Patents by Inventor Toru Ibane
Toru Ibane has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7982485Abstract: It is possible to provide a semiconductor test device capable improving the test efficiency. The semiconductor test device includes: a driver (14) which generates a driver signal outputted to a device under test; a variable delay circuit (12) provided at the preceding stage of the driver (14); a register (16) for setting an output level of a driver signal outputted from the driver (14); a correction value memory (26) which outputs correction data corresponding to a shift of the rise timing or the fall timing of the driver signal when the output level is modified from a predetermined value serving as a reference value of the output level; an amplitude correction value register (28) which sets a delay amount by a variable delay circuit (12) by considering correction data which is outputted from the correction value memory (26); an adder circuit (30).Type: GrantFiled: September 25, 2007Date of Patent: July 19, 2011Assignee: Advantest CorporationInventor: Toru Ibane
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Publication number: 20100001754Abstract: It is possible to provide a semiconductor test device capable improving the test efficiency. The semiconductor test device includes: a driver (14) which generates a driver signal outputted to a device under test; a variable delay circuit (12) provided at the preceding stage of the driver (14); a register (16) for setting an output level of a driver signal outputted from the driver (14); a correction value memory (26) which outputs correction data corresponding to a shift of the rise timing or the fall timing of the driver signal when the output level is modified from a predetermined value serving as a reference value of the output level; an amplitude correction value register (28) which sets a delay amount by a variable delay circuit (12) by considering correction data which is outputted from the correction value memory (26); an adder circuit (30).Type: ApplicationFiled: September 25, 2007Publication date: January 7, 2010Applicant: ADVANTEST CORPORATIONInventor: Toru Ibane
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Patent number: 7121132Abstract: A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase of either a clock signal or a strobe signal is adjusted with reference to the phase of the other signal. The relative phase difference between clock signals or between strobe signals are determined. The phases of the clock and strobe signals are adjusted with reference to the relative phase difference.Type: GrantFiled: February 11, 2006Date of Patent: October 17, 2006Assignee: Advantest CorporationInventor: Toru Ibane
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Patent number: 7111490Abstract: A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase of either a clock signal or a strobe signal is adjusted with reference to the phase of the other signal. The relative phase difference between clock signals or between strobe signals are determined. The phases of the clock and strobe signals are adjusted with reference to the relative phase difference.Type: GrantFiled: February 11, 2006Date of Patent: September 26, 2006Assignee: Advantest CorporationInventor: Toru Ibane
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Patent number: 7107816Abstract: A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase of either a clock signal or a strobe signal is adjusted with reference to the phase of the other signal. The relative phase difference between clock signals or between strobe signals are determined. The phases of the clock and strobe signals are adjusted with reference to the relative phase difference.Type: GrantFiled: February 11, 2006Date of Patent: September 19, 2006Assignee: Advantest CorporationInventor: Toru Ibane
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Patent number: 7107817Abstract: A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase of either a clock signal or a strobe signal is adjusted with reference to the phase of the other signal. The relative phase difference between clock signals or between strobe signals are determined. The phases of the clock and strobe signals are adjusted with reference to the relative phase difference.Type: GrantFiled: February 11, 2006Date of Patent: September 19, 2006Assignee: Advantest CorporationInventor: Toru Ibane
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Patent number: 7107815Abstract: A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase of either a clock signal or a strobe signal is adjusted with reference to the phase of the other signal. The relative phase difference between clock signals or between strobe signals are determined. The phases of the clock and strobe signals are adjusted with reference to the relative phase difference.Type: GrantFiled: February 11, 2006Date of Patent: September 19, 2006Assignee: Advantest CorporationInventor: Toru Ibane
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Publication number: 20060123881Abstract: A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase of either a clock signal or a strobe signal is adjusted with reference to the phase of the other signal. The relative phase difference between clock signals or between strobe signals are determined. The phases of the clock and strobe signals are adjusted with reference to the relative phase difference.Type: ApplicationFiled: February 11, 2006Publication date: June 15, 2006Inventor: Toru Ibane
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Publication number: 20060123879Abstract: A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase of either a clock signal or a strobe signal is adjusted with reference to the phase of the other signal. The relative phase difference between clock signals or between strobe signals are determined. The phases of the clock and strobe signals are adjusted with reference to the relative phase difference.Type: ApplicationFiled: February 11, 2006Publication date: June 15, 2006Inventor: Toru Ibane
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Publication number: 20060123880Abstract: A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase of either a clock signal or a strobe signal is adjusted with reference to the phase of the other signal. The relative phase difference between clock signals or between strobe signals are determined. The phases of the clock and strobe signals are adjusted with reference to the relative phase difference.Type: ApplicationFiled: February 11, 2006Publication date: June 15, 2006Inventor: Toru Ibane
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Publication number: 20060123882Abstract: A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase of either a clock signal or a strobe signal is adjusted with reference to the phase of the other signal. The relative phase difference between clock signals or between strobe signals are determined. The phases of the clock and strobe signals are adjusted with reference to the relative phase difference.Type: ApplicationFiled: February 11, 2006Publication date: June 15, 2006Inventor: Toru Ibane
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Publication number: 20060123878Abstract: A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase of either a clock signal or a strobe signal is adjusted with reference to the phase of the other signal. The relative phase difference between clock signals or between strobe signals are determined. The phases of the clock and strobe signals are adjusted with reference to the relative phase difference.Type: ApplicationFiled: February 11, 2006Publication date: June 15, 2006Inventor: Toru Ibane
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Patent number: 7043959Abstract: A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase of either a clock signal or a strobe signal is adjusted with reference to the phase of the other signal. The relative phase difference between clock signals or between strobe signals are determined. The phases of the clock and strobe signals are adjusted with reference to the relative phase difference.Type: GrantFiled: June 6, 2002Date of Patent: May 16, 2006Assignee: Advantest CorporationInventor: Toru Ibane
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Publication number: 20040173003Abstract: A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase of either a clock signal or a strobe signal is adjusted with reference to the phase of the other signal. The relative phase difference between clock signals or between strobe signals are determined. The phases of the clock and strobe signals are adjusted with reference to the relative phase difference.Type: ApplicationFiled: December 5, 2003Publication date: September 9, 2004Inventor: Toru Ibane