Abstract: A method for manufacturing a semiconductor device in which probes and the layout of the electrode pads of a test element group (TEG) are associated is provided. As a semiconductor device is miniaturized, a scribe area on a wafer also tends to decrease. Accordingly, it is necessary to reduce the size of a TEG arranged in the scribe area, and efficiently arrange an electrode pad for probe contact. Thus, it is necessary to associate the probes and the layout of the electrode pad. According to the method, a layout of a TEG electrode pad corresponding to a plurality of probes arranged in a fan shape or probes manufactured by Micro Electro Mechanical Systems (MEMS) technology is provided.

Abstract: The present invention is directed to high magnification compact zoom lenses that are reduced in diameter of groups of lens pieces closer to the imaging plane to provide downsized lightweight zoom lenses of magnification as high as 20 diameters, with an image stabilizer or vibration compensating mechanism being also reduced in dimensions. An exemplary improved high magnification zoom lens has four groups of lens pieces, namely, the first or leading lens group G1 of positive refractivity in the foremost position closer to the subject, the second lens group G2 of negative refractivity, the third lens group G3 of positive refractivity, and the fourth lens group G4 of positive refractivity in the rearmost position closer to the imaging plane, all arranged in this order.

Abstract: The present invention is directed to high magnification compact zoom lenses that are reduced in diameter of groups of lens pieces closer to the imaging plane to provide downsized lightweight zoom lenses of magnification as high as 20 diameters, with an image stabilizer or vibration compensating mechanism being also reduced in dimensions. An exemplary improved high magnification zoom lens has four groups of lens pieces, namely, the first or leading lens group G1 of positive refractivity in the foremost position closer to the subject, the second lens group G2 of negative refractivity, the third lens group G3 of positive refractivity, and the fourth lens group G4 of positive refractivity in the rearmost position closer to the imaging plane, all arranged in this order.

Abstract: The present invention is directed to high magnification compact zoom lenses that are reduced in diameter of groups of lens pieces closer to the imaging plane to provide downsized lightweight zoom lenses of magnification as high as 20 diameters, with an image stabilizer or vibration compensating mechanism being also reduced in dimensions. An exemplary improved high magnification zoom lens has four groups of lens pieces, namely, the first or leading lens group G1 of positive refractivity in the foremost position closer to the subject, the second lens group G2 of negative refractivity, the third lens group G3 of positive refractivity, and the fourth lens group G4 of positive refractivity in the rearmost position closer to the imaging plane, all arranged in this order.

Abstract: The present invention is directed to high magnification compact zoom lenses that are reduced in diameter of groups of lens pieces closer to the imaging plane to provide downsized lightweight zoom lenses of magnification as high as 20 diameters, with an image stabilizer or vibration compensating mechanism being also reduced in dimensions. An exemplary improved high magnification zoom lens has four groups of lens pieces, namely, the first or leading lens group G1 of positive refractivity in the foremost position closer to the subject, the second lens group G2 of negative refractivity, the third lens group G3 of positive refractivity, and the fourth lens group G4 of positive refractivity in the rearmost position closer to the imaging plane, all arranged in this order.