding the patterns and a discrimination result of the dashed lines. A three-dimensional shape of the object is calculated based on the correspondences, and calibration data of the projection and imaging devices.

Abstract: A first image of a space onto which a first light pattern formed from bright and dark portions and a coordinate-detection pattern projected onto each region of the space divided by the first pattern have been projected is acquired. A second image is acquired of the space onto which a second light pattern having a boundary position between bright and dark portions that is different from that of the first pattern, and a coordinate-detection pattern projected onto each region of the space divided by the second pattern have been projected. One of the first image and the second image is selected to perform three-dimensional shape measurement of an object included in the space based on the selection image.

Abstract: An information processing apparatus includes at least one projection unit configured to project a light pattern on a measuring target object, at least one imaging unit configured to capture an image of the measuring target object with the light pattern projected thereon, a measurement unit configured to measure a distance from the at least one projection unit or imaging unit to the measuring target object based on the image captured by the at least one imaging unit, a determination unit configured to determine whether a measured distance is valid, and a control unit configured to reduce luminance of a light pattern, included in a projected light pattern, which is projected on an area with respect to which the measured distance is determined by the determination unit to be valid.