Abstract: Disclosed is a display substrate including a base substrate, and gate lines, data lines, common electrode lines and common electrodes on the base substrate; the gate lines and the data lines intersect to define pixel areas; the common electrodes are located in the pixel areas; the gate lines and the common electrode lines are alternately arranged one by one; each common electrode lines includes target wire segments and non-target wire segments, the target wire segments are wire segments where the common electrode lines and the data lines intersect, and the non-target wire segments are wire segments on the common electrode line except the target wire segments; and for each common electrode line, a distance between any position point on the target wire segment and a target gate line is less than a distance between the non-target wire segment and the target gate line.

Abstract: Disclosed is a display substrate including a base substrate, and gate lines, data lines, common electrode lines and common electrodes on the base substrate; the gate lines and the data lines intersect to define pixel areas; the common electrodes are located in the pixel areas; the gate lines and the common electrode lines are alternately arranged one by one; each common electrode lines includes target wire segments and non-target wire segments, the target wire segments are wire segments where the common electrode lines and the data lines intersect, and the non-target wire segments are wire segments on the common electrode line except the target wire segments; and for each common electrode line, a distance between any position point on the target wire segment and a target gate line is less than a distance between the non-target wire segment and the target gate line.

Abstract: An inspection device for a substrate includes a support member, a turning table and a first drive device. The turning table includes: a carrier pivotally mounted on a pivot shaft, the carrier having an observation aperture through its thickness direction; and positioning clamps which are mounted on the carrier and are used to retain the display substrate in the range of the observation aperture. The first drive device is in transmission connection with the pivot shaft of the carrier in order to drive the turning table to rotate around the pivot shaft. In use, an omnidirectional inspection of the display substrate can be achieved by turning the turning table. Moreover, the contact between the inspector and the display substrate can be avoided, the risk of damaging the display substrate during appearance inspection can be decreased, and therefore defects of the display substrate caused by appearance inspection can be reduced.

Abstract: The present disclosure relates to a technical field of display substrate inspection. The present disclosure discloses an inspection device and an inspection system for display substrate. The inspection device includes a support member, a turning table and a first drive device. The turning table includes: a carrier pivotally mounted on a pivot shaft, the carrier having an observation aperture through its thickness direction; and positioning clamps which are mounted on the carrier and are used to retain the display substrate in the range of the observation aperture. The first drive device is in transmission connection with the pivot shaft of the carrier in order to drive the turning table to rotate around the pivot shaft. When inspecting the appearance of the display substrate by the above mentioned inspection device, omnidirectional inspection of the display substrate can be achieved by turning the turning table.