Abstract: A measurement system for characterizing a device under test is described. The measurement system includes a signal source, an analysis module, and a directional element that is connected to each of the device under test, the signal source, and the analysis module. The signal source is configured to generate a digital instruction signal or an analog stimulus signal for the device under test. In the case of generating the analog stimulus signal, the directional element is configured to forward the analog stimulus signal from the signal source to the device under test, wherein the device under test includes circuitry configured to generate a digital output signal based on the analog stimulus signal received.

Abstract: A measurement system for characterizing a device under test is described. The measurement system includes a signal source, an analysis module, and a directional element that is connected to each of the device under test, the signal source, and the analysis module. The signal source is configured to generate a digital instruction signal or an analog stimulus signal for the device under test. In the case of generating the analog stimulus signal, the directional element is configured to forward the analog stimulus signal from the signal source to the device under test, wherein the device under test includes circuitry configured to generate a digital output signal based on the analog stimulus signal received.

Abstract: A calibration method for calibrating an electronic device is described. The method comprises: generating a test signal having a predefined bandwidth, said test signal comprising an asymmetric signal component being asymmetric in frequency domain, and said test signal further comprising a symmetric signal component being symmetric in frequency domain; processing said test signal via said electronic device, thereby generating a response signal of said electronic device to said test signal; analyzing said response signal, thereby generating measurement data comprising information on impairments due to at least one of a frequency selective channel of said electronic device and an IQ mismatch of said electronic device; and adapting at least one operational parameter of said electronic device based on said measurement data in order to calibrate the electronic device. Further, a calibration system is described.

Abstract: A calibration method for calibrating an electronic device is described. The method comprises: generating a test signal having a predefined bandwidth, said test signal comprising an asymmetric signal component being asymmetric in frequency domain, and said test signal further comprising a symmetric signal component being symmetric in frequency domain; processing said test signal via said electronic device, thereby generating a response signal of said electronic device to said test signal; analyzing said response signal, thereby generating measurement data comprising information on impairments due to at least one of a frequency selective channel of said electronic device and an IQ mismatch of said electronic device; and adapting at least one operational parameter of said electronic device based on said measurement data in order to calibrate the electronic device. Further, a calibration system is described.