Abstract: An approach is provided in which a cooling manager retrieves pre-characterization data corresponding to a fan that electronic components included in a computer system. The pre-characterization data includes operational zones based upon fan power measurements and fan speed settings. The cooling manager sets the fan to a first speed setting within a first operational zone, and detects that one of the components generates a temperature change value that exceeds a specified temperature change value corresponding to the component. In turn, the cooling manager selects a second operational zone and sets the fan to a second speed setting within the second operational zone.

Abstract: An approach is provided in which a cooling manager retrieves pre-characterization data corresponding to a fan that electronic components included in a computer system. The pre-characterization data includes operational zones based upon fan power measurements and fan speed settings. The cooling manager sets the fan to a first speed setting within a first operational zone, and detects that one of the components generates a temperature change value that exceeds a specified temperature change value corresponding to the component. In turn, the cooling manager selects a second operational zone and sets the fan to a second speed setting within the second operational zone.

Abstract: An approach is provided in which a cooling manager retrieves pre-characterization data corresponding to a fan that electronic components included in a computer system. The pre-characterization data includes operational zones based upon fan power measurements and fan speed settings. The cooling manager sets the fan to a first speed setting within a first operational zone, and detects that one of the components generates a temperature change value that exceeds a specified temperature change value corresponding to the component. In turn, the cooling manager selects a second operational zone and sets the fan to a second speed setting within the second operational zone.

Abstract: An approach is provided in which a cooling manager retrieves pre-characterization data corresponding to a fan that electronic components included in a computer system. The pre-characterization data includes operational zones based upon fan power measurements and fan speed settings. The cooling manager sets the fan to a first speed setting within a first operational zone, and detects that one of the components generates a temperature change value that exceeds a specified temperature change value corresponding to the component. In turn, the cooling manager selects a second operational zone and sets the fan to a second speed setting within the second operational zone.

Abstract: A method and system that utilizes a graphical interface that enables a user to select and capture building blocks of a Device Under Test (DUT) test scenario from a previously run test case or from multiple stimulation results. Each of these extracted building block events or “tags” are created from a slice of a graphical stimulation view, which slice is converted into a coded stimulus written in a high-level language code that represents the condition(s) that created the graphical simulation view. These coded stimuli (representing the tags) are stored in a library. To create a corner case scenario or sequence in the DUT, a user utilizes a graphical interface to select the different extracted tags from the library and combines them together.

Abstract: A waveform viewer implemented method of generating and manipulating user specified language simulation code such that an integrated circuit digital design can be modified. The visual capabilities of the waveform viewer allow a plurality of inputs for processing. The previous test's user specified language lines and the original signal waveforms are viewable on the same screen as the new code lines and waveforms. The waveform viewer also displays the contents of the portable reusable code portable reusable coded storage device. Each line of code and every signal can be manipulated by the user within the waveform viewer. The modified code output is applied to the test sequence through the waveform viewer, and the integrated circuit is retested with the new code. After modifications to the integrated circuit are complete, the proved device's stored user specified language can be transported to and inserted in other device architectures.