Patents by Inventor Tomohide Sasaki

Tomohide Sasaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Semiconductor inspection device based on use of probe information, and semiconductor inspection method
    Publication number: 20050099196
    Abstract: A semiconductor inspection device and a method of inspection capable of reducing labor for species registration using a prober and of improving operation rate of the prober. The semiconductor inspection device based on use of probe information makes a prober 8 recognize probe information of a probe card 1 measured using a card checker 3 or the like, and the prober 8 automatically recognizes position and height of all probe needles correspondent to electrode pads, by making coincidence of a reference position of an LSI chip with a reference position of said probe information.
    Type: Application
    Filed: November 12, 2004
    Publication date: May 12, 2005
    Applicant: NEC ELECTRONICS CORPORATION
    Inventor: Tomohide Sasaki