Patents by Inventor Tomoaki Taquchi

Tomoaki Taquchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for inspecting array substrate
    Patent number: 6815976
    Abstract: An object of the present invention is to provide an apparatus and a method for detecting a defective pixel caused by a punch-through voltage that cannot be detected by a conventional apparatus for inspecting an array substrate. An apparatus for inspecting an array substrate according to the present invention comprises: means for applying a first voltage VGH1 to switching elements so as to accumulate electric charges in storage capacitors and gate-electrode capacitors of the array substrate; and means for applying a second voltage VGH2 having a different voltage value than the first voltage VGH1 has to the switching elements when the electric charges accumulated in the storage capacitors and the gate-electrode capacitors are read.
    Type: Grant
    Filed: July 29, 2003
    Date of Patent: November 9, 2004
    Assignee: International Business Machines Corporation
    Inventor: Tomoaki Taquchi
  • Apparatus and method for inspecting array substrate
    Publication number: 20040100287
    Abstract: An object of the present invention is to provide an apparatus and a method for detecting a defective pixel caused by a punch-through voltage that cannot be detected by a conventional apparatus for inspecting an array substrate. An apparatus for inspecting an array substrate according to the present invention comprises: means for applying a first voltage VGH1 to switching elements so as to accumulate electric charges in storage capacitors and gate-electrode capacitors of the array substrate; and means for applying a second voltage VGH2 having a different voltage value than the first voltage VGH1 has to the switching elements when the electric charges accumulated in the storage capacitors and the gate-electrode capacitors are read.
    Type: Application
    Filed: July 29, 2003
    Publication date: May 27, 2004
    Applicant: International Business Machines Corporation
    Inventor: Tomoaki Taquchi