Patents by Inventor Tore NIERMANN

Tore NIERMANN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Arrangement and method for detecting a measured value on the basis of electron holography
    Patent number: 12038720
    Abstract: The invention relates to a method for detecting a measured value (d?/dx, M).
    Type: Grant
    Filed: June 28, 2019
    Date of Patent: July 16, 2024
    Assignee: Technische Universität Berlin
    Inventors: Tolga Wagner, Michael Lehmann, Tore Niermann
  • ARRANGEMENT AND METHOD FOR DETECTING A MEASURED VALUE ON THE BASIS OF ELECTRON HOLOGRAPHY
    Publication number: 20220171333
    Abstract: The invention relates to a method for detecting a measured value (d?/dx, M).
    Type: Application
    Filed: June 28, 2019
    Publication date: June 2, 2022
    Applicant: Technische Universität Berlin
    Inventors: Tolga WAGNER, Michael LEHMANN, Tore NIERMANN
  • Method and apparatus for carrying out a time-resolved interferometric measurement
    Patent number: 11293747
    Abstract: An embodiment of the invention relates to a method for carrying out a time-resolved interferometric measurement comprising the steps of generating at least two coherent waves, overlapping said at least two coherent waves and producing an interference pattern, measuring the interference pattern for a given exposure time, thereby forming measured interference values, and analyzing the measured interference values and extracting amplitude and/or phase information from the measured interference values. In at least one time segment, hereinafter referred to as disturbed time segment, of the expo-sure time, the interference pattern is intentionally disturbed or destroyed such that the corresponding measured interference values describe a disturbed or destroyed interference pattern.
    Type: Grant
    Filed: February 27, 2018
    Date of Patent: April 5, 2022
    Assignee: TECHNISCHE UNIVERSITAET BERLIN
    Inventors: Michael Lehmann, Tore Niermann, Tolga Wagner
  • METHOD AND APPARATUS FOR CARRYING OUT A TIME-RESOLVED INTERFEROMETRIC MEASUREMENT
    Publication number: 20200103213
    Abstract: An embodiment of the invention relates to a method for carrying out a time-resolved interferometric measurement comprising the steps of generating at least two coherent waves, overlapping said at least two coherent waves and producing an interference pattern, measuring the interference pattern for a given exposure time, thereby forming measured interference values, and analyzing the measured interference values and extracting amplitude and/or phase information from the measured interference values. In at least one time segment, hereinafter referred to as disturbed time segment, of the exposure time, the interference pattern is intentionally disturbed or destroyed such that the corresponding measured interference values describe a disturbed or destroyed interference pattern.
    Type: Application
    Filed: February 27, 2018
    Publication date: April 2, 2020
    Applicant: Technische Universitaet Berlin
    Inventors: Michael LEHMANN, Tore NIERMANN, Tolga WAGNER