Patents by Inventor Torsten Kiel

Torsten Kiel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe systems configured to test a device under test and methods of operating the probe systems
    Patent number: 11598789
    Abstract: Probe systems configured to test a device under test and methods of operating the probe systems are disclosed herein. The probe systems include an electromagnetically shielded enclosure, which defines an enclosed volume, and a temperature-controlled chuck, which defines a support surface configured to support a substrate that includes the DUT. The probe systems also include a probe assembly and an optical microscope. The probe systems further include an electromagnet and an electronically controlled positioning assembly. The electronically controlled positioning assembly includes a two-dimensional positioning stage, which is configured to selectively position a positioned assembly along a first two-dimensional positioning axis and also along a second two-dimensional positioning axis.
    Type: Grant
    Filed: October 20, 2021
    Date of Patent: March 7, 2023
    Assignee: FormFactor, Inc.
    Inventors: Martin Schindler, Stefan Kreissig, Torsten Kiel
  • PROBE SYSTEMS CONFIGURED TO TEST A DEVICE UNDER TEST AND METHODS OF OPERATING THE PROBE SYSTEMS
    Publication number: 20220236303
    Abstract: Probe systems configured to test a device under test and methods of operating the probe systems are disclosed herein. The probe systems include an electromagnetically shielded enclosure, which defines an enclosed volume, and a temperature-controlled chuck, which defines a support surface configured to support a substrate that includes the DUT. The probe systems also include a probe assembly and an optical microscope. The probe systems further include an electromagnet and an electronically controlled positioning assembly. The electronically controlled positioning assembly includes a two-dimensional positioning stage, which is configured to selectively position a positioned assembly along a first two-dimensional positioning axis and also along a second two-dimensional positioning axis.
    Type: Application
    Filed: October 20, 2021
    Publication date: July 28, 2022
    Inventors: Martin Schindler, Stefan Kreissig, Torsten Kiel