Patents by Inventor Tong-Yu Liu

Tong-Yu Liu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods and systems for semiconductor defect detection
    Patent number: 7254759
    Abstract: A method for semiconductor defect detection, applied to a wafer test in a semiconductor process. A defect test is implemented for generating redundant information. an abnormal test implemented for generating a first FBM. The redundant information is converted to a second FBM. The first and second FBMs are compared, thereby generating a third FBM according to comparison results.
    Type: Grant
    Filed: August 15, 2005
    Date of Patent: August 7, 2007
    Assignee: Powerchip Semiconductor Corp.
    Inventors: Tong-Yu Liu, Yen-Sheng Chang
  • Methods and systems for semiconductor defect detection
    Publication number: 20060143550
    Abstract: A method for semiconductor defect detection, applied to a wafer test in a semiconductor process. A defect test is implemented for generating redundant information. an abnormal test implemented for generating a first FBM. The redundant information is converted to a second FBM. The first and second FBMs are compared, thereby generating a third FBM according to comparison results.
    Type: Application
    Filed: August 15, 2005
    Publication date: June 29, 2006
    Inventors: Tong-Yu Liu, Yen-Sheng Chang