Patents by Inventor Torsten Stautmeister
Torsten Stautmeister has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230111872Abstract: An optical positioning aid for a distance sensor for assisting in the positioning of the distance sensor relative to a measurement object includes a light source and a control unit. The light source is generates a setting light beam having a wavelength in the visible range and is suitable for generating a light spot on a measurement object. The control unit has a distance input and is communicatively connected to the light source to control at least one property of the setting light beam. The control unit evaluates an input value input into the distance input and influences at least one property of the setting light beam on the basis of a result of the evaluation such that the setting light beam allows conclusions to be drawn concerning the input value. A distance measuring system and a method for assisting in the positioning of a distance sensor are also disclosed.Type: ApplicationFiled: February 15, 2021Publication date: April 13, 2023Inventors: Torsten Stautmeister, Tobias Schueller, Marco Roessler
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Patent number: 9453728Abstract: A measuring system for determining a distance between a sensor device and a measured object, wherein the sensor device comprises a light source for generating an illumination light beam and a detector for detecting a portion of the illumination light beam reflected on the surface of the measured object and wherein the measured object is designed so it is transparent at least for a wavelength range of the visible light, is designed and further developed under consideration of the most reliable distance measurement possible in all types of measuring situations, that the illumination light beam has a wavelength in the violet or ultraviolet range and that the measured object is designed in such a way that the illumination light beam is diffusely reflected on the surface of the measured object. In addition, a corresponding measuring system is specified for measuring measured objects that are essentially impermeable to light.Type: GrantFiled: September 7, 2011Date of Patent: September 27, 2016Assignee: MICRO-EPSILON Optronic GmbHInventor: Torsten Stautmeister
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Patent number: 8928862Abstract: The invention relates to a device (1) for non-contacting measuring of a distance and/or a profile of a measured object (9), a light source (2) generating an illuminating light beam for illuminating the measured object (9), and a detector (11) being provided for detecting the reflected portion of the illuminating light beam at the measured object (9), characterized with regard to a potentially robust and nevertheless compact sensor construction in that a first optic (13) and a second optic are disposed in the beam path of the illuminating light beam, wherein the illuminating light beam can first be expanded in an expansion plane parallel to the diffusion direction by means of the first optic (13), and then made nearly parallel by means of the second optic. In a particularly preferable embodiment, the second optic is formed by a Fresnel lens (5). A corresponding method is disclosed.Type: GrantFiled: January 27, 2010Date of Patent: January 6, 2015Assignee: Micro-Epsilon Optronic GmbHInventors: Tobias Otto, Peter Meja, Torsten Stautmeister
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Patent number: 8810778Abstract: An optical sensor for measuring at least one of a range, a position, and a profile of an object that is to be measured, the measured object emitting electromagnetic radiation due to the temperature of the object to be measured, and the sensor having a light source for illuminating the surface of the measured object and a detector for detecting the illuminating light reflected at the object to be measured, wherein with respect to the measurability even on the bodies that emit electromagnetic radiation, the light generated by the light source has a wavelength below the peak of the Planck radiation spectrum of the object that is to be measured. A corresponding method is specified.Type: GrantFiled: December 22, 2010Date of Patent: August 19, 2014Assignee: Micro-Epsilon Optronic GmbHInventors: Torsten Stautmeister, Tobias Otto
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Publication number: 20130148099Abstract: A measuring system for determining a distance between a sensor device and a measured object, wherein the sensor device comprises a light source for generating an illumination light beam and a detector for detecting a portion of the illumination light beam reflected on the surface of the measured object and wherein the measured object is designed so it is transparent at least for a wavelength range of the visible light, is designed and further developed under consideration of the most reliable distance measurement possible in all types of measuring situations, that the illumination light beam has a wavelength in the violet or ultraviolet range and that the measured object is designed in such a way that the illumination light beam is diffusely reflected on the surface of the measured object. In addition, a corresponding measuring system is specified for measuring measured objects that are essentially impermeable to light.Type: ApplicationFiled: September 7, 2011Publication date: June 13, 2013Applicant: MICRO-EPSILON OPTRONIC GMBHInventor: Torsten Stautmeister
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Publication number: 20120287416Abstract: An optical sensor for measuring at least one of a range, a position, and a profile of an object that is to be measured, the measured object emitting electromagnetic radiation due to the temperature of the object to be measured, and the sensor having a light source for illuminating the surface of the measured object and a detector for detecting the illuminating light reflected at the object to be measured, wherein with respect to the measurability even on the bodies that emit electromagnetic radiation, the light generated by the light source has a wavelength below the peak of the Planck radiation spectrum of the object that is to be measured. A corresponding method is specified.Type: ApplicationFiled: December 22, 2010Publication date: November 15, 2012Inventors: Torsten Stautmeister, Tobias Otto
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Publication number: 20120038900Abstract: The invention relates to a device (1) for non-contacting measuring of a distance and/or a profile of a measured object (9), a light source (2) generating an illuminating light beam for illuminating the measured object (9), and a detector (11) being provided for detecting the reflected portion of the illuminating light beam at the measured object (9), characterized with regard to a potentially robust and nevertheless compact sensor construction in that a first optic (13) and a second optic are disposed in the beam path of the illuminating light beam, wherein the illuminating light beam can first be expanded in an expansion plane parallel to the diffusion direction by means of the first optic (13), and then made nearly parallel by means of the second optic. In a particularly preferable embodiment, the second optic is formed by a Fresnel lens (5). A corresponding method is disclosed.Type: ApplicationFiled: January 27, 2010Publication date: February 16, 2012Applicant: MICRO-EPSILON OPTRONIC GMBHInventors: Tobias Otto, Peter Meja, Torsten Stautmeister
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Patent number: 7561273Abstract: The invention relates to a device for measuring surfaces and to a method, which uses, preferably, the device. The device comprises a light source which is used to produce a multi-colored light beam. The light beam can be focused by an imaging optical system on a plurality of points which are arranged at different distances from the imaging optical system, using the chromatic aberration of the optics. The focused light beam can be deviated to a point of the surface. A sensor device is provided in order to detect the reflected light beam. The aim of the invention is to maintain the largest distance possible between the measuring head and the object. The imaging optical system comprises an optical system for the targeted circulation of a chromatic aberration and an additional optical system which is used to form the focused light beam emerging from the imaging optical system.Type: GrantFiled: November 13, 2007Date of Patent: July 14, 2009Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Torsten Stautmeister, Bernhard Messerschmidt, Karl Wisspeinter
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Publication number: 20080130013Abstract: The invention relates to a device for measuring surfaces and to a method, which uses, preferably, the device. The device comprises a light source which is used to produce a multi-colored light beam. The light beam can be focused by an imaging optical system on a plurality of points which are arranged at different distances from the imaging optical system, using the chromatic aberration of the optics. The focused light beam can be deviated to a point of the surface. A sensor device is provided in order to detect the reflected light beam. The aim of the invention is to maintain the largest distance possible between the measuring head and the object. The imaging optical system comprises an optical system for the targeted circulation of a chromatic aberration and an additional optical system which is used to form the focused light beam emerging from the imaging optical system.Type: ApplicationFiled: November 13, 2007Publication date: June 5, 2008Inventors: Torsten Stautmeister, Bernhard Messerschmidt, Karl Wisspeinter