Patents by Inventor Tooru KOMATSU

Tooru KOMATSU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11971188
    Abstract: A problem to be solved by the present disclosure is to realize a fan unit capable of determining occurrence or non-occurrence of a backflow during operation. In a second unit, a second controller calculates front-rear differential pressure by substituting a rotation speed and a volume of air or a wind speed that can be acquired in real time into a relational expression. The relational expression derives, from two values of the rotation speed, the volume of air or the wind speed, and the front-rear differential pressure, the remaining one value. Then, the second controller determines that a backflow occurs if the calculated front-rear differential pressure is within a range that cannot occur under a normal condition. Therefore, the occurrence of a backflow can be detected without using an expensive pressure sensor or a directional wind speed sensor.
    Type: Grant
    Filed: February 2, 2023
    Date of Patent: April 30, 2024
    Assignee: DAIKIN INDUSTRIES, LTD.
    Inventors: Akira Komatsu, Shuuichi Tanaka, Tooru Fujimoto
  • Patent number: 11920818
    Abstract: A problem to be solved by the present disclosure is to realize a fan unit capable of determining occurrence or non-occurrence of a backflow during operation. In a second unit, a second controller calculates front-rear differential pressure by substituting a rotation speed and a volume of air or a wind speed that can be acquired in real time into a relational expression. The relational expression derives, from two values of the rotation speed, the volume of air or the wind speed, and the front-rear differential pressure, the remaining one value. Then, the second controller determines that a backflow occurs if the calculated front-rear differential pressure is within a range that cannot occur under a normal condition. Therefore, the occurrence of a backflow can be detected without using an expensive pressure sensor or a directional wind speed sensor.
    Type: Grant
    Filed: February 2, 2023
    Date of Patent: March 5, 2024
    Assignee: DAIKIN INDUSTRIES, LTD.
    Inventors: Akira Komatsu, Shuuichi Tanaka, Tooru Fujimoto
  • Patent number: 11220740
    Abstract: The manufacturing cost of a sputtering target is reduced and the impurity concentration of the manufactured sputtering target is also reduced. A method of manufacturing a sputtering target includes: surface-treating at least one of a used sputtering target and a scrap material; melting at least one of the used sputtering target and the scrap material after the surface treatment to form an ingot; and manufacturing a sputtering target by subjecting the ingot to forging, rolling, heat treating, and machining.
    Type: Grant
    Filed: December 13, 2019
    Date of Patent: January 11, 2022
    Assignees: KABUSHIKI KAISHA TOSHIBA, TOSHIBA MATERIALS CO., LTD.
    Inventors: Tooru Komatsu, Nobuaki Nakashima
  • Patent number: 11198933
    Abstract: The manufacturing cost of a sputtering target is reduced and the impurity concentration of the manufactured sputtering target is also reduced. A method of manufacturing a sputtering target includes: surface-treating at least one of a used sputtering target and a scrap material; melting at least one of the used sputtering target and the scrap material after the surface treatment to form an ingot; and manufacturing a sputtering target by subjecting the ingot to forging, rolling, heat treating, and machining.
    Type: Grant
    Filed: December 13, 2019
    Date of Patent: December 14, 2021
    Assignees: KABUSHIKI KAISHA TOSHIBA, TOSHIBA MATERIALS CO., LTD.
    Inventors: Tooru Komatsu, Nobuaki Nakashima
  • Publication number: 20200115791
    Abstract: The manufacturing cost of a sputtering target is reduced and the impurity concentration of the manufactured sputtering target is also reduced. A method of manufacturing a sputtering target includes: surface-treating at least one of a used sputtering target and a scrap material; melting at least one of the used sputtering target and the scrap material after the surface treatment to form an ingot; and manufacturing a sputtering target by subjecting the ingot to forging, rolling, heat treating, and machining.
    Type: Application
    Filed: December 13, 2019
    Publication date: April 16, 2020
    Applicants: KABUSHIKI KAISHA TOSHIBA, TOSHIBA MATERIALS CO., LTD.
    Inventors: Tooru KOMATSU, Nobuaki NAKASHIMA
  • Publication number: 20200115790
    Abstract: The manufacturing cost of a sputtering target is reduced and the impurity concentration of the manufactured sputtering target is also reduced. A method of manufacturing a sputtering target includes: surface-treating at least one of a used sputtering target and a scrap material; melting at least one of the used sputtering target and the scrap material after the surface treatment to form an ingot; and manufacturing a sputtering target by subjecting the ingot to forging, rolling, heat treating, and machining.
    Type: Application
    Filed: December 13, 2019
    Publication date: April 16, 2020
    Applicants: KABUSHIKI KAISHA TOSHIBA, TOSHIBA MATERIALS CO., LTD.
    Inventors: Tooru KOMATSU, Nobuaki NAKASHIMA
  • Patent number: 10533248
    Abstract: The manufacturing cost of a sputtering target is reduced and the impurity concentration of the manufactured sputtering target is also reduced. A method of manufacturing a sputtering target includes: surface-treating at least one of a used sputtering target and a scrap material; melting at least one of the used sputtering target and the scrap material after the surface treatment to form an ingot; and manufacturing a sputtering target by subjecting the ingot to forging, rolling, heat treating, and machining.
    Type: Grant
    Filed: September 21, 2016
    Date of Patent: January 14, 2020
    Assignees: KABUSHIKI KAISHA TOSHIBA, TOSHIBA MATERIALS CO., LTD.
    Inventors: Tooru Komatsu, Nobuaki Nakashima
  • Publication number: 20170009336
    Abstract: The manufacturing cost of a sputtering target is reduced and the impurity concentration of the manufactured sputtering target is also reduced. A method of manufacturing a sputtering target includes: surface-treating at least one of a used sputtering target and a scrap material; melting at least one of the used sputtering target and the scrap material after the surface treatment to form an ingot; and manufacturing a sputtering target by subjecting the ingot to forging, rolling, heat treating, and machining.
    Type: Application
    Filed: September 21, 2016
    Publication date: January 12, 2017
    Applicants: KABUSHIKI KAISHA TOSHIBA, TOSHIBA MATERIALS CO., LTD.
    Inventors: Tooru KOMATSU, Nobuaki NAKASHIMA