Abstract: Computer-implemented dual phased manufacturing data processing methods and systems. A data analysis phase is established. Manufacturing data is collected from various sources and categorized as at least two predetermined category data types. Data of one of the two data types is analyzed and actions thereof generated in accordance with the analysis result. Actions of the other type of data are also generated.

Abstract: The present disclosure provides a semiconductor manufacturing fault detection and management system and method for monitoring at least one manufacturing entity to detect state changes.

Abstract: Systems and methods for data archiving management. A storage device stores archive data and at least one data introduction. The archive data comprising at least one data item corresponding to a data introduction is generated after completing a corresponding semiconductor product, wafer or wafer lot. A processing unit transmits a first Web page comprising the data introduction to a client computer, acquires the data item from the archive data in response to a data preview request, transmits a second Web page comprising the data item to the client computer, and transmits the data item to the client computer in response to a data download request.

Abstract: The present disclosure provides a semiconductor manufacturing fault detection and management system and method for monitoring at least one manufacturing entity to detect state changes.