Abstract: A lead forming apparatus has a function of bending leads of a semiconductor device having leads into a gull wing shape. The lead forming apparatus includes: a lead bending die, as a lower die, allowing thereon placement of the semiconductor device and accepting the leads in the bending leads; a lead bending punch, as an upper die, descending towards the lead bending die so as to move the leads of the semiconductor device towards the lead bending die, to thereby bend the leads into a gull wing shape; and a first stopper specifying the bottom dead center of the lead bending punch, so as to ensure a distance not smaller than thickness of the leads between the bottom surface of the lead bending punch and the top surface of a portion, allowing thereon placement of the leads, of the lead bending die.

Abstract: A tilt inspection apparatus which detects tilt of an object to be observed with respect to a placement surface on which the object is placed, including: a light source which irradiates light or projects an image onto the object to be observed; a light shield plate which has a first slit extended in a first direction and a second slit extended in a second direction normal to the first direction, and is disposed between the light source and the object to be observed; and a carriage mechanism which supports the light shield plate so as to be rotatable in the in-plane direction of the light shield plate, and fixes the light shield plate while aligning the first slit normal to the placement surface is provided.

Abstract: A die unit that maintains uniform quality of a work despite continuous operation is provided. The die unit includes a lower die holder including a base hole, an upper die holder including a through hole, a pillar having an end portion inserted to the base hole and the other end portion slidably inserted through the through hole, so as to allow the upper die holder to slide toward and away from the lower die holder, an annular bushing attached to the through hole so as to slide along the pillar, and a die element and a punch attached to one of the lower die holder and the upper die holder respectively. A spacer is provided at least one of between an inner circumferential surface of the through hole and the bushing, and between an inner circumferential surface of the base hole and the pillar, and the spacer has lower thermal conductivity than the upper die holder or the lower die holder on which the spacer is provided.

Abstract: Aimed at stably forming sheared surfaces of leads of semiconductor devices, and at raising ratio of formation of plated layers onto the sheared surfaces of the leads, a lead cutter has a die 106, and a cutting punch 110 having a cutting edge at least on the surface facing the die, wherein clearance T between the die 106 and the cutting punch 110 is set within the range from not smaller than 2.3% and smaller than 14.0% of the total thickness of the leads to be cut and plated layers formed on the upper and the lower surfaces thereof.

Abstract: Aimed at stably forming sheared surfaces of leads of semiconductor devices, and at raising ratio of formation of plated layers onto the sheared surfaces of the leads, a lead cutter has a die 106, and a cutting punch 110 having a cutting edge at least on the surface facing the die, wherein clearance T between the die 106 and the cutting punch 110 is set within the range from not smaller than 2.3% and smaller than 14.0% of the total thickness of the leads to be cut and plated layers formed on the upper and the lower surfaces thereof.

Abstract: A tilt inspection apparatus which detects tilt of an object to be observed with respect to a placement surface on which the object is placed, including: a light source which irradiates light or projects an image onto the object to be observed; a light shield plate which has a first slit extended in a first direction and a second slit extended in a second direction normal to the first direction, and is disposed between the light source and the object to be observed; and a carriage mechanism which supports the light shield plate so as to be rotatable in the in-plane direction of the light shield plate, and fixes the light shield plate while aligning the first slit normal to the placement surface is provided.

Abstract: A cutting machine including a die, and a cutting punch having a cutting edge, and configured to bring the cutting punch close to the die to have the cutting edge face to a surface of the die thereby cut a work, the cutting punch being provided with a local slope, wherein the cutting machine is configured, using a light source, to irradiate a light such that the light transmit through the clearance between the cutting punch and the surface of the die and to reflect on the local slope such that the direction of the path of the light is changed so as to yield reflected light to be observed is provided.

Abstract: There is provided a lead cutter that enables micro-adjusting a cutting clearance between a punch and a die with high accuracy. The lead cutter includes a die on which the lead provided in an encapsulating resin enclosing a semiconductor chip is to be placed, a punch that vertically moves relative to the die to thereby cut the lead, and a temperature controller that controls a temperature of at least one of the punch and the die, so as to adjust a clearance between the punch and the die.

Abstract: A lead forming apparatus has a function of bending leads of a semiconductor device having leads into a gull wing shape. The lead forming apparatus includes: a lead bending die, as a lower die, allowing thereon placement of the semiconductor device and accepting the leads in the bending leads; a lead bending punch, as an upper die, descending towards the lead bending die so as to move the leads of the semiconductor device towards the lead bending die, to thereby bend the leads into a gull wing shape; and a first stopper specifying the bottom dead center of the lead bending punch, so as to ensure a distance not smaller than thickness of the leads between the bottom surface of the lead bending punch and the top surface of a portion, allowing thereon placement of the leads, of the lead bending die.

Abstract: Aimed at stably forming sheared surfaces of leads of semiconductor devices, and at raising ratio of formation of plated layers onto the sheared surfaces of the leads, a lead cutter has a die 106, and a cutting punch 110 having a cutting edge at least on the surface facing the die, wherein clearance T between the die 106 and the cutting punch 110 is set within the range from not smaller than 2.3% and smaller than 14.0% of the total thickness of the leads to be cut and plated layers formed on the upper and the lower surfaces thereof.

Abstract: Aimed at stably forming sheared surfaces of leads of semiconductor devices, and at raising ratio of formation of plated layers onto the sheared surfaces of the leads, a lead cutter has a die 106, and a cutting punch 110 having a cutting edge at least on the surface facing the die, wherein clearance T between the die 106 and the cutting punch 110 is set within the range from not smaller than 2.3% and smaller than 14.0% of the total thickness of the leads to be cut and plated layers formed on the upper and the lower surfaces thereof.