Abstract: A semiconductor integrated circuit includes an input circuit for taking in signals and an output circuit for outputting signals. The input circuit is so set that the input impedance during input signal transition is lower than the input impedance on other occasions than input signal transition. The output circuit is so set that the driving force during the second half of signal transition is lower than the driving force during the first half of transition. Such setting that the input impedance during input signal transition is lower than the input impedance on other occasions than input signal transition reduces reflected waves during input signal transition. Such setting that the driving force during the second half of signal transition is lower than the driving force during the first half of transition suppresses production of reflected waves during the second half of signal transition.

Abstract: To provide a test technology capable of reducing a package size by reducing a number of terminals (pins) in a semiconductor integrated circuit of SIP or the like constituted by mounting a plurality of semiconductor chips to a single package, in SIP 102 constituted by mounting a plurality of semiconductor chips to a signal package of ASIC 100, SDRAM 101 and the like, a circuit of testing SDRAM 101 (SDRAMBIST 109) is provided at inside of ASIC 100, and SDRAM 101 is tested from outside of SDRAM 101, that is, from ASIC 100. By providing the test circuit of SDRAM 101 at inside of ASIC 100, it is not necessary to extrude a terminal for testing SDRAM 101 to outside of SIP 102.

Abstract: To provide a test technology capable of reducing a package size by reducing a number of terminals (pins) in a semiconductor integrated circuit of SIP or the like constituted by mounting a plurality of semiconductor chips to a single package, in SIP 102 constituted by mounting a plurality of semiconductor chips to a signal package of ASIC 100, SDRAM 101 and the like, a circuit of testing SDRAM 101 (SDRAMBIST 109) is provided at inside of ASIC 100, and SDRAM 101 is tested from outside of SDRAM 101, that is, from ASIC 100. By providing the test circuit of SDRAM 101 at inside of ASIC 100, it is not necessary to extrude a terminal for testing SDRAM 101 to outside of SIP 102.

Abstract: A semiconductor integrated circuit includes an input circuit for taking in signals and an output circuit for outputting signals. The input circuit is so set that the input impedance during input signal transition is lower than the input impedance on other occasions than input signal transition. The output circuit is so set that the driving force during the second half of signal transition is lower than the driving force during the first half of transition. Such setting that the input impedance during input signal transition is lower than the input impedance on other occasions than input signal transition reduces reflected waves during input signal transition. Such setting that the driving force during the second half of signal transition is lower than the driving force during the first half of transition suppresses production of reflected waves during the second half of signal transition.

Abstract: To provide a test technology capable of reducing a package size by reducing a number of terminals (pins) in a semiconductor integrated circuit of SIP or the like constituted by mounting a plurality of semiconductor chips to a single package, in SIP 102 constituted by mounting a plurality of semiconductor chips to a signal package of ASIC 100, SDRAM 101 and the like, a circuit of testing SDRAM 101 (SDRAMBIST 109) is provided at inside of ASIC 100, and SDRAM 101 is tested from outside of SDRAM 101, that is, from ASIC 100. By providing the test circuit of SDRAM 101 at inside of ASIC 100, it is not necessary to extrude a terminal for testing SDRAM 101 to outside of SIP 102.

Abstract: In a single chip processor which can be provided with an extended program memory, a high-speed access can be executed without being restricted by the access time for the external program memory when an internal program memory is employed, by varying the effective instruction cycle, and thus a high-speed processing performance for a single chip processor of a stored program type can be attained.

Abstract: A plurality of external input information are added to a selecting circuit. The output of the selecting circuit is fed back as one of the external input information to the selecting circuit. The input signal groups are decoded, and are produced as control signals to specify the external input information in synchronism with clock signals. When the input select signal groups have the non-selection mode, the output that is fed back is necessarily selected.

Abstract: An LSI system is disclosed in which a plurality of status registers for indicating the internal status of the system are connected to each other so as to form a hierarchical structure and the contents of each of the remaining status registers other than one status register can be transferred to an output register through a bus, to make it possible to provide additional status registers in the system without increasing the number of address signals used and the number of pins connected to external address signal lines.