Abstract: Provided is an optical arrangement comprising a stacked structure having at least three prisms. The optical arrangement also comprises a primary optical path and a secondary optical path for each of the prisms. The secondary optical path runs through the corresponding prism, is connected with the primary optical path by means of partial reflection of light, and is subject to total reflection at a further surface of the corresponding prism.

Abstract: An optical arrangement includes a stack structure comprising at least three prisms. The optical arrangement includes a main optical path and for each of the prisms, a secondary optical path. The optical arrangement also includes at least one interface. Each of the at least one interface is arranged between a corresponding first stack section of the stack structure and a corresponding second stack section of the stack structure. Each of the at least one interface is configured to enable relative movement of the corresponding first stack section and of the corresponding second stack section with respect to one another.

Abstract: An optical arrangement includes a stack structure comprising at least three prisms. The optical arrangement includes a main optical path and for each of the prisms, a secondary optical path. The optical arrangement also includes at least one interface. Each of the at least one interface is arranged between a corresponding first stack section of the stack structure and a corresponding second stack section of the stack structure. Each of the at least one interface is configured to enable relative movement of the corresponding first stack section and of the corresponding second stack section with respect to one another.

Abstract: Near-field optical microscope with a probe tip which is arranged on one side of a light-transmitting specimen and moved in a scanning manner. The probe tip serves as a point light source. Optics for collecting light transmitted through the specimen and transmitting it to a detection unit or for collecting illumination light are provided on the other side of the specimen. The movement of the probe tip is adapted to on the detection side, or the probe serves to detect specimen light. A detection unit is arranged following the probe in the direction of illumination, and a scanning illumination adapted to the probe movement is carried out on the other side of the specimen.

Abstract: An illumination device for a light microscope comprises a scanning microscope probe which is integrated in the center thereof. A scanning probe microscope comprising such illumination device is also disclosed.

Abstract: An illumination device for a light microscope comprises a scanning microscope probe which is integrated in the center thereof. A scanning probe microscope comprising such illumination device is also disclosed.

Abstract: In a probe element for coordinate measuring systems using micro-probe elements and piezo-resonators which change their resonance characteristics upon contact, the probe element has piezo-resonators arranged in a polygonal configuration. Micro-probe elements are arranged in a polygonal configuration on the piezo-resonators and sense inner and outer surfaces in different coordinates. The tactile sensing of the micro-probe elements on the surface of the specimen is effected by measuring the change in the resonance characteristics of the piezo-resonators.