Patents by Inventor Tomoaki Tezuka

Tomoaki Tezuka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220158614
    Abstract: An acoustic wave device includes a piezoelectric substrate including a first side defining a portion of an outer circumference, and a second side shorter than the first side, IDT electrodes on the piezoelectric substrate, a support including a cavity and on the piezoelectric substrate to surround the IDT electrodes with the cavity, first and second partitioning supports on the piezoelectric substrate and disposed in an inner side of the cavity of the support, and a cover on the support and covering the cavity of the support. An extending direction of the first partitioning support is parallel or substantially parallel to an extending direction of the first side of the piezoelectric substrate. An extending direction of the second partitioning support is orthogonal or substantially orthogonal to the extending direction of the first partitioning support.
    Type: Application
    Filed: January 31, 2022
    Publication date: May 19, 2022
    Inventors: Tomoaki TEZUKA, Toru TAKESHITA, Shinichi FUKUDA
  • Patent number: 7780452
    Abstract: In a listening comprehension test using individual examination execution devices, according to the present invention, it is possible to avoid a dishonest act such as peeping at another examinee's answers. An individual examination execution device (101) reads examination question data and individual information from an examination question storage means (102) storing the examination questions and an individual information storage means (103) storing the individual information, respectively. Further, the individual examination device selectively generates actual questions according to the individual information read by an actual question generation means (104), and reproduces the actual questions by a reproduction means (105), thereby preventing dishonest acts of respective examinees.
    Type: Grant
    Filed: October 17, 2005
    Date of Patent: August 24, 2010
    Assignee: Panasonic Corporation
    Inventors: Kohei Okada, Katsuhiro Nakai, Takehisa Hirano, Kouji Mukai, Tomoaki Tezuka, Daisuke Imoto
  • Publication number: 20100049944
    Abstract: A processor integrated circuit according to the present invention comprises low-speed and high-speed computing units (110), (120) as two or more kinds of computing units, a program memory (131) as a first storage unit in which programs for operation the computing units are stored, a data memory (second storage unit) (132) as a memory area to be used for computation by the computing units, and selectors (141), (142) as first and second connection switching units for connecting a computing unit that performs computation to the first and second storage units, wherein the program memory (131) and the data memory (132) are connected to the low-speed computing unit (110) or the high-speed computing unit (120). In this construction, it is possible to achieve both of securing in program compatibility and speeding-up without increasing the circuit scale and power consumption of the processor integrated circuit.
    Type: Application
    Filed: October 23, 2009
    Publication date: February 25, 2010
    Applicant: Panasonic Corporation
    Inventors: Takehisa Hirano, Katsuhiro Nakai, Tomoaki Tezuka, Kouji Mukai
  • Publication number: 20080020366
    Abstract: In a listening comprehension test using individual examination execution devices, it is possible to avoid a dishonest act such as peeping at another examinee's answers. In an individual examination execution device (101), examination question data and individual information are read from an examination question storage means (102) that stores the examination questions and an individual information storage means (103) that stores the individual information, respectively, and actual questions that are selectively generated according to the individual information read by an actual question generation means (104) are reproduced by a reproduction means (105), thereby preventing dishonest acts of the respective examinees.
    Type: Application
    Filed: October 17, 2005
    Publication date: January 24, 2008
    Inventors: Kohei Okada, Katsuhiro Nakai, Takehisa Hirano, Kouji Mukai, Tomoaki Tezuka, Daisuke Imoto
  • Publication number: 20070275361
    Abstract: An individual examination execution device is provided with a question storage means (14) in which exam questions are stored, a sequence data holding means (12) that holds sequence data as a basis of exam question reproduction sequence, at sequence instruction means (13) for reading the exam questions stored in the question storage means (14), and a reproduction means (15) for reproducing the exam questions stored in the question storage means (14) into audio. The sequence instruction means (13) reads the exam questions stored in the question storage means (14) with reference to the sequence data stored in the sequence data holding means (12), and the exam question reproduction sequence is changed according to the seat position.
    Type: Application
    Filed: March 11, 2005
    Publication date: November 29, 2007
    Inventors: Tomoaki Tezuka, Katsuhiro Nakai, Takehisa Hirano, Kouji Mukai
  • Publication number: 20060206689
    Abstract: A processor integrated circuit according to the present invention comprises low-speed and high-speed computing units (110), (120) as two or more kinds of computing units, a program memory (131) as a first storage unit in which programs for operation the computing units are stored, a data memory (second storage unit) (132) as a memory area to be used for computation by the computing units, and selectors (141), (142) as first and second connection switching units for connecting a computing unit that performs computation to the first and second storage units, wherein the program memory (131) and the data memory (132) are connected to the low-speed computing unit (110) or the high-speed computing unit (120). In this construction, it is possible to achieve both of securing in program compatibility and speeding-up without increasing the circuit scale and power consumption of the processor integrated circuit.
    Type: Application
    Filed: August 6, 2004
    Publication date: September 14, 2006
    Applicant: Matsushita Electric Industrial Co., Ltd.
    Inventors: Takehisa Hirano, Katsuhiro Nakai, Tomoaki Tezuka, Kouji Mukai
  • Publication number: 20050223241
    Abstract: There is provided a semiconductor integrated circuit device (100) for downloading a program of an arithmetic processing unit, such as a DSP or a CPU, from the outside, wherein a rewrite program as secret information not to be leaked to third parties, which is downloaded in a semiconductor integrated circuit (109), is checked as to whether it is correctly downloaded or not while maintaining the confidentiality of the rewrite program. The semiconductor integrated circuit device is provided with a circuit for verifying the contents of the downloaded rewrite program, and/or a program for verifying the contents of the downloaded rewrite program.
    Type: Application
    Filed: June 13, 2003
    Publication date: October 6, 2005
    Applicant: Matsushita Electric Industrial Co. Ltd
    Inventors: Katsuhiro Nakai, Tsuyoshi Nanba, Takehisa Hirano, Tomoaki Tezuka
  • Publication number: 20030065931
    Abstract: A semiconductor IC 1 is provided with an address input terminal 3 to which addresses for reading secret data stored in the semiconductor IC are supplied from the outside; an input terminal 7 to which a switching control signal C1 for selecting the addresses inputted to the address input terminal 3 is supplied; an arithmetic circuit 6 for performing an arithmetic operation according to a predetermined secret rule on secret data D1˜Dm which are read out; and a test output terminal 8 for outputting results E1˜Ek of the arithmetic circuit 6 to the outside of the semiconductor IC 1. Therefore, the secret data D1˜Dm can easily be read to the outside when the semiconductor IC 1 is subjected to a test or the like, while maintaining confidentiality of the secret data.
    Type: Application
    Filed: July 11, 2002
    Publication date: April 3, 2003
    Applicant: Matsushita Electric Industrial Co., Ltd.
    Inventors: Katsuhiro Nakai, Tsuyoshi Namba, Takehisa Hirano, Tomoaki Tezuka, Takamasa Shibauchi