Patents by Inventor Tony P. POLOUS

Tony P. POLOUS has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electrical test of optical components via metal-insulator-semiconductor capacitor structures
    Patent number: 12276565
    Abstract: Electrical test of optical components via metal-insulator-semiconductor capacitor structures is provided via a plurality of optical devices including a first material embedded in a second material, wherein each optical device is associated with a different thickness range of a plurality of thickness ranges for the first material; a first capacitance measurement point including the first material embedded in the second material; and a second capacitance measurement point including a region from which the first material has been replaced with the second material.
    Type: Grant
    Filed: April 7, 2023
    Date of Patent: April 15, 2025
    Assignee: Cisco Technology, Inc.
    Inventors: Xunyuan Zhang, Ravi S. Tummidi, Tony P. Polous, Mark A Webster
  • ELECTRICAL TEST OF OPTICAL COMPONENTS VIA METAL-INSULATOR-SEMICONDUCTOR CAPACITOR STRUCTURES
    Publication number: 20230243718
    Abstract: Electrical test of optical components via metal-insulator-semiconductor capacitor structures is provided via a plurality of optical devices including a first material embedded in a second material, wherein each optical device is associated with a different thickness range of a plurality of thickness ranges for the first material; a first capacitance measurement point including the first material embedded in the second material; and a second capacitance measurement point including a region from which the first material has been replaced with the second material.
    Type: Application
    Filed: April 7, 2023
    Publication date: August 3, 2023
    Inventors: Xunyuan ZHANG, Ravi S. TUMMIDI, Tony P. POLOUS, Mark A. WEBSTER
  • Electrical test of optical components via metal-insulator-semiconductor capacitor structures
    Patent number: 11686648
    Abstract: Electrical test of optical components via metal-insulator-semiconductor capacitor structures is provided via a plurality of optical devices including a first material embedded in a second material, wherein each optical device is associated with a different thickness range of a plurality of thickness ranges for the first material; a first capacitance measurement point including the first material embedded in the second material; and a second capacitance measurement point including a region from which the first material has been replaced with the second material.
    Type: Grant
    Filed: July 23, 2021
    Date of Patent: June 27, 2023
    Assignee: Cisco Technology, Inc.
    Inventors: Xunyuan Zhang, Ravi S. Tummidi, Tony P. Polous, Mark A. Webster
  • ELECTRICAL TEST OF OPTICAL COMPONENTS VIA METAL-INSULATOR-SEMICONDUCTOR CAPACITOR STRUCTURES
    Publication number: 20230022612
    Abstract: Electrical test of optical components via metal-insulator-semiconductor capacitor structures is provided via a plurality of optical devices including a first material embedded in a second material, wherein each optical device is associated with a different thickness range of a plurality of thickness ranges for the first material; a first capacitance measurement point including the first material embedded in the second material; and a second capacitance measurement point including a region from which the first material has been replaced with the second material.
    Type: Application
    Filed: July 23, 2021
    Publication date: January 26, 2023
    Inventors: Xunyuan ZHANG, Ravi S. TUMMIDI, Tony P. POLOUS, Mark A. WEBSTER