Patents by Inventor Tooru Shinaki

Tooru Shinaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe manufacturing method, probe, and scanning probe microscope
    Patent number: 7388199
    Abstract: A probe is made by attaching a carbon nanotube 12 to a mounting base end 13, which eliminates the effects of a carbon contamination film, to increase the bonding strength, increase the conductivity of the probe, and strengthen the bonding performance thereof by coating the entire circumference of the nanotube and the base with a coating film, rather than coating just one side. The work of mounting the carbon nanotube and mounting base end are performed under observation by a microscope. Further, the carbon contamination film 14 formed by an electron microscope is stripped off at a stage before bonding by the coating film.
    Type: Grant
    Filed: September 3, 2004
    Date of Patent: June 17, 2008
    Assignee: Hitachi Kenki Fine Tech Co., Ltd.
    Inventors: Takafumi Morimoto, Tooru Shinaki, Yoshiyuki Nag'No, Yukio Kenbou, Yuuichi Kunitomo, Takenori Hiroki, Tooru Kurenuma, Hiroaki Yanagimoto, Hiroshi Kuroda, Shigeru Miwa, Ken Murayama, Mitsuo Hayashibara, Kishio Hidaka, Tadashi Fujieda