Patents by Inventor Tomoya Niho

Tomoya Niho has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Defect diagnosis method and defect diagnosis apparatus
    Patent number: 6498992
    Abstract: A method for diagnosis of a defect of an object to be inspected, such as a rotational machine, etc., by measuring a vibration generated thereby, wherein a measured signal generated by the object is detected, an amplitude probability density function of wave-form of the obtained measured signal is expanded orthogonally through a Gram-Charlier series, and the Gram-Charlier series are calculated so as to make diagnosis of defect(s) in the object to be inspected.
    Type: Grant
    Filed: April 13, 1999
    Date of Patent: December 24, 2002
    Assignee: Rion Co. Ltd.
    Inventors: Toshio Toyota, Tomoya Niho, Hou Jinyama, Hidemichi Komura