Abstract: A method of using a memory chip includes operating a memory chip of a memory system and sending a command signal to the memory chip, wherein the command signal contains information regarding an operational frequency of a system clock signal of the memory system. The method provides the advantage of enabling high operation frequencies and thus increasing the SDRAM internal timing margin.

Abstract: A shielding line system reduces or eliminates crosstalk between conductive lines in an integrated circuit. The shielding line system has first conductive line and one or more second conductive lines. A shielding line conduit radially encloses the first conductive line. An electromagnetic field also radially encloses the first conductive line.

Abstract: A delay locked loop (DLL) for use in a semiconductor device includes a phase detector that receives a reference clock signal and a feedback clock signal and provides a delay control signal to a latch. The latch provides a latched delay control signal to a delay circuit. The delay circuit receives the reference clock signal in addition to the latched delay control signal, and provides a delayed clock signal. An off chip driver (OCD) receives the delayed clock signal and provides an interim feedback clock signal to a receiver. The receiver provides the feedback clock signal to the phase detector, thus completing the loop. The DLL may also include a means for receiving and responding to an update command, wherein the update command causes loop to open, and the latch to store the delay control signal.

Abstract: A method of throttling the frequency with which an integrated circuit is accessed includes sensing the temperature of the integrated circuit die and converting the sensed temperature to a digital signal. The digital signal is stored in a register of the integrated circuit. The digital signal is read, and the frequency with which the integrated circuit is accessed is adjusted dependent at least in part upon the temperature of the die as indicated by the digital signal.

Abstract: Integrated circuits, in particular memory chips of the DDR SDRAM type, are tested in a parallel manner. In order to prevent the circuits from being driven relative to one another during a test operation, an input terminal that is already connected to a channel of an automatic test machine anyway is connected to a switching device, by which the output drivers can be turned off in a manner dependent on the control signal that can be fed in at the input terminal. The switching device preferably contains a demultiplexer and also a multiplexer. The demultiplexer can be driven by a test control signal that is additionally generated besides the test control signal. The input terminal is connected to a tester channel anyway during test operation, with the result that no additional external outlay arises.

Abstract: A delay locked loop has a delay unit with a delay time that can be controlled in a manner dependent on a control signal. In order to generate complementary delayed clock signals, provision is made of switching elements, which tap off the clock signal to be delayed along the series circuit of delay elements. Each of the delay elements has a series circuit of two inverters. One of the delayed clock signals is tapped off in each case at the output of the second of the inverters of the delay elements, and the complementary output signal from the delayed output signals is tapped off at the first of the inverters. What is thus made possible is that, disregarding the frequency of the clock signal to be delayed and the length of the delay time, the complementary delayed clock signals always have the same phase angle with respect to one another.

Abstract: A current mirror circuit has an input path, which has a current source and, connected in series therewith, a first transistor circuit with at least two transistors, wherein one of the transistors can be connected in parallel with the other of the transistors. In an output path, which has a second transistor circuit with at least two transistors, one of the transistors can be connected in parallel with the other of the transistors. The control terminals of the transistors of the first and second transistor circuits can be connected to the input path. As a result, the current mirror circuit can be changed over between two operating modes with a different current requirement with comparatively short changeover times.

Abstract: A delay lock loop circuit includes a forward delay circuit receiving a reference clock signal and issuing a delayed clock signal. The forward delay circuit adjustably shifts in time the delayed clock signal relative to the reference clock signal. An inverter receives the delayed clock signal and issues an inverted delayed clock signal. A feedback delay circuit receives a selected one of the delayed and the inverted delayed clock signals, and issues a feedback clock signal that is shifted in time relative to the selected one of the delayed and the inverted delayed clock signals. The feedback clock signal is compared to the reference clock signal. The time shift of the delayed clock signal is adjusted to thereby time-align the reference clock signal and the feedback clock signal.

Abstract: A circuit and method of operation for combining commands in a DRAM (dynamic random access memory) are revealed. The method applies to DRAMs having a plurality of memory banks or arrays. The method combines commands to rows on different memory banks, and the method also combines row and column commands on different memory banks. The method eliminates steps in a sequence of commands, and may significantly increase speed of input/output to a DRAM.

Abstract: A method of protecting an integrated circuit that includes sensing a temperature of an integrated circuit that has a data pin, generating a temperature data signal based on the sensing, implementing a temperature sensing protocol and supplying the temperature data signal to the data pin based on the temperature sensing protocol.

Abstract: A method of protecting an integrated circuit that includes sensing a temperature of an integrated circuit, comparing the sensed temperature with a threshold temperature and controlling operation of the integrated circuit based on the comparing.

Abstract: A switching network with trimmable resistors lies in a control loop of a voltage generator that can be switched off from the supply voltage by a logic device. The logic device and also the switching network are driven by the same signals. The circuit configuration can be used for trimming or switching off the output voltage generated by the voltage generator during the functional test. As many settings as possible for the output voltage can be tested by a small number of control signals.

Abstract: An integrated circuit includes a core memory array and a test mode compression circuit. The test mode compression circuit receives test mode data from the core memory array. A multiplexer receives read data from the core memory array and test mode data from the test mode compression circuit. The multiplexer receives a test mode compression signal and selectively transfers one of the read data and the test mode data dependent at least in part upon the test mode compression signal.

Abstract: A delay lock loop circuit includes a forward delay circuit receiving a reference clock signal and issuing a first delayed clock signal. The forward delay circuit adjustably shifts in time the first delayed clock signal relative to the reference clock signal. A fixed delay circuit receives the first delayed clock signal and issues a second delayed clock signal. A feedback delay circuit receives a selected one of the first delayed and the second delayed clock signals, and issues a feedback clock signal. The feedback clock signal is shifted in time relative to the selected one of the first delayed and the second delayed clock signals.

Abstract: A delay lock loop circuit includes a forward delay circuit receiving a reference clock signal and issuing a delayed clock signal. The forward delay circuit adjustably shifts in time the delayed clock signal relative to the reference clock signal. An inverter receives the delayed clock signal and issues an inverted delayed clock signal. A feedback delay circuit receives a selected one of the delayed and the inverted delayed clock signals, and issues a feedback clock signal that is shifted in time relative to the selected one of the delayed and the inverted delayed clock signals. The feedback clock signal is compared to the reference clock signal. The time shift of the delayed clock signal is adjusted to thereby time-align the reference clock signal and the feedback clock signal.

Abstract: A synchronous semiconductor memory containing dynamic memory cells has a delay locked loop in order to synchronize a clock signal which actuates data output drivers with an externally supplied clock signal. An updating of the delay locked loop is suppressed during a Read state of the semiconductor memory. An appropriate control signal is produced by a state machine and is supplied to the delay locked loop. The synchronization of the data output with the supplied clock signal can be achieved in a precise manner and requires only simple circuitry.

Abstract: The voltage pump for generating a boosted output voltage has a switch-on control circuit. The switch-on control includes a transistor that is connected between a terminal for feeding in a supply voltage and the terminal for tapping off the boosted output voltage. After the voltage pump has started to operate, the boosted output voltage is decoupled from the supply voltage by the transistor. A changeover switch forwards the respective higher of the output voltage or supply voltage to the substrate terminal and gate terminal of the transistor. The switch-on control enables early provision of a boosted output voltage in conjunction with reliable start-up operation of the voltage pump, while the additional outlay on circuitry is minimized.

Abstract: An integrated memory is described which has a memory cell array with column lines and row lines. A row access controller serves for activating one of the row lines and for controlling a deactivation operation. An input of a control unit is connected to a signal terminal for a signal that, in the event of a read access to one of the memory cells, defines the beginning of data outputting to a point outside the memory cell array. The data output is synchronized with a clock signal. In this case, the signal is adjustable depending on an operating frequency of the memory. An output signal of the control unit serves for triggering the deactivation operation of one of the row lines after a write access. Therefore, in the event of a write access, a comparatively high data throughput is possible even at different operating frequencies of the integrated memory.

Abstract: A delay locked loop includes a delay unit with a controllable delay time. Switching elements are provided in order to tap off output signals from the delay elements of the delay unit. Two nodes connected to the switching elements are connected to a multiplexer configuration in order to activate in each case two of the switching elements that are connected to delay elements connected directly in succession. A phase interpolator generates an intermediate phase from the signals provided.

Abstract: A delay locked loop has a delay unit with a delay time that can be controlled in a manner dependent on a control signal. In order to generate complementary delayed clock signals, provision is made of switching elements, which tap off the clock signal to be delayed along the series circuit of delay elements. Each of the delay elements has a series circuit of two inverters. One of the delayed clock signals is tapped off in each case at the output of the second of the inverters of the delay elements, and the complementary output signal from the delayed output signals is tapped off at the first of the inverters. What is thus made possible is that, disregarding the frequency of the clock signal to be delayed and the length of the delay time, the complementary delayed clock signals always have the same phase angle with respect to one another.