Patents by Inventor Tomotaka Takahashi

Tomotaka Takahashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8666261
    Abstract: A photoelectric encoder includes a scale; a detector; alight application section; a pair of origin signal reception sections; and a signal processing section adapted to provide the maximum value of the signal level output from the origin signal reception sections by side lobe light occurring as reflected on the origin mark as a stipulated value, provide an effective area of origin detection between the first position at which output of one of the origin signal reception sections for outputting a larger signal level than the stipulated value earlier than the relative displacement becomes a larger signal level than the stipulated value and the first position at which output of the other origin signal reception section exceeds the stipulated value and then becomes a smaller signal level than the stipulated value, and configured to generate the origin detection signal in the effective area.
    Type: Grant
    Filed: March 17, 2011
    Date of Patent: March 4, 2014
    Assignee: Mitutoyo Corporation
    Inventor: Tomotaka Takahashi
  • Patent number: 8363904
    Abstract: An offset amount calibrating method that obtains the offset amount between a contact-type detector and an image probe is provided. The method includes: setting on a stage a calibration chart that includes not less than two non-parallel linewidth patterns being disposed relative to a reference position of the calibration chart and each having a known width and a level difference; capturing an image of the linewidth patterns of the calibration chart by an image probe to obtain the reference position of the calibration chart; measuring at least two of the linewidth patterns of the calibration chart by a contact-type detector to obtain the reference position of the calibration chart; and calculating a difference between the reference position obtained by using the image probe and the reference position obtained by using the contact-type detector to obtain the offset amount.
    Type: Grant
    Filed: October 8, 2010
    Date of Patent: January 29, 2013
    Assignee: Mitutoyo Corporation
    Inventor: Tomotaka Takahashi
  • Publication number: 20120193523
    Abstract: An optical encoder includes a scale having diffraction gratings formed at predetermined pitches in a measurement axis direction, a detection head relatively movable with respect to the scale, the detection head including a light source portion configured to irradiate the scale with light, and a plurality of receiver portions configured to receive light reflected by or transmitted through the diffraction gratings of the scale, at different phases, and a signal processing device configured to perform signal processing to light reception signals output from the receiver portions of the detection head, to produce quadrature differential signals. The signal processing device is configured to calculate alignment adjustment monitor signals corresponding to a Lissajous radius of the quadrature differential signals in order to detect misalignment of the detection head with respect to the scale.
    Type: Application
    Filed: January 27, 2012
    Publication date: August 2, 2012
    Applicant: MITUTOYO CORPORATION
    Inventor: Tomotaka Takahashi
  • Patent number: 8173951
    Abstract: In an optical encoder for measuring relative displacement, a scale 10 has a reference mark 14 composed of a reflection slit formed on at least one point of an incremental track 12, a detection portion (20) has a light irradiation portion (24), main light receiving portions 30a, 30b, 30ab and 30bb that are disposed at the surrounding centering around the corresponding light irradiation portion and output incremental signals four phases of which are different from each other, and a pair of reference signal light receiving portions 32z and 32zb that are disposed in the direction perpendicular to the length measurement direction using the light irradiation portion as the center of point symmetry, and a signal processing portion 40 has a three-phase signal generation portion 48, a quadrature sine wave signals generation portion 50, a direction judgment circuit 56, an internal period counter 58, and a reference signal processing portion 60, thereby bringing about a micro-sized optical encoder capable of detecting t
    Type: Grant
    Filed: September 14, 2009
    Date of Patent: May 8, 2012
    Assignee: Mitutoyo Corporation
    Inventor: Tomotaka Takahashi
  • Publication number: 20110229151
    Abstract: A photoelectric encoder includes a scale; a detector; alight application section; a pair of origin signal reception sections; and a signal processing section adapted to provide the maximum value of the signal level output from the origin signal reception sections by side lobe light occurring as reflected on the origin mark as a stipulated value, provide an effective area of origin detection between the first position at which output of one of the origin signal reception sections for outputting a larger signal level than the stipulated value earlier than the relative displacement becomes a larger signal level than the stipulated value and the first position at which output of the other origin signal reception section exceeds the stipulated value and then becomes a smaller signal level than the stipulated value, and configured to generate the origin detection signal in the effective area.
    Type: Application
    Filed: March 17, 2011
    Publication date: September 22, 2011
    Applicant: MITUTOYO CORPORATION
    Inventor: Tomotaka Takahashi
  • Patent number: 8018600
    Abstract: An interferometer includes a laser beam source, a light wave dividing and synthesizing portion for 2-demultiplexing and irradiating a laser beam irradiated from the laser beam source on a measuring target and synthesizing a light having each displacement information, a multiphase interference light generating portion for generating, from a synthesized laser beam, a first interference light having a first phase, a second interference light having a second phase which is different from the first phase by 180 degrees, a third interference light having a third phase which is different from the first phase by 90 degrees, and a fourth interference light having a fourth phase which is different from the first phase by 270 degrees, a 3-phase signal generating portion for generating a 3-phase signal having a phase difference of 90 degrees on the basis of first to fourth interference signals based on the first to fourth interference lights, and a 2-phase signal generating portion for carrying out a vector synthesis ove
    Type: Grant
    Filed: November 5, 2008
    Date of Patent: September 13, 2011
    Assignee: Mitutoyo Corporation
    Inventor: Tomotaka Takahashi
  • Patent number: 7980769
    Abstract: A vacuum optical fiber connector includes a port flange attached to a vacuum flange for housing a first waveguide connector to which an optical fiber bundle is attached, an optical transparent body placed on the outside of the port flange, and an attachment member formed with a fit shape relative to the port flange for housing a second waveguide connector to which an optical fiber bundle is attached. The first and second waveguide connectors are positioned at least in two directions orthogonal to an optical axis with optical coupling of the first and second waveguide connectors.
    Type: Grant
    Filed: March 9, 2009
    Date of Patent: July 19, 2011
    Assignee: Mitutoyo Corporation
    Inventor: Tomotaka Takahashi
  • Publication number: 20110085178
    Abstract: An offset amount calibrating method that obtains the offset amount between a contact-type detector and an image probe is provided. The method includes: setting on a stage a calibration chart that includes not less than two non-parallel linewidth patterns being disposed relative to a reference position of the calibration chart and each having a known width and a level difference; capturing an image of the linewidth patterns of the calibration chart by an image probe to obtain the reference position of the calibration chart; measuring at least two of the linewidth patterns of the calibration chart by a contact-type detector to obtain the reference position of the calibration chart; and calculating a difference between the reference position obtained by using the image probe and the reference position obtained by using the contact-type detector to obtain the offset amount.
    Type: Application
    Filed: October 8, 2010
    Publication date: April 14, 2011
    Applicant: MITUTOYO CORPORATION
    Inventor: Tomotaka TAKAHASHI
  • Publication number: 20100072348
    Abstract: In an optical encoder for measuring relative displacement, a scale 10 has a reference mark 14 composed of a reflection slit formed on at least one point of an incremental track 12, a detection portion (20) has a light irradiation portion (24), main light receiving portions 30a, 30b, 30ab and 30bb that are disposed at the surrounding centering around the corresponding light irradiation portion and output incremental signals four phases of which are different from each other, and a pair of reference signal light receiving portions 32z and 32zb that are disposed in the direction perpendicular to the length measurement direction using the light irradiation portion as the center of point symmetry, and a signal processing portion 40 has a three-phase signal generation portion 48, a quadrature sine wave signals generation portion 50, a direction judgment circuit 56, an internal period counter 58, and a reference signal processing portion 60, thereby bringing about a micro-sized optical encoder capable of detecting t
    Type: Application
    Filed: September 14, 2009
    Publication date: March 25, 2010
    Applicant: MITUTOYO CORPORATION
    Inventor: Tomotaka Takahashi
  • Publication number: 20090232454
    Abstract: A vacuum optical fiber connector includes a port flange attached to a vacuum flange for housing a first waveguide connector to which an optical fiber bundle is attached, an optical transparent body placed on the outside of the port flange, and an attachment member formed with a fit shape relative to the port flange for housing a second waveguide connector to which an optical fiber bundle is attached. The first and second waveguide connectors are positioned at least in two directions orthogonal to an optical axis with optical coupling of the first and second waveguide connectors.
    Type: Application
    Filed: March 9, 2009
    Publication date: September 17, 2009
    Applicant: MITUTOYO CORPORATION
    Inventor: Tomotaka TAKAHASHI
  • Publication number: 20090116034
    Abstract: An interferometer includes a laser beam source, a light wave dividing and synthesizing portion for 2-demultiplexing and irradiating a laser beam irradiated from the laser beam source on a measuring target and synthesizing a light having each displacement information, a multiphase interference light generating portion for generating, from a synthesized laser beam, a first interference light having a first phase, a second interference light having a second phase which is different from the first phase by 180 degrees, a third interference light having a third phase which is different from the first phase by 90 degrees, and a fourth interference light having a fourth phase which is different from the first phase by 270 degrees, a 3-phase signal generating portion for generating a 3-phase signal having a phase difference of 90 degrees on the basis of first to fourth interference signals based on the first to fourth interference lights, and a 2-phase signal generating portion for carrying out a vector synthesis ove
    Type: Application
    Filed: November 5, 2008
    Publication date: May 7, 2009
    Applicant: MITUTOYO CORPORATION
    Inventor: Tomotaka TAKAHASHI
  • Patent number: 7394550
    Abstract: The displacement detector includes: a light source 140; a beam splitter 170 for dividing the light, which is sent from the light source 140, into two beams of light; reflection mirrors 181, 182 provided for the two beams of light sent from the beam splitter 170, for reflecting these two beams of light and making them incident upon a scale 110; and corner cubes 191, 192 provided for the beams of diffracted light, which are generated when two beams of light incident upon the scale 110 are diffracted by the diffraction grating 111, wherein the corner cubes 191, 192 retroreflect the diffracted light and make the light incident upon the scale as retroreflected light. The incident angle to grating groove formed between the incident light and the normal line vector of the scale is larger than the diffraction angle formed between the retroreflected light and the normal line vector of the scale.
    Type: Grant
    Filed: December 20, 2005
    Date of Patent: July 1, 2008
    Assignee: Mitutoyo Corporation
    Inventors: Tomotaka Takahashi, Shingo Nihommori
  • Patent number: 7319526
    Abstract: A displacement detection apparatus (100) includes a main scale (110) and a detection head (120). The detection head (120) includes a light emission/reception unit (130) and an optical device unit (140). The optical device unit (140) has a first diffraction scale (141) and a second diffraction scale (143). The first diffraction scale (141) has a transmission type first diffraction grating (142). The second diffraction scale (143) has a diffraction grating. The second diffraction scale (143) has a transmission type second diffraction grating (144) on both sides of a metal film (146). Furthermore, the metal film (146) configures a reflection type third diffraction grating (145) when the second diffraction scale (143) is viewed from the side of the main scale (110).
    Type: Grant
    Filed: November 9, 2004
    Date of Patent: January 15, 2008
    Assignee: Mitutoyo Corporation
    Inventor: Tomotaka Takahashi
  • Patent number: 7095011
    Abstract: A plurality of photodiodes are disposed along a measurement axis on an optical receipt chip of a photoelectric encoder. Formed on each light acceptance surface of these photodiodes is a second optical grating which has more than one light shield portion extending in a “y” direction. Each acceptance surface has a portion that is disposed obliquely relative to the extending direction of the light shield portion.
    Type: Grant
    Filed: May 14, 2004
    Date of Patent: August 22, 2006
    Assignee: Mitutoyo Corporation
    Inventors: Kenji Kojima, Tomotaka Takahashi
  • Publication number: 20060139654
    Abstract: The displacement detector includes: a light source 140; a beam splitter 170 for dividing the light, which is sent from the light source 140, into two beams of light; reflection mirrors 181, 182 provided for the two beams of light sent from the beam splitter 170, for reflecting these two beams of light and making them incident upon a scale 110; and corner cubes 191, 192 provided for the beams of diffracted light, which are generated when two beams of light incident upon the scale 110 are diffracted by the diffraction grating 111, wherein the corner cubes 191, 192 retroreflect the diffracted light and make the light incident upon the scale as retroreflected light. The incident angle to grating groove formed between the incident light and the normal line vector of the scale is larger than the diffraction angle formed between the retroreflected light and the normal line vector of the scale.
    Type: Application
    Filed: December 20, 2005
    Publication date: June 29, 2006
    Applicant: Mitutoyo Corporation
    Inventors: Tomotaka Takahashi, Shingo Nihommori
  • Publication number: 20050140985
    Abstract: A displacement detection apparatus (100) includes a main scale (110) and a detection head (120). The detection head (120) includes a light emission/reception unit (130) and an optical device unit (140). The optical device unit (140) has a first diffraction scale (141) and a second diffraction scale (143). The first diffraction scale (141) has a transmission type first diffraction grating (142). The second diffraction scale (143) has a diffraction grating. The second diffraction scale (143) has a transmission type second diffraction grating (144) on both sides of a metal film (146). Furthermore, the metal film (146) configures a reflection type third diffraction grating (145) when the second diffraction scale (143) is viewed from the side of the main scale (110).
    Type: Application
    Filed: November 9, 2004
    Publication date: June 30, 2005
    Applicant: MITUTOYO CORPORATION
    Inventor: Tomotaka Takahashi
  • Patent number: D536010
    Type: Grant
    Filed: June 2, 2005
    Date of Patent: January 30, 2007
    Assignee: SSD Company Limited
    Inventor: Tomotaka Takahashi
  • Patent number: D541353
    Type: Grant
    Filed: March 17, 2006
    Date of Patent: April 24, 2007
    Assignee: Kyosho Corporation
    Inventor: Tomotaka Takahashi
  • Patent number: D550735
    Type: Grant
    Filed: February 19, 2007
    Date of Patent: September 11, 2007
    Assignee: SSD Company Limited
    Inventor: Tomotaka Takahashi
  • Patent number: D696324
    Type: Grant
    Filed: February 19, 2013
    Date of Patent: December 24, 2013
    Assignee: K. K DeAgostini Japan
    Inventor: Tomotaka Takahashi