Patents by Inventor Tooru Irie

Tooru Irie has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11177407
    Abstract: A method of manufacturing a back electrode type solar cell, may include forming by physical vapor deposition at least one layer of an electrode material film on both a first conductivity type semiconductor layer, to give a first electrode layer, and a second conductivity type semiconductor layer, to give a second electrode layer, and patterning the first electrode layer and the second electrode layer each in a strip-like shape such that the first electrode layer and the second electrode layer both extend in a first direction and are arranged in a second direction by removing a part of the electrode material film.
    Type: Grant
    Filed: March 17, 2020
    Date of Patent: November 16, 2021
    Assignee: KANEKA CORPORATION
    Inventors: Tooru Irie, Wataru Yoshida, Kunta Yoshikawa
  • Publication number: 20200220037
    Abstract: A method of manufacturing a back electrode type solar cell, may include forming by physical vapor deposition at least one layer of an electrode material film on both a first conductivity type semiconductor layer, to give a first electrode layer, and a second conductivity type semiconductor layer, to give a second electrode layer, and patterning the first electrode layer and the second electrode layer each in a strip-like shape such that the first electrode layer and the second electrode layer both extend in a first direction and are arranged in a second direction by removing a part of the electrode material film.
    Type: Application
    Filed: March 17, 2020
    Publication date: July 9, 2020
    Applicant: KANEKA CORPORATION
    Inventors: Tooru Irie, Wataru Yoshida, Kunta Yoshikawa
  • Publication number: 20180122964
    Abstract: A solar cell includes: a cell main body part including a back electrode and a photoelectric conversion section, the back electrode being arranged on a back surface of the photoelectric conversion section; and a metal film disposed in contact with the back electrode of the cell main body part. The back electrode includes a plurality of projections or recesses with an arithmetic mean roughness of more than 0.1 ?m. The metal film has an arithmetic mean roughness of more than 0.1 ?m on a surface contacting the back electrode. The metal film covers at least 10% of a back surface of the cell main body part.
    Type: Application
    Filed: December 28, 2017
    Publication date: May 3, 2018
    Applicant: Kaneka Corporation
    Inventors: Daisuke Adachi, Tooru Irie, Toru Terashita
  • Patent number: 9549462
    Abstract: Provided is a transparent conductive film including a transparent electrode layer composed of a patterned thin metal wire on at least one surface of a transparent film substrate. The line width of the wire is 5 ?m or less. The wire includes a first metal layer and a second metal layer that is in contact with the first metal layer, in this order from a transparent film substrate side. Both of the first and second metal layers contain copper in an amount of 90% by weight or more. The total film thickness of the first and second metal layers is 150 to 1000 nm. The diffraction angle 2? of the (111) plane of the second metal layer is less than 43.400° as measured using a CuK? ray as an X-ray source, and the first metal layer has crystal properties different from those of the second metal layer.
    Type: Grant
    Filed: March 3, 2014
    Date of Patent: January 17, 2017
    Assignee: KANEKA CORPORATION
    Inventors: Tooru Irie, Takahisa Fujimoto, Takashi Kuchiyama, Hironori Hayakawa, Shinya Omoto, Kenji Yamamoto
  • Publication number: 20160044778
    Abstract: Provided is a transparent conductive film including a transparent electrode layer composed of a patterned thin metal wire on at least one surface of a transparent film substrate. The line width of the wire is 5 ?m or less. The wire includes a first metal layer and a second metal layer that is in contact with the first metal layer, in this order from a transparent film substrate side. Both of the first and second metal layers contain copper in an amount of 90% by weight or more. The total film thickness of the first and second metal layers is 150 to 1000 nm. The diffraction angle 2? of the (111) plane of the second metal layer is less than 43.400° as measured using a CuK? ray as an X-ray source, and the first metal layer has crystal properties different from those of the second metal layer.
    Type: Application
    Filed: March 3, 2014
    Publication date: February 11, 2016
    Inventors: Tooru Irie, Takahisa Fujimoto, Takashi Kuchiyama, Hironori Hayakawa, Shinya Omoto, Kenji Yamamoto