Patents by Inventor Tomotaka Nagashima
Tomotaka Nagashima has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230304787Abstract: In a defect detection device (10), an exciter (11) gives a test object (S) a vibration with a variable frequency. A vibration state measurer (15, 163) performs a measurement of the vibration state of the surface of the test object by an optical means while the vibration is given to the test object, and determines, for each position on the surface, a numerical value representing the vibration state based on a result of the measurement. A judgment-index-value determiner (164) determines a judgment index value by Fourier transform based on the numerical value representing the vibration state at each position, where the judgment index value is a numerical value representing a strength of the vibration for each wavenumber. A wavenumber-wavelength determiner (165) determines, based on the judgment index value determined for each wavenumber, a wavenumber or wavelength of an elastic wave induced in the test object by the vibration.Type: ApplicationFiled: December 6, 2022Publication date: September 28, 2023Applicant: SHIMADZU CORPORATIONInventors: Tomotaka NAGASHIMA, Takahide HATAHORI, Kenji TAKUBO
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Publication number: 20230236111Abstract: In a defect detection device (10), an input receiver (161) receives an input, by a user, of information concerning the kind and size of a defect expected to be present in or on a test object. An exciter (11, 12) induces an elastic wave in the test object, with the frequency of the elastic wave being variable. A measurer (15) optically measures a vibration state of the surface of the test object caused by the elastic wave. A wavelength determiner (164) determines the wavelength of the elastic wave induced in the test object, based on the vibration state obtained by the measurer. A frequency selector (165) selects an appropriate frequency from a plurality of frequencies, based on the kind and size of the expected defect as well as the wavelength acquired for each of the plurality of frequencies by the wavelength determiner by varying the frequency of the elastic wave.Type: ApplicationFiled: December 7, 2022Publication date: July 27, 2023Applicant: SHIMADZU CORPORATIONInventors: Takahide HATAHORI, Kenji TAKUBO, Tomotaka NAGASHIMA
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Publication number: 20230114484Abstract: An inspection system includes an image processing unit that suppresses noise of a complex number image on which pixels are represented by a complex number indicating a periodic change in a vibration state of an inspection target. The image processing unit acquires a degree of similarity between a pixel included in a target image region defined in the complex number image and a pixel included in a plurality of reference image regions defined in the complex number image separately from the target image region by comparing complex numbers representing pixels, and executes noise suppression processing of the target image region by using a weight based on the acquired degree of similarity.Type: ApplicationFiled: October 12, 2022Publication date: April 13, 2023Applicant: SHIMADZU CORPORATIONInventors: Tomotaka NAGASHIMA, Takahide HATAHORI, Hisanori MORITA, Kenji TAKUBO
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Publication number: 20210364276Abstract: A strain distribution measurement system includes a tensile tester that deforms a test piece to measure mechanical properties of a material of the test piece, and a strain distribution measuring device that measures a strain distribution of the test piece. The strain distribution measuring device measures the strain distribution of the test piece based on a distribution of at least one of a reflectance or a polarization characteristic on the main face of the test piece.Type: ApplicationFiled: May 20, 2021Publication date: November 25, 2021Applicant: SHIMADZU CORPORATIONInventors: Tomotaka NAGASHIMA, Yukimitsu IWANAGA, Norio HIRAYAMA
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Publication number: 20210333182Abstract: Provided is a material testing machine that deforms a test piece and measures mechanical properties of a material of the test piece. The material testing machine includes: a first detection unit that detects a strain of the test piece by measuring a distance between reference points of the test piece; a second detection unit that detects a strain distribution of the test piece based on an image of a pattern formed on a surface of the test piece; and a display control unit that displays a detection result of the first detection unit and a detection result of the second detection unit on one screen.Type: ApplicationFiled: April 21, 2021Publication date: October 28, 2021Applicant: SHIMADZU CORPORATIONInventors: Takuro SATO, Tomotaka NAGASHIMA, Yukimitsu IWANAGA
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Patent number: 10481004Abstract: A light wavelength measurement method of measuring a wavelength of target light includes: receiving target light on a second dispersion device that disperses the target light into a plurality of second beams which reach a plurality of positions corresponding to the wavelength of the target light; and measuring the wavelength of the target light, by using the plurality of the second beams as a vernier scale for measuring the wavelength of the target light within a wavelength range specified by a main scale.Type: GrantFiled: November 14, 2017Date of Patent: November 19, 2019Assignee: OSAKA UNIVERSITYInventors: Tsuyoshi Konishi, Takema Satoh, Tomotaka Nagashima
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Publication number: 20180073926Abstract: A light wavelength measurement method of measuring a wavelength of target light includes: receiving target light on a second dispersion device that disperses the target light into a plurality of second beams which reach a plurality of positions corresponding to the wavelength of the target light; and measuring the wavelength of the target light, by using the plurality of the second beams as a vernier scale for measuring the wavelength of the target light within a wavelength range specified by a main scale.Type: ApplicationFiled: November 14, 2017Publication date: March 15, 2018Inventors: Tsuyoshi KONISHI, Takema SATOH, Tomotaka NAGASHIMA
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Patent number: 9846081Abstract: A light wavelength measurement method of measuring a wavelength of target light includes: receiving target light on a second dispersion device that disperses the target light into a plurality of second beams which reach a plurality of positions corresponding to the wavelength of the target light (S106, S202); and measuring the wavelength of the target light, by using the plurality of the second beams as a vernier scale for measuring the wavelength of the target light within a wavelength range specified by a main scale (S108, S204).Type: GrantFiled: March 10, 2014Date of Patent: December 19, 2017Assignee: OSAKA UNIVERSITYInventors: Tsuyoshi Konishi, Takema Satoh, Tomotaka Nagashima
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Patent number: 9337922Abstract: A waveform reconstruction device (140) includes: a phase-spectrum calculation unit (143) which (i) simulates, for each intensity of an input optical signal assumed to have a given phase spectrum, propagation of the input optical signal through an optical transmission medium, to calculate a power spectrum of an output optical signal, and (ii) performs iterations of simulating the propagation while changing the given phase spectrum to reduce differences between calculated power spectra and measured power spectra of the input optical signal having the intensities, to search for a phase spectrum of the input optical signal; and a waveform reconstruction unit (144) which reconstructs a time waveform of the input optical signal using the phase spectrum found through the search, wherein the phase-spectrum calculation unit (143) changes the given phase spectrum or simulates the propagation, based on a nonlinear optical effect or a dispersion effect.Type: GrantFiled: February 6, 2013Date of Patent: May 10, 2016Assignee: OSAKA UNIVERSITYInventors: Tsuyoshi Konishi, Koji Takahashi, Tomotaka Nagashima
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Publication number: 20160033331Abstract: A light wavelength measurement method of measuring a wavelength of target light includes: receiving target light on a second dispersion device that disperses the target light into a plurality of second beams which reach a plurality of positions corresponding to the wavelength of the target light (S106, S202); and measuring the wavelength of the target light, by using the plurality of the second beams as a vernier scale for measuring the wavelength of the target light within a wavelength range specified by a main scale (S108, S204).Type: ApplicationFiled: March 10, 2014Publication date: February 4, 2016Inventors: Tsuyoshi KONISHI, Takema SATOH, Tomotaka NAGASHIMA
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Publication number: 20150010303Abstract: A waveform reconstruction device (140) includes: a phase-spectrum calculation unit (143) which (i) simulates, for each intensity of an input optical signal assumed to have a given phase spectrum, propagation of the input optical signal through an optical transmission medium, to calculate a power spectrum of an output optical signal, and (ii) performs iterations of simulating the propagation while changing the given phase spectrum to reduce differences between calculated power spectra and measured power spectra of the input optical signal having the intensities, to search for a phase spectrum of the input optical signal; and a waveform reconstruction unit (144) which reconstructs a time waveform of the input optical signal using the phase spectrum found through the search, wherein the phase-spectrum calculation unit (143) changes the given phase spectrum or simulates the propagation, based on a nonlinear optical effect or a dispersion effect.Type: ApplicationFiled: February 6, 2013Publication date: January 8, 2015Applicant: OSAKA UNIVERSITYInventors: Tsuyoshi Konishi, Koji Takahashi, Tomotaka Nagashima
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Patent number: 6193822Abstract: Disclosed is a method of manufacturing a diesel engine valve for intake and exhaust having good corrosion resistance and increased valve face strength, and therefore, of improved durability. A Ni-base heat resistant alloy of strong precipitation hardening type or an Fe-base heat resistant alloy of the same type is used as the material. The method comprises hot forging to prepare a blank form of the valve to be manufactured, solution treatment, cold processing to form the face part, and age-treating for increasing the hardness of the face part.Type: GrantFiled: June 18, 1998Date of Patent: February 27, 2001Assignee: Daido Steel Co., Ltd.Inventors: Tomotaka Nagashima, Michio Okabe, Toshiharu Noda
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Patent number: 6139660Abstract: A high corrosion resisting alloy for use in inlet and exhaust valves of diesel engines which is low in cost and excellent in corrosion resistance and strength, which consists by weight percentage of C.ltoreq.0.1%, Si.ltoreq.1.0%, Mn.ltoreq.1.0%, 25%<Cr.ltoreq.32%, 2.0%<Ti.ltoreq.3.0%, 1.0%.ltoreq.Al.ltoreq.2.0% and the balance being Ni and incidental impurities. The valves for the diesel engines are manufactured through the steps of forging the above-mentioned alloy into near net shapes of the valves, performing aging treatment (after solid solution treatment according to demand), and further enhancing hardness of the valves at their valve faces locally through partial cold forging.Type: GrantFiled: January 5, 2000Date of Patent: October 31, 2000Assignees: Daido Tokushuko Kabushiki Kaisha, Nittan Valvle Co., Ltd.Inventors: Tomotaka Nagashima, Michio Okabe, Toshiharu Noda, Kiyoshi Okawachi
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Patent number: 6039919Abstract: A high corrosion resisting alloy for use in inlet and exhaust valves of diesel engines which is low in cost and excellent in corrosion resistance and strength, which consists by weight percentage of C.ltoreq.0.1%, Si.ltoreq.1.0%, Mn.ltoreq.1.0%, 25%<Cr.ltoreq.32%, 2.0%<Ti.ltoreq.3.0%, 1.0%.ltoreq.Al.ltoreq.2.0% and the balance being Ni and incidental impurities. The valves for the diesel engines are manufactured through the steps of forging the above-mentioned alloy into near net shapes of the valves, performing aging treatment (after solid solution treatment according to demand), and further enhancing hardness of the valves at their valve faces locally through partial cold forging.Type: GrantFiled: February 3, 1998Date of Patent: March 21, 2000Assignees: Daido Tokushuko Kabushiki Kaisha, Nittan Valve Co., Ltd.Inventors: Tomotaka Nagashima, Michio Okabe, Toshiharu Noda, Kiyoshi Okawachi
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Patent number: 6033625Abstract: Improved parts of electronic apparatus made of ferritic free cutting steel, which enjoy high precision in size given by good machinability and free from trouble caused by corrosion of metal due to generation of sulfides. The material steel has an alloy composition consisting essentially of, by weight %, C: up to 0.1%, Si: up to 2.0%, Mn: up to 2.0%, Cr: 19-25% and S: 0.20-0.35% and the balance of Fe and impurities. The parts made by machining can be used without being passivated. The steel may contain, further to the above alloy components, one or more from the following groups: 1) Mo: up to 4.0%; 2) one or more of Pb: up to 0.4%, Bi: up to 0.3%, Te: up to 0.3%, Se: up to 0.4% and Ca: up to 0.3%; 3) one or both of B and Mg: 0.001-0.02%; 4) one or both of Cu and Ni: 0.1-4.0%; 5) one or more of Nb, Ta, Ti, V, W and Al: 0.01-0.50%; and 6) O: 0.01-0.04%.Type: GrantFiled: November 6, 1998Date of Patent: March 7, 2000Assignee: Diado Steel Co., Ltd.Inventors: Tomotaka Nagashima, Michio Okabe
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Patent number: 5948182Abstract: A heat resisting steel consists essentially of 0.005-0.20% of C, 0.01-2.0% of Si, 0.1-2.0% of Mn, 20-30% of Ni, 10-20% of Cr, 3.0-4.5% of Ti and 0.1-0.7% of Al with the ratio Ti/Al being 5-20, and the balance being substantially Fe, which is excellent in the tensile properties at the room temperature and 700.degree. C., and the creep rupture properties at the temperature of 700.degree. C.Type: GrantFiled: October 8, 1996Date of Patent: September 7, 1999Assignee: Daido Tokushuko Kabushiki KaishaInventors: Shuji Hamano, Tomotaka Nagashima, Michio Okabe, Toshiharu Noda