Abstract: An acquiring unit of a structured illuminating microscopy apparatus acquires at least two modulated images having the same wave number vector and the different phases; and a calculating unit of the structured illuminating microscopy apparatus, in a spatial frequency spectrum of each of at least the two modulated images acquired by the acquiring unit, separates a 0th-order modulating component and ±first-order modulating components of observational light fluxes superimposed on arbitrary two observation points based on at least four observation values regarding the two observation points which are mutually displaced by an amount of the wave number vector.

Abstract: An acquiring unit of a structured illuminating microscopy apparatus acquires at least two modulated images having the same wave number vector and the different phases; and a calculating unit of the structured illuminating microscopy apparatus, in a spatial frequency spectrum of each of at least the two modulated images acquired by the acquiring unit, separates a 0th-order modulating component and ±first-order modulating components of observational light fluxes superimposed on arbitrary two observation points based on at least four observation values regarding the two observation points which are mutually displaced by an amount of the wave number vector.

Abstract: A fundus imaging system comprises: a first reflection mirror that reflects a light beam passing through a first focus of the first reflection mirror to pass through a second focus; a two-dimensional scanning unit that is disposed at a position of the first focus and reflects a light beam incident on the two-dimensional scanning unit so as to scan the retina with the light beam in two-dimensional directions; and a second reflection mirror that reflects a light beam passing through a third focus so as to cause the light beam to pass through a fourth focus, the second reflection mirror being disposed so that a position of the third focus coincides with a position of the second focus, wherein a position of the pupil of the subject is disposed so as to coincide with a position of the fourth focus.

Abstract: A fundus imaging system comprises: a reflection mirror that reflects a light beam incident on the reflection mirror after passing through a first focus so as to cause the light beam to pass through a second focus; a two-dimensional scanning unit that is disposed at a position that coincides with a position of the first focus of the reflection mirror and that reflects a light beam incident on the two-dimensional scanning unit so as to perform scanning with the light beam in two-dimensional directions; and a compensating unit that compensates for illuminance ununiformity of a light beam illuminating the retina, the illuminance ununiformity resulting from unevenness of a ratio of an angular change of a light beam emitted from the first focus during scanning of the two-dimensional scanning unit to an angular change of a light beam incident on the second focus resulting from being reflected by the reflection mirror.

Abstract: An acquiring unit of a structured illuminating microscopy apparatus acquires at least two modulated images having the same wave number vector and the different phases; and a calculating unit of the structured illuminating microscopy apparatus, in a spatial frequency spectrum of each of at least the two modulated images acquired by the acquiring unit, separates a 0th-order modulating component and ±first-order modulating components of observational light fluxes superimposed on arbitrary two observation points based on at least four observation values regarding the two observation points which are mutually displaced by an amount of the wave number vector.

Abstract: An acquiring unit of a structured illuminating microscopy apparatus acquires at least two modulated images having the same wave number vector and the different phases; and a calculating unit of the structured illuminating microscopy apparatus, in a spatial frequency spectrum of each of at least the two modulated images acquired by the acquiring unit, separates a 0th-order modulating component and ±first-order modulating components of observational light fluxes superimposed on arbitrary two observation points based on at least four observation values regarding the two observation points which are mutually displaced by an amount of the wave number vector.

Abstract: A fundus imaging system comprises: a reflection mirror that reflects a light beam incident on the reflection mirror after passing through a first focus so as to cause the light beam to pass through a second focus; a two-dimensional scanning unit that is disposed at a position that coincides with a position of the first focus of the reflection mirror and that reflects a light beam incident on the two-dimensional scanning unit so as to perform scanning with the light beam in two-dimensional directions; and a compensating unit that compensates for illuminance ununiformity of a light beam illuminating the retina, the illuminance ununiformity resulting from unevenness of a ratio of an angular change of a light beam emitted from the first focus during scanning of the two-dimensional scanning unit to an angular change of a light beam incident on the second focus resulting from being reflected by the reflection mirror.

Abstract: A fundus imaging system comprises: a first reflection mirror that reflects a light beam passing through a first focus of the first reflection mirror to pass through a second focus; a two-dimensional scanning unit that is disposed at a position of the first focus and reflects a light beam incident on the two-dimensional scanning unit so as to scan the retina with the light beam in two-dimensional directions; and a second reflection mirror that reflects a light beam passing through a third focus so as to cause the light beam to pass through a fourth focus, the second reflection mirror being disposed so that a position of the third focus coincides with a position of the second focus, wherein a position of the pupil of the subject is disposed so as to coincide with a position of the fourth focus.

Abstract: A valve apparatus includes a body with a supply passage for gas and a solenoid valve housed in the body. The solenoid valve includes a tubular sleeve internally having a flow passage leading to the supply passage, and a valve element and a valve seat that open and close the flow passage. The solenoid valve includes a driving portion that opens and closes the valve element. A seal member is disposed between an outer wall of the sleeve and an inner wall of the body. A tip of the sleeve on a downstream side of the valve element is exposed from the body.

Abstract: A valve apparatus includes a body with a supply passage for gas and a solenoid valve housed in the body. The solenoid valve includes a tubular sleeve internally having a flow passage leading to the supply passage, and a valve element and a valve seat that open and close the flow passage. The solenoid valve includes a driving portion that opens and closes the valve element. A seal member is disposed between an outer wall of the sleeve and an inner wall of the body. A tip of the sleeve on a downstream side of the valve element is exposed from the body.

Abstract: An acquiring unit of a structured illuminating microscopy apparatus acquires at least two modulated images having the same wave number vector and the different phases; and a calculating unit of the structured illuminating microscopy apparatus, in a spatial frequency spectrum of each of at least the two modulated images acquired by the acquiring unit, separates a 0th-order modulating component and ±first-order modulating components of observational light fluxes superimposed on arbitrary two observation points based on at least four observation values regarding the two observation points which are mutually displaced by an amount of the wave number vector.

Abstract: A FET for driving an electric motor includes a source electrode. The source electrode has main electrode surfaces to which bonding wires, through which a drive current for an electric motor passes, are joined, and inspection electrode surfaces that are arranged so as to be independent of and apart from the main electrode surfaces. The inspection electrode surfaces are provided so as to contact a probe of an inspection device that performs an inspection of the FET 3.

Abstract: A FET for driving an electric motor includes a source electrode. The source electrode has main electrode surfaces to which bonding wires, through which a drive current for an electric motor passes, are joined, and inspection electrode surfaces that are arranged so as to be independent of and apart from the main electrode surfaces. The inspection electrode surfaces are provided so as to contact a probe of an inspection device that performs an inspection of the FET 3.

Abstract: A confocal microscope with improved light use efficiency is provided. Thus, the confocal microscope has a section which concentrates illumination light to a target point of a specimen and non-target points adjacent thereto for simultaneous illumination; a section which receives light entering into a light reception portion conjugated with the target point, without distinguishing light emitted from the target point and light emitted from the non-target points, and outputs a light reception signal according to the intensity of the light; a section which changes the number of non-target points and successively captures the light reception signals before and after the change in the number of the target points; and a section which generates a confocal signal according to intensity of light emitted from the target point, based on a relationship between the captured light reception signals and the number of non-target points.

Abstract: A confocal microscope with improved light use efficiency is provided. Thus, the confocal microscope has a section which concentrates illumination light to a target point of a specimen and non-target points adjacent thereto for simultaneous illumination; a section which receives light entering into a light reception portion conjugated with the target point, without distinguishing light emitted from the target point and light emitted from the non-target points, and outputs a light reception signal according to the intensity of the light; a section which changes the number of non-target points and successively captures the light reception signals before and after the change in the number of the target points; and a section which generates a confocal signal according to intensity of light emitted from the target point, based on a relationship between the captured light reception signals and the number of non-target points.

Abstract: A method and apparatus for measuring a wave front aberration of a projection lens with high precision and a related calibration method. The apparatus includes: either a light source and an element producing a first point source in combination with the light source or a first point source generating part; a magnifying projection optical system projecting and magnifying a point image of the first point source projected by a test object; a detector detecting the magnified point image projected and magnified by the magnifying projection optical system; a supporting member supporting the magnifying projection optical system and the detector; a calculating part calculating a wave front aberration; and either a second point source producing element or a second point source generating part.

Abstract: A laser scanning microscope provided with a laser light source, an illuminating optical system for condensing the light from the laser light source to form a light spot on a specimen, a scanning device for causing relative movement of the light spot with respect to the specimen, a photodetector for measuring the amount of light transmitted or reflected by the specimen, and an optical system with positive refraction power for guiding the light beam, transmitted or reflected by the specimen, to the light-receiving plane of the photodetector, wherein the photodetector is composed of a two-dimensional image sensor provided in a position displaced from the conjugate point of the light spot by such an amount that the light beam forms a far-field diffraction pattern of the specimen on the light-receiving plane of the photodetector.