Abstract: A connector is mounted in a connector holder. A test section is moved toward the connector holder by turning a driving mechanism. When probes of the test section come into contact with terminals secured in a housing of the connector mounted in the connector holder, the connector is tested for continuity. If an overload force is applied to the probes during a continuity test, predetermined load breakaway members supporting rear ends of the probes are broken and the probes are moved backward away from the terminals, thereby preventing damage to the terminals or the probes. It is possible to carry out the continuity test again by exchanging the broken breakaway members with new ones.

Abstract: A connector is mounted in a connector holder. A test section is moved toward the connector holder by turning a driving mechanism. When probes of the test section come into contact with terminals secured in a housing of the connector mounted in the connector holder, the connector is tested for continuity. If an overload force is applied to the probes during a continuity test, predetermined load breakaway members supporting rear ends of the probes are broken and the probes are moved backward away from the terminals, thereby preventing damage to the terminals or the probes. It is possible to carry out the continuity test again by exchanging the broken breakaway members with new ones.

Abstract: A housing holder is provided with detectors to be inserted into communication grooves of a connector. The detectors are electrically connected through a lead wire to a test device. The test device is also connected to an adapter electrically connected to a rear end of a probe on each terminal. During a continuity test, incomplete insertion or dropout of a terminal, and a short circuit between terminals are detected by comparing a circuitry formed by a contact of each terminal with the detector and probe with a circuitry stored in the memory of the test device beforehand.