Patents by Inventor Tomoki Sasayama

Tomoki Sasayama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240094130
    Abstract: A Raman infrared compound microscope device includes: a first light source that generates laser light; a second light source that generates infrared light; a third light source that generates visible light; and a first optical system. The first optical system orients the visible light having reached the first optical system in different directions between when performing a Raman analysis using Raman light generated from a sample by irradiation of the laser light and when performing a first infrared analysis using the infrared light having passed through the sample.
    Type: Application
    Filed: June 26, 2023
    Publication date: March 21, 2024
    Applicant: SHIMADZU CORPORATION
    Inventors: Fumiya KATSUTANI, Tomoki SASAYAMA, Tomoyo TAO, Atsuhiko OTAGURO, Ryuta SHIBUTANI, Hisato FUKUDA
  • Publication number: 20230390943
    Abstract: An opening apparatus includes a temperature adjustment section that holds a container body of a PCR container, an opening/closing unit, a moving device, and a control device. The opening and closing unit includes: a rotating member that applies a force to a lid in a direction to open the lid as the rotating member rotates with a projection in contact with the lid in a closed state; and a motor that rotates the rotating member. The moving device moves the temperature adjustment section relative to the rotating member. In conjunction with driving and thus rotating the rotating member, the control device controls the moving device so that the PCR container moves horizontally in a direction from a hinge of the PCR container toward a flange of the PCR container.
    Type: Application
    Filed: September 7, 2021
    Publication date: December 7, 2023
    Applicant: SHIMADZU CORPORATION
    Inventors: Tomoki SASAYAMA, Nobuhiro HANAFUSA
  • Publication number: 20230314219
    Abstract: Microscopic Raman spectroscopy device that detects and analyzes Raman scattering light emitted from sample irradiated with excitation light includes: laser light source that emits excitation light; spectrometer for measuring spectrum of the Raman scattering light; wavelength discriminator such as a dichroic filter that reflects the excitation light emitted from the laser light source toward the sample and transmits Raman scattering light emitted from the sample toward the spectrometer; condenser lens arranged between wavelength discriminator and the spectrometer for condensing the Raman scattering light passing through the wavelength discriminator; aperture arranged between the condenser lens and the spectrometer for limiting Raman scattering light incident on the spectrometer; adjusting means for adjusting to match a position of spot image of Raman scattering light condensed by condensing lens with a position of the aperture so that light amount of Raman scattering light passing through the aperture is maxim
    Type: Application
    Filed: March 19, 2021
    Publication date: October 5, 2023
    Applicant: SHIMADZU CORPORATION
    Inventors: Tomoki SASAYAMA, Yugo ISHIHARA, Takeshi MAJI, Tomoyo TAO
  • Publication number: 20210372868
    Abstract: Provided is a stress measurement device capable of easily grasping the behavior of a stress generation site in a sample. The stress measurement device is provided with a camera for imaging light emitted by a stress luminescent material, a controller for processing an image captured by the camera, and a display for displaying the image processed by the controller. The controller detects the stress generation site according to a luminescence distribution of the stress luminescent material for each of the plurality of time-series images captured by the camera and controls the display such that each stress generation site detected for each of the plurality of images is displayed on one image in a superimposed manner in mutually different display modes.
    Type: Application
    Filed: May 17, 2021
    Publication date: December 2, 2021
    Inventors: Yusuke YOKOI, Momoyo YAMAKAWA, Naoya FUJIWARA, Kenta ADACHI, Hiroaki TSUSHIMA, Tomoki SASAYAMA
  • Patent number: 10161872
    Abstract: An optical measuring device including a sample placement portion for a measurement sample to be placed therein; a light source portion for emitting a measurement beam toward the measurement sample that is placed in the sample placement portion; and a detector for detecting sample information from a measurement sample that is disposed in the sample placement portion; a cover portion that is able to open and close, for accessing the interior of the sample placement portion, is formed on the sample placement portion; an optical element member for not transmitting light of at least a prescribed wavelength band within the measurement beam; and a driving mechanism that is linked mechanically with the opening and closing of the cover portion to move the optical element member.
    Type: Grant
    Filed: April 14, 2016
    Date of Patent: December 25, 2018
    Assignee: SHIMADZU CORPORATION
    Inventor: Tomoki Sasayama
  • Publication number: 20170299515
    Abstract: An optical measuring device including a sample placement portion for a measurement sample to be placed therein; a light source portion for emitting a measurement beam toward the measurement sample that is placed in the sample placement portion; and a detector for detecting sample information from a measurement sample that is disposed in the sample placement portion; a cover portion that is able to open and close, for accessing the interior of the sample placement portion, is formed on the sample placement portion; an optical element member for not transmitting light of at least a prescribed wavelength band within the measurement beam; and a driving mechanism that is linked mechanically with the opening and closing of the cover portion to move the optical element member.
    Type: Application
    Filed: April 14, 2016
    Publication date: October 19, 2017
    Applicant: SHIMADZU CORPORATION
    Inventor: Tomoki SASAYAMA
  • Patent number: 9402059
    Abstract: A microscope is provided. The microscope includes: a detection section for detecting the measurement light; a first image acquisition section emitting the visible light onto a detection surface to obtain an optical image; and a switch mirror or beam splitter disposed on a light path, along which the measurement light from the analysis position of the sample is guided to the detection section. The microscope further includes a second image acquisition section that is disposed in a position apart from the light path of the detection section for obtaining an optical image of a large area which includes the analysis position of the sample, wherein the optical image of the large area is larger than an optical image of an area, which includes the analysis position of the sample, obtained by the first image acquisition section.
    Type: Grant
    Filed: December 27, 2012
    Date of Patent: July 26, 2016
    Assignee: SHIMADZU CORPORATION
    Inventors: Takeshi Maji, Tomoki Sasayama, Kazumi Yokota
  • Patent number: 9068932
    Abstract: A spectrophotometer has a specimen cell; a light source unit for emitting light to the specimen cell; a photodetector for detecting the light that passed through the specimen cell; a light-shielding unit for blocking the light from impinging on the photodetector at predetermined periods; a memory unit for storing output strength signals detected by the photodetector; and a controller for calculating transmittance or absorbance based on output strength signal S of the incidence duration and output strength signal DS of the light-blocked duration stored in the memory unit. The incidence duration and light-blocked duration occur in this sequence in a single period. The controller calculates the true output strength signal sN of the Nth period removed of the effects of output strength signal SN?1 of the incidence duration of the (N?1)th period that are included in the output strength signal SN of the incidence duration of the Nth period.
    Type: Grant
    Filed: June 20, 2012
    Date of Patent: June 30, 2015
    Assignee: Shimadzu Corporation
    Inventors: Toshiro Kimura, Tomoki Sasayama, Daijiro Kato
  • Publication number: 20140163388
    Abstract: Measuring light emitted from a laser light source and split into four light rays through optical fibers is emitted into a space from emission units, and bent upward at a mirror. The measuring light passes through a window in the center of the sample stage and strikes a lower surface of the biological sample placed on the sample stage. A portion of fluorescence emitted through excitation by the measuring light passes through the window, is bent in an opposite direction from the measuring light by the mirror, and guided to a fluorescence camera. An objective lens, and a spectroscopic unit for separating visible wavelength components are horizontally arranged between the camera and the mirror. Although the projection of the measuring light and the detection of the fluorescence are performed perpendicularly to the biological sample, the optical components and elements are horizontally arranged.
    Type: Application
    Filed: December 6, 2013
    Publication date: June 12, 2014
    Applicants: TOKYO UNIVERSITY OF SCIENCE FOUNDATION, SHIMADZU CORPORATION
    Inventors: Tomoki SASAYAMA, Satoshi YAMAMOTO, Kohei SOGA
  • Publication number: 20130242078
    Abstract: A microscope is provided. The microscope includes: a detection section for detecting the measurement light; a first image acquisition section emitting the visible light onto a detection surface to obtain an optical image; and a switch mirror or beam splitter disposed on a light path, along which the measurement light from the analysis position of the sample is guided to the detection section. The microscope further includes a second image acquisition section that is disposed in a position apart from the light path of the detection section for obtaining an optical image of a large area which includes the analysis position of the sample, wherein the optical image of the large area is larger than an optical image of an area, which includes the analysis position of the sample, obtained by the first image acquisition section.
    Type: Application
    Filed: December 27, 2012
    Publication date: September 19, 2013
    Applicant: SHIMADZU CORPORATION
    Inventors: TAKESHI MAJI, TOMOKI SASAYAMA, KAZUMI YOKOTA
  • Publication number: 20120327411
    Abstract: A spectrophotometer has a specimen cell; a light source unit for emitting light to the specimen cell; a photodetector for detecting the light that passed through the specimen cell; a light-shielding unit for blocking the light from impinging on the photodetector at predetermined periods; a memory unit for storing output strength signals detected by the photodetector; and a controller for calculating transmittance or absorbance based on output strength signal S of the incidence duration and output strength signal DS of the light-blocked duration stored in the memory unit. The incidence duration and light-blocked duration occur in this sequence in a single period. The controller calculates the true output strength signal sN of the Nth period removed of the effects of output strength signal SN?1 of the incidence duration of the (N?1)th period that are included in the output strength signal SN of the incidence duration of the Nth period.
    Type: Application
    Filed: June 20, 2012
    Publication date: December 27, 2012
    Applicant: SHIMADZU CORPORATION
    Inventors: Toshiro KIMURA, Tomoki SASAYAMA, Daijiro KATO
  • Patent number: 7576841
    Abstract: A photometric apparatus which includes a cover that houses a UV light source and a photodetector, the cover hermetically sealing an entire light path extending from the light source to the photodetector therewithin; device for replacing an internal atmosphere of the cover with nitrogen gas; and a window plate unit which is adapted to be readily attached to and detached from a partition wall between a light source chamber and a spectral chamber located in a subsequent stage thereof. The window plate unit blocks gaseous communication between the light source chamber and the spectral chamber while allowing measurement light to be transmitted therethrough.
    Type: Grant
    Filed: March 19, 2007
    Date of Patent: August 18, 2009
    Assignee: Shimadzu Corporation
    Inventor: Tomoki Sasayama
  • Publication number: 20070279616
    Abstract: A photometric apparatus which includes a cover that houses a UV light source and a photodetector, the cover hermetically sealing an entire light path extending from the light source to the photodetector therewithin; device for replacing an internal atmosphere of the cover with nitrogen gas; and a window plate unit which is adapted to be readily attached to and detached from a partition wall between a light source chamber and a spectral chamber located in a subsequent stage thereof. The window plate unit blocks gaseous communication between the light source chamber and the spectral chamber while allowing measurement light to be transmitted therethrough.
    Type: Application
    Filed: March 19, 2007
    Publication date: December 6, 2007
    Applicant: SHIMADZU CORPORATION
    Inventor: Tomoki Sasayama
  • Patent number: 7027151
    Abstract: In a spectrophotometer, the following formula is stored in advance as a correction formula of a rotation angle in a correction formula storing portion; ??=?+A•sin (C1•?+?a)+B•sin (C2•?+?b)+?c, wherein C1, C2 represent coefficients theoretically determined in advance by a structure of a reduction mechanism, and A, B, ?a, ?b, ?c are coefficients specific to the reduction device which are calculated based on measurement results of a plurality of bright line spectrums through fittings by a coefficient determining portion. In case a sample is measured actually, when a desired wavelength is set, a rotation angle correcting portion corrects a rotation angle ? corresponding to the desired wavelength to calculate ?? by applying the above-stated correction formula, and then, controls a motor so that a diffraction grid is rotated by the angle ??.
    Type: Grant
    Filed: November 10, 2003
    Date of Patent: April 11, 2006
    Assignee: Shimadzu Corporation
    Inventors: Kazumi Yokota, Tomoki Sasayama
  • Publication number: 20040090624
    Abstract: In a spectrophotometer, the following formula is stored in advance as a correction formula of a rotation angle in a correction formula storing portion; &thgr;′=&thgr;+A•sin (C1•&thgr;+&thgr;a)+B•sin (C2•&thgr;+&thgr;b)+&thgr;c, wherein C1, C2 represent coefficients theoretically determined in advance by a structure of a reduction mechanism, and A, B, &thgr;a, &thgr;b, &thgr;c are coefficients specific to the reduction device which are calculated based on measurement results of a plurality of bright line spectrums through fittings by a coefficient determining portion. In case a sample is measured actually, when a desired wavelength is set, a rotation angle correcting portion corrects a rotation angle &thgr; corresponding to the desired wavelength to calculate &thgr;′ by applying the above-stated correction formula, and then, controls a motor so that a diffraction grid is rotated by the angle &thgr;′.
    Type: Application
    Filed: November 10, 2003
    Publication date: May 13, 2004
    Applicant: SHIMADZU CORPORATION
    Inventors: Kazumi Yokota, Tomoki Sasayama
  • Patent number: 5751420
    Abstract: A zoom lens is provided between the sample and the slit of a spectrophotometer to change the size of the image of the sample on the slit plane. The picture of the sample is taken by the zoom lens and is shown on a display screen, on which a window is superimposed. When the operator changes the location of the window, the sample is moved accordingly, and when the operator changes the size of the window, the focal length of the zoom lens is changed, whereby the size of the measurement area is changed. By changing the size of the measurement area on the slit plane while the size of the elementary photo-sensors of a photo-detector is unchanged, the resolution of the two-dimensional spectrophotometry can be changed.
    Type: Grant
    Filed: December 18, 1996
    Date of Patent: May 12, 1998
    Assignee: Shimadzu Corporation
    Inventors: Atsuhiro Iida, Kazumi Yokota, Eiji Ikeda, Tomoki Sasayama