Patents by Inventor Tong Zheng

Tong Zheng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20060072120
    Abstract: An optical metrology system is provided with a data analysis method to determine the elastic moduli of optically transparent dielectric films such as silicon dioxide, other carbon doped oxides over metal or semiconductor substrates. An index of refraction is measured by an ellipsometer and a wavelength of a laser beam is measured using a laser spectrometer. The angle of refraction is determined by directing a light pulse focused onto a wafer surface, measuring a first set of x1, y1, and z1 coordinates, moving the wafer in the z direction, directing the light pulse onto the wafer surface and measuring a second set of x2, y2 and z2 coordinates, using the coordinates to calculate an angle of incidence, calculating an angle of refraction from the calculated angle of incidence, obtaining a sound velocity v, from the calculated angle of refraction and using the determined sound velocity v, to calculate a bulk modulus.
    Type: Application
    Filed: October 6, 2004
    Publication date: April 6, 2006
    Inventors: Sean Leary, Guray Tas, Christopher Morath, Michael Kotelyanskii, Tong Zheng, Guenadiy Lazarov, Andre Miller, George Antonelli, Jamie Ludke
  • Patent number: 7019845
    Abstract: An optical metrology system is provided with a data analysis method to determine the elastic moduli of optically transparent dielectric films such as silicon dioxide, other carbon doped oxides over metal or semiconductor substrates. An index of refraction is measured by an ellipsometer and a wavelength of a laser beam is measured using a laser spectrometer. The angle of refraction is determined by directing a light pulse focused onto a wafer surface, measuring a first set of x1, y1, and z1 coordinates, moving the wafer in the z direction, directing the light pulse onto the wafer surface and measuring a second set of x2, y2 and z2 coordinates, using the coordinates to calculate an angle of incidence, calculating an angle of refraction from the calculated angle of incidence, obtaining a sound velocity v, from the calculated angle of refraction and using the determined sound velocity v, to calculate a bulk modulus.
    Type: Grant
    Filed: October 6, 2004
    Date of Patent: March 28, 2006
    Assignee: Rudolph Technologies, Inc.
    Inventors: Sean P. Leary, Guray Tas, Christopher J. Morath, Michael Kotelyanskii, Tong Zheng, Guenadiy Lazarov, Andre D. Miller, George A. Antonelli, Jamie I. Ludke
  • Publication number: 20050031538
    Abstract: Methods and assay systems for analyzing effects of chemical and cellular agents on brain cell neurogenesis in vivo, comprising administering an agent to a test animal and determining responses of cells of brain marrow tissues, including irradiated brain marrow tissue depleted of neurogenic stems cells, and cells in brain marrow-derived neurospheres cultured in vitro.
    Type: Application
    Filed: August 5, 2004
    Publication date: February 10, 2005
    Inventors: Dennis Steindler, Eric Laywell, Tong Zheng
  • Patent number: 6281875
    Abstract: In a method for determining a data value for a target pixel in a destination image based on data values for pixels in a source image, with the destination image being scaled relative to the source image, calculating a position in the source image based on position of a target pixel in the destination image, testing the presence of a diagonal gradient in the source image at the position determined in the calculating step, the testing step testing for the presence of a diagonal gradient by reference to values of pixels in the source image that surround the position calculated in the calculating step, responsive to the presence of a diagonal gradient in the testing step, calculating a data value for the target pixel based on interpolation of data values for diagonally-adjacent pixels in the source image, and responsive to the absence of a diagonal gradient in the testing step, calculating a data value for the target pixel based on interpolation of data values for at least all four surrounding pixels in the sourc
    Type: Grant
    Filed: April 29, 1998
    Date of Patent: August 28, 2001
    Assignee: Canon Kabushiki Kaisha
    Inventors: Jun Zhao, Jonathan Hui, Tong Zheng
  • Patent number: 6075535
    Abstract: The present invention provides a method and apparatus for visually presenting the access frequency of a two dimensional image. The method includes the steps of: determining which defined regions of the image are accessed; determining the frequency that the plurality of defined regions is accessed; creating a graphical representation corresponding to the plurality of defined regions for the image, wherein the x axis of the graphical representation corresponds to the x axis of the image and the y axis of the graphical representation corresponds to the y axis of the image; and combining the graphical representation with an access frequency indicator to create an access frequency output that corresponds to the plurality of defined regions. From the access frequency output, the user can see the access patterns of the image and can easily visualize how frequently small portions of the image are accessed.
    Type: Grant
    Filed: June 26, 1998
    Date of Patent: June 13, 2000
    Assignee: Hewlett-Packard Company
    Inventors: Andrew Fitzhugh, Tong Zheng, Michael Strittmatter
  • Patent number: D664131
    Type: Grant
    Filed: December 29, 2011
    Date of Patent: July 24, 2012
    Assignee: FIH (Hong Kong) Limited
    Inventors: Du-Tong Zheng, Bin Li
  • Patent number: D664132
    Type: Grant
    Filed: December 29, 2011
    Date of Patent: July 24, 2012
    Assignee: FIH (Hong Kong) Limited
    Inventors: Du-Tong Zheng, Bin Li
  • Patent number: D664133
    Type: Grant
    Filed: December 29, 2011
    Date of Patent: July 24, 2012
    Assignee: FIH (Hong Kong) Limited
    Inventors: Du-Tong Zheng, Bin Li
  • Patent number: D664134
    Type: Grant
    Filed: December 29, 2011
    Date of Patent: July 24, 2012
    Assignee: FIH (Hong Kong) Limited
    Inventors: Du-Tong Zheng, Bin Li
  • Patent number: D664135
    Type: Grant
    Filed: December 29, 2011
    Date of Patent: July 24, 2012
    Assignee: FIH (Hing Kong) Limited
    Inventors: Du-Tong Zheng, Bin Li
  • Patent number: D664136
    Type: Grant
    Filed: December 29, 2011
    Date of Patent: July 24, 2012
    Assignee: FIH (Hong Kong) Limited
    Inventors: Du-Tong Zheng, Bin Li
  • Patent number: D664137
    Type: Grant
    Filed: December 29, 2011
    Date of Patent: July 24, 2012
    Assignee: FIH (Hong Kong) Limited
    Inventors: Du-Tong Zheng, Bin Li
  • Patent number: D664138
    Type: Grant
    Filed: December 29, 2011
    Date of Patent: July 24, 2012
    Assignee: FIH (Hong Kong) Limited
    Inventors: Du-Tong Zheng, Bin Li
  • Patent number: D664139
    Type: Grant
    Filed: December 29, 2011
    Date of Patent: July 24, 2012
    Assignee: FIH (Hong Kong) Limited
    Inventors: Du-Tong Zheng, Bin Li
  • Patent number: D664526
    Type: Grant
    Filed: December 29, 2011
    Date of Patent: July 31, 2012
    Assignee: FIH (Hong Kong) Limited
    Inventors: Du-Tong Zheng, Bin Li
  • Patent number: D665780
    Type: Grant
    Filed: December 22, 2011
    Date of Patent: August 21, 2012
    Assignee: FIH (Hong Kong) Limited
    Inventors: Bin Li, Du-Tong Zheng
  • Patent number: D665785
    Type: Grant
    Filed: December 29, 2011
    Date of Patent: August 21, 2012
    Assignee: FIH (Hong Kong) Limited
    Inventors: Du-Tong Zheng, Bin Li
  • Patent number: D665788
    Type: Grant
    Filed: December 29, 2011
    Date of Patent: August 21, 2012
    Assignee: FIH (Hong Kong) Limited
    Inventors: Du-Tong Zheng, Bin Li