Abstract: The present technology relates to an information processing apparatus capable of more easily determining a maintenance timing by using event data. The information processing apparatus includes a state estimation unit that estimates a state of a grindstone by using event data supplied from an event sensor that outputs, as event data, a temporal change of an electrical signal obtained by photoelectrically converting an optical signal, and outputs a result of the estimation. The present technology can be applied to, for example, an information processing system or the like that tells a maintenance timing of a grindstone of a machine tool.

Abstract: A method for more easily improving adhesion of an yttrium-based thin film to an aluminum substrate in a coated aluminum member having the yttrium-based thin film formed on the aluminum substrate is provided. A method for improving adhesion of an yttrium-based thin film to an aluminum substrate in a coated aluminum member having the yttrium-based thin film formed on the aluminum substrate comprises a BHF treatment step of bringing a surface of the yttrium-based thin film into contact with a buffered hydrofluoric acid solution.

Abstract: A controller switches a measurement unit from a non-measurement state to a measurement state to start measurement processing of the measurement target physical amount when a trigger condition having a lowest variation level for a steady state is satisfied in plural trigger conditions set according to a trigger physical amount detected by a trigger detector, and the controller interrupts currently-performed measurement processing to start measurement processing corresponding to a trigger condition having a higher variation level when the trigger condition having the variation level for the steady state higher than that of the trigger condition corresponding to the currently-performed measurement processing is satisfied during performance of the measurement processing.

Abstract: A sink node forming a sensor network system with one or more sensor nodes includes a communication time period allocation means for allocating, to a target sensor node, a communication time period for measurement information transmission by the target sensor node, to not overlap a communication time period for measurement information transmission by a node related to a wireless communication environment between the target sensor node and sink node, concerning measurement information transmission by a sensor target sensor node other than the target sensor node among the one or more sensor nodes. The communication time period allocation means adjusts a communication time period allocated for subsequent measurement information to be transmitted by the target sensor node, based on a predetermined wireless communication parameter related to the wireless communication environment between the target sensor node and sink node, concerning measurement information transmission by the target sensor node.

Abstract: A sink node forming a sensor network system with one or more sensor nodes includes a communication time period allocation means for allocating, to a target sensor node, a communication time period for measurement information transmission by the target sensor node, to not overlap a communication time period for measurement information transmission by a node related to a wireless communication environment between the target sensor node and sink node, concerning measurement information transmission by a sensor target sensor node other than the target sensor node among the one or more sensor nodes. The communication time period allocation means adjusts a communication time period allocated for subsequent measurement information to be transmitted by the target sensor node, based on a predetermined wireless communication parameter related to the wireless communication environment between the target sensor node and sink node, concerning measurement information transmission by the target sensor node.

Abstract: A sensor device includes a first sensor unit, a control IC configured to switch a power supply route, a power supply, a DC converter, and a regulator configured to regulate the voltage. A power supply route A and a power supply route B is provided as a power supply route from the power supply to the sensor unit and the control IC. In the power supply route A, the sensor unit is not electrically conducted to the power supply, and the control IC is directly connected to the power supply. In the power supply route B, the power supply, the DC converter, and the regulator are connected in series, output of the regulator is supplied to the sensor unit, and output of the DC converter is supplied to the control IC. The control IC switches between the power supply route A and the power supply route B according to an operating state of the sensor unit.

Abstract: A sensor device includes a first sensor unit, a control IC configured to switch a power supply route, a power supply, a DC converter, and a regulator configured to regulate the voltage. A power supply route A and a power supply route B is provided as a power supply route from the power supply to the sensor unit and the control IC. In the power supply route A, the sensor unit is not electrically conducted to the power supply, and the control IC is directly connected to the power supply. In the power supply route B, the power supply, the DC converter, and the regulator are connected in series, output of the regulator is supplied to the sensor unit, and output of the DC converter is supplied to the control IC. The control IC switches between the power supply route A and the power supply route B according to an operating state of the sensor unit.

Abstract: A controller switches a measurement unit from a non-measurement state to a measurement state to start measurement processing of the measurement target physical amount when a trigger condition having a lowest variation level for a steady state is satisfied in plural trigger conditions set according to a trigger physical amount detected by a trigger detector, and the controller interrupts currently-performed measurement processing to start measurement processing corresponding to a trigger condition having a higher variation level when the trigger condition having the variation level for the steady state higher than that of the trigger condition corresponding to the currently-performed measurement processing is satisfied during performance of the measurement processing.

Abstract: An RFID tag distance measuring system includes a reader that outputs a predetermined carrier signal to a tag and receives a reflected signal of the carrier signal from the tag. The reader has signal output means for outputting signals at multiple frequencies, which are different from each other, as the carrier signal, a transmitting section that transmits a signal output by the signal output means to the tag, a receiving section that receives reflected signals of the signals at multiple frequencies, which are different from each other, from the tag and estimating means for estimating the distance between the tag and the reader based on the amount of change in phase between the reflected signals received by the receiving section and the carrier signals and the frequencies of the carrier signals.

Abstract: An RFID tag distance measuring system includes a reader that outputs a predetermined carrier signal to a tag and receives a reflected signal of the carrier signal from the tag. The reader has signal output means for outputting signals at multiple frequencies, which are different from each other, as the carrier signal, a transmitting section that transmits a signal output by the signal output means to the tag, a receiving section that receives reflected signals of the signals at multiple frequencies, which are different from each other, from the tag and estimating means for estimating the distance between the tag and the reader based on the amount of change in phase between the reflected signals received by the receiving section and the carrier signals and the frequencies of the carrier signals.