Patents by Inventor Tomonari Hosaka

Tomonari Hosaka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of inspecting thin film magnetic head element using scanning electron microscope, and inspecting holding jig
    Patent number: 7564044
    Abstract: A method of efficiently inspecting a thin film magnetic head is provided. The method including holding a slider bar having a plurality of the thin film magnetic head elements in a row by an inspecting holding jig made of a nonmagnetic material; loading the slider bar held by the inspecting holding jig to a sampling placing part of a scanning electron microscope; and sequentially executing shape inspection of the plurality of thin film magnetic head elements on the slider bar by the scanning electron microscope.
    Type: Grant
    Filed: October 30, 2006
    Date of Patent: July 21, 2009
    Assignee: TDK Corporation
    Inventors: Akira Miyatake, Keitaro Kikuchi, Tomonari Hosaka
  • METHOD OF INSPECTING THIN FILM MAGNETIC HEAD ELEMENT USING SCANNING ELECTRON MICROSCOPE, AND INSPECTING HOLDING JIG
    Publication number: 20070098246
    Abstract: A method of efficiently inspecting a thin film magnetic head is provided. The method including holding a slider bar having a plurality of the thin film magnetic head elements in a row by an inspecting holding jig made of a nonmagnetic material; loading the slider bar held by the inspecting holding jig to a sampling placing part of a scanning electron microscope; and sequentially executing shape inspection of the plurality of thin film magnetic head elements on the slider bar by the scanning electron microscope.
    Type: Application
    Filed: October 30, 2006
    Publication date: May 3, 2007
    Applicant: ALPS ELECTRIC CO., LTD.
    Inventors: Akira Miyatake, Keitaro Kikuchi, Tomonari Hosaka