Abstract: A method and implementation is described by which I/O input and output circuitry of a CMOS chip are measured without the need to probe the chip. Output driver transistors are used to provide marginal voltages to test input circuits, and the output driver transistors are segmented into portions where a first portion is used to provide a representative “on” current, which is coupled to a test bus that is further connected to a current comparator circuit contained within the chip. Both leakage and “on” current of the driver transistors is measured using segmented driver transistors. The output of the current comparator circuit is connected to a test scan register or to a test output from which test results are obtained digitally. The testing techniques are also applicable for other semiconductor devices.

Abstract: A method and implementation is described by which I/O input and output circuitry of a CMOS chip are measured without the need to probe the chip. Output driver transistors are used to provide marginal voltages to test input circuits, and the output driver transistors are segmented into portions where a first portion is used to provide a representative “on” current, which is coupled to a test bus that is further connected to a current comparator circuit contained within the chip. Both leakage and “on” current of the driver transistors is measured using segmented driver transistors. The output of the current comparator circuit is connected to a test scan register or to a test output from which test results are obtained digitally. The testing techniques are also applicable for other semiconductor devices.

Abstract: A method and implementation is described by which I/O input and output circuitry of a CMOS chip are measured without the need to probe the chip. Output driver transistors are used to provide marginal voltages to test input circuits, and the output driver transistors are segmented into portions where a first portion is used to provide a representative “on” current, which is coupled to a test bus that is further connected to a current comparator circuit contained within the chip. Both leakage and “on” current of the driver transistors is measured using segmented driver transistors. The output of the current comparator circuit is connected to a test scan register or to a test output from which test results are obtained digitally. The testing techniques are also applicable for other semiconductor devices.

Abstract: Circuits and methods to adjust the brightness of LCD displays have been achieved. The invention applies for LCD systems having a single or multiple display screens. The technique applied makes use of the property of LCDs where each pixel responds to the applied RMS voltage across it, and changing the timing of the COMMON signal reduces the applied voltage. This technique is applicable to both black and white and color displays as well as both standard scan and multi-addressing schemes.

Abstract: A method and implementation is described by which I/O input and output circuitry of a CMOS chip are measured without the need to probe the chip. Output driver transistors are used to provide marginal voltages to test input circuits, and the output driver transistors are segmented into portions where a first portion is used to provide a representative “on” current, which is coupled to a test bus that is further connected to a current comparator circuit contained within the chip. Both leakage and “on” current of the driver transistors is measured using segmented driver transistors. The output of the current comparator circuit is connected to a test scan register or to a test output from which test results are obtained digitally. The testing techniques are also applicable for other semiconductor devices.

Abstract: Circuits and methods to adjust the brightness of LCD displays have been achieved. The invention applies for LCD systems having a single or multiple display panels. The technique applied makes use of the property of LCDs where each pixel responds to the applied RMS voltage across it, and changing the timing of the COMMON signal reduces the applied voltage. This technique is applicable to both black and white and color displays as well as both standard scan and multi-adressing schemes.