Patents by Inventor Tomoyuki ITAKURA

Tomoyuki ITAKURA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test apparatus and test method
    Patent number: 11137446
    Abstract: A test apparatus is configured to test a DUT that does not support synchronous control from an external circuit. A main controller is configured based on an architecture that tests a device by synchronous control with the main controller itself as the master. A MIU is configured as an interface between the main controller and the DUT. The MIU establishes asynchronous control between it and the DUT with the DUT as the master, and establishes control between it and the main controller with the main controller as the master.
    Type: Grant
    Filed: September 24, 2019
    Date of Patent: October 5, 2021
    Assignee: ADVANTEST CORPORATION
    Inventors: Shuichi Inage, Kazuhiro Iezumi, Tomoyuki Itakura, Keisuke Kusunoki, Yoshihiro Kato, Kazuhiro Tsujikawa, Naoya Kimura, Yuki Watanabe, Yuichiro Harada, Koji Miyauchi
  • Test system
    Patent number: 11057291
    Abstract: A test system tests a DUT configured as a wireless device. A golden device is configured to provide bidirectional communication between it and the DUT. A measurement device acquires a first signal S1 including at least an output SDUT of the DUT. An interface unit monitors a second signal S2 including at least one of the output SGD of the golden device and the output SDUT of the DUT. In response to the occurrence of a predetermined waveform pattern in the second signal, the interface unit generates a trigger signal TRIG for instructing the measurement device to acquire a signal.
    Type: Grant
    Filed: September 24, 2019
    Date of Patent: July 6, 2021
    Assignee: ADVANTEST CORPORATION
    Inventors: Yoshiyuki Aoki, Kazuhiro Iezumi, Tomoyuki Itakura, Shuichi Inage
  • TEST SYSTEM
    Publication number: 20200280505
    Abstract: A test system tests a DUT configured as a wireless device. A golden device is configured to provide bidirectional communication between it and the DUT. A measurement device acquires a first signal S1 including at least an output SDUT of the DUT. An interface unit monitors a second signal S2 including at least one of the output SGD of the golden device and the output SDUT of the DUT. In response to the occurrence of a predetermined waveform pattern in the second signal, the interface unit generates a trigger signal TRIG for instructing the measurement device to acquire a signal.
    Type: Application
    Filed: September 24, 2019
    Publication date: September 3, 2020
    Inventors: Yoshiyuki AOKI, Kazuhiro IEZUMI, Tomoyuki ITAKURA, Shuichi INAGE
  • TEST APPARATUS AND TEST METHOD
    Publication number: 20200225286
    Abstract: A test apparatus is configured to test a DUT that does not support synchronous control from an external circuit. A main controller is configured based on an architecture that tests a device by synchronous control with the main controller itself as the master. A MIU is configured as an interface between the main controller and the DUT. The MIU establishes asynchronous control between it and the DUT with the DUT as the master, and establishes control between it and the main controller with the main controller as the master.
    Type: Application
    Filed: September 24, 2019
    Publication date: July 16, 2020
    Inventors: Shuichi INAGE, Kazuhiro IEZUMI, Tomoyuki ITAKURA, Keisuke KUSUNOKI, Yoshihiro KATO, Kazuhiro TSUJIKAWA, Naoya KIMURA, Yuki WATANABE, Yuichiro HARADA, Koji MIYAUCHI