Patents by Inventor Tomoaki Nanko

Tomoaki Nanko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20080093556
    Abstract: An infrared gas analyzer includes: a sample cell through which a sample gas containing a measurement component that absorbs an infrared light flows; one or a plurality of light sources that emits the infrared light; and a detector that detects a concentration of the measurement component contained in the sample gas by utilizing a change in the infrared light being absorbed by the measurement component when the sample gas passes through the sample cell.
    Type: Application
    Filed: December 27, 2005
    Publication date: April 24, 2008
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Hideaki Yamagishi, Shigeru Matsumura, Tomoaki Nanko
  • Patent number: 7323687
    Abstract: There are provided an infrared gas analyzer of a simple configuration, capable of taking measurements with high precision when using an infrared light source excellent in thermal responsiveness, and capable of ON/OFF operations at high speed, and an infrared gas analysis method using the same.
    Type: Grant
    Filed: September 22, 2005
    Date of Patent: January 29, 2008
    Assignee: Yokogawa Electric Corporation
    Inventors: Tomoaki Nanko, Hideaki Yamagishi, Shigeru Matsumura
  • Publication number: 20070046925
    Abstract: An infrared gas analyzer includes a flow sensor placed in a gas flow channel in a state in which two heating resistors are kept with a given spacing. The infrared gas analyzer further includes a substrate having a flat plane placed in parallel with the gas flow direction of the gas flow channel and a hole made in the flat plane of the substrate. The gas flow channel is provided in parallel with one face of a detector. The two heating resistors placed with a predetermined spacing on the substrate across the hole orthogonally to the gas flow direction.
    Type: Application
    Filed: August 24, 2006
    Publication date: March 1, 2007
    Inventors: Hideaki Yamagishi, Junichi Matsuo, Tomoaki Nanko, Shigeru Matsumura
  • Publication number: 20060118724
    Abstract: There are provided an infrared gas analyzer of a simple configuration, capable of taking measurements with high precision when using an infrared light source excellent in thermal responsiveness, and capable of ON/OFF operations at high speed, and an infrared gas analysis method using the same.
    Type: Application
    Filed: September 22, 2005
    Publication date: June 8, 2006
    Inventors: Tomoaki Nanko, Hideaki Yamagishi, Shigeru Matsumura
  • Patent number: 6322037
    Abstract: A moving mirror support device for use with photo-interferometers having first leaf springs arranged in parallel with one end thereof being fixed to a base; a coupling plate fixed to the other ends of the first leaf springs; and second leaf springs arranged in parallel with each of the first springs with one end thereof being fixed to the coupling plate and the other end being fixed to the moving mirror, whereby longitudinal and transverse displacements of the moving mirror can be more accurately controlled.
    Type: Grant
    Filed: September 29, 2000
    Date of Patent: November 27, 2001
    Assignee: Yokogawa Electric Corporation
    Inventors: Tomoaki Nanko, Hisanori Hayashi, Minoru Otsubo, Katsumi Isozaki
  • Patent number: 5715055
    Abstract: A spectroscope comprising an optical fiber placed in a light path to a sample chamber, wherein a light beam outputted from the optical fiber is divided into two using an optical coupler, and wherein the two divided light beams are made incident on a measurement optical fiber and a reference optical fiber, respectively, whereby accuracy of measurement of the spectral characteristics of samples is enhanced because the outgoing light is made incident on the measurement and reference optical fibers concurrently when the light to the sample chamber becomes non-uniform due to environmental changes.
    Type: Grant
    Filed: March 18, 1996
    Date of Patent: February 3, 1998
    Assignee: Yokogawa Electric Corporation
    Inventors: Tomoaki Nanko, Takeo Tanaami, Akihiro Murata
  • Patent number: 5592292
    Abstract: An interference spectrometer which causes an interference by dividing an output light from a light source into two optical paths and by changing the length of each optical path, and which comprises a moving mirror for changing the optical path lengths, position detecting means for detecting the position of the moving mirror and driving control means for controlling the position of the moving mirror, based on the output from the position detecting means. The spectrometer utilizes leaf springs to support the moving mirror, and the driving control means is driven at the natural frequency of the combined moving mirror and leaf springs and based on the output of the position detecting means. Advantageously, the invention has improved vibration resistance and improved power consumption.
    Type: Grant
    Filed: December 12, 1994
    Date of Patent: January 7, 1997
    Assignee: Yokogawa Electric Corporation
    Inventors: Tomoaki Nanko, Takeo Tanaami, Kenta Mikuriya