Abstract: A three-dimensional data creation method for use in a vehicle including a sensor and a data receiver that transmits and receives three-dimensional data to and from an external device. The three-dimensional data creation method includes: creating second three-dimensional data based on information detected by the sensor and first three-dimensional data received by the data receiver; and transmitting, to the external device, third three-dimensional data that is part of the second three-dimensional data.

Abstract: A displacement detection method, performed by a computer, includes: obtaining (i) a first three-dimensional (3D) model representing a region at a first timing by 3D points and including first objects and (ii) a second three-dimensional model representing the region at a second timing by 3D points and including second objects, the second timing being different from the first timing; detecting, by use of attribute information of the first objects and the second objects, (i) first 3D points included in the first 3D model and (ii) second 3D points included in the second 3D model and associated with the respective first 3D points; performing alignment of the first 3D model and the second 3D model by use of the first 3D points and the second 3D points; and detecting displacement between the first 3D model and the second 3D model after the alignment.

Abstract: A semiconductor device includes a first transistor, a first drive circuit including a second transistor, and a second drive circuit including a third transistor. The second transistor and the third transistor are connected in series; and a connection node of the second and third transistors is connected to a gate electrode of the first transistor. The first transistor, the second transistor, and the third transistor are normally-off MOS HEMTs formed in a first substrate that includes GaN. The first drive circuit charges a parasitic capacitance of the first transistor. The second drive circuit discharges the parasitic capacitance of the first transistor.

Abstract: This powder-classifying apparatus has: a centrifugation chamber configured so as to be sandwiched between two opposing members; an air supply unit that supplies air into the centrifugation chamber and generates a swirl flow; a raw material supply unit that supplies raw-material powder into the swirl flow; a fine powder recovery unit having an opening part through which air that includes fine powder classified within the centrifugation chamber is ejected to outside of the centrifugation chamber; a coarse powder recovery unit provided to the outer edge part of the centrifugation chamber, for ejecting classified coarse powder to outside of the centrifugation chamber; and an annular slit provided to at least one of the members that constitute the centrifugation chamber, the slit being provided in a region between the center part of the centrifugation chamber and the outer edge part.

Abstract: Provided is an ink including: a pigment-containing matter containing a pigment; an organic solvent; water; and a compound represented by General Formula (1) below. A difference (Ra?R0) is 2.0 or less, where Ra is a distance between a Hansen solubility parameter of the organic solvent and a Hansen solubility parameter of the pigment-containing matter determined by a Hansen solubility sphere method, and R0 is an interaction radius of the pigment-containing matter determined by the Hansen solubility sphere method. In the General Formula (1), R1, R2, R3, and R4 each independently represent a hydrogen atom or an alkyl group having 1 or more but 5 or less carbon atoms, and n represents an integer of 3 or more but 11 or less.

Abstract: An ink contains water, an organic solvent, a resin, and a pigment, wherein the organic solvent has a Hansen solubility parameter (HSP) value in a Hansen sphere in a ?D axis, ?P axis, and ?H axis coordinate space of a solid content of the ink.

Abstract: This powder-classifying apparatus has: a centrifugation chamber configured so as to be sandwiched between two opposing members; an air supply unit that supplies air into the centrifugation chamber and generates a swirl flow; a raw material supply unit that supplies raw-material powder into the swirl flow; a fine powder recovery unit having an opening part through which air that includes fine powder classified within the centrifugation chamber is ejected to outside of the centrifugation chamber; a coarse powder recovery unit provided to the outer edge part of the centrifugation chamber, for ejecting classified coarse powder to outside of the centrifugation chamber; and an annular slit provided to at least one of the members that constitute the centrifugation chamber, the slit being provided in a region between the center part of the centrifugation chamber and the outer edge part.

Abstract: An AIS information display device comprises an information acquisition component, an icon generator, and a display component. The information acquisition component acquires bearing information, which is information about the bearing of other targets with respect to the position of the host vessel. The icon generator uses an icon-use host vessel symbol S3 and one other target symbol S2 to generate an icon 19 that indicates the relative bearings of the host vessel and another target. The display component displays the icon 19 generated by the icon generator. Consequently, a ship display device can be provided which makes every target easy to understand, even when there are many other targets around the host vessel.

Abstract: [OBJECT] To surely detect a target existing around a host vehicle when the vehicle is moved back. [ORGANIZATION] A monitoring device that monitors a state around a vehicle includes: a transmitting/receiving part (other vehicle detecting parts 11a, 11b) that transmits an electromagnetic wave to receive a reflected wave from a target; a detecting part (arithmetic processing part 13) that detects the target existing in a rear area including an area directly behind the vehicle and the target existing in rear left and right sides of the vehicle, by referring to the reflected wave received from the target by the transmitting/receiving part; and a determining part (arithmetic processing part 13) that determines whether or not there is a possibility of contact or collision between the target detected by the detecting part and the vehicle.

Abstract: The present invention provides an effective means for improving the dispersibility of sediments or aggregates of microbial cells generated at the time of production and during storage of a food or beverage product containing microbial cells such as lactic acid bacteria. The present invention provides a beverage that contains microbial cells comprising (A) microbial cell powder and (B) polyglycerin fatty acid ester composed of polyglycerin having a polymerization degree of 3 to 10 and fatty acid having 10 to 18 carbon atoms connected by ester bonds.

Abstract: An AIS information display device comprises an information acquisition component, an icon generator, and a display component. The information acquisition component acquires bearing information, which is information about the bearing of other targets with respect to the position of the host vessel. The icon generator uses an icon-use host vessel symbol S3 and one other target symbol S2 to generate an icon 19 that indicates the relative bearings of the host vessel and another target. The display component displays the icon 19 generated by the icon generator. Consequently, a ship display device can be provided which makes every target easy to understand, even when there are many other targets around the host vessel.

Abstract: An optical amplifier comprising: a pumping light source supplying a pumping light to an optical fiber as an amplification medium; an ASE light power detector detecting an ASE light power including an external ASE power flowing from an upstream side outside an amplification signal band; and a control unit setting a gain within the amplification signal band by using the ASE light power detected by the ASE light power detector outside the amplification signal band. The control unit controls the pumping light source by compensating for an influence of the external ASE power, obtained by measuring a relationship between the gain within the amplification signal band and the ASE light power outside the amplification signal band, to set initially the gain within the amplification signal band.

Abstract: An optical amplifier comprising: a pumping light source supplying a pumping light to an optical fiber as an amplification medium; an ASE light power detector detecting an ASE light power including an external ASE power flowing from an upstream side outside an amplification signal band; and a control unit setting a gain within the amplification signal band by using the ASE light power detected by the ASE light power detector outside the amplification signal band. The control unit controls the pumping light source by compensating for an influence of the external ASE power, obtained by measuring a relationship between the gain within the amplification signal band and the ASE light power outside the amplification signal band, to set initially the gain within the amplification signal band.

Abstract: A defect inspecting apparatus inspects defects of a sample having a pattern formed on the surface. The defect inspecting apparatus is provided with a stage which has a sample placed thereon and linearly moves and turns; a light source; an illuminating optical system, which selects a discretionary wavelength region from the light source and epi-illuminates the sample surface through a polarizer and an objective lens; a detecting optical system, which obtains a pupil image, by passing through reflection light applied by the illuminating optical system from the surface of the sample through the objective lens and an analyzer which satisfies the cross-nichols conditions with the polarizer; and a detecting section which detects defects of the sample by comparing the obtained pupil image with a previously stored pupil image. Conformity of the pattern on a substrate to be inspected can be judged in a short time.

Abstract: A defect inspecting apparatus inspects defects of a sample having a pattern formed on the surface. The defect inspecting apparatus is provided with a stage which has a sample placed thereon and linearly moves and turns; a light source; an illuminating optical system, which selects a discretionary wavelength region from the light source and epi-illuminates the sample surface through a polarizer and an objective lens; a detecting optical system, which obtains a pupil image, by passing through reflection light applied by the illuminating optical system from the surface of the sample through the objective lens and an analyzer which satisfies the cross-nichols conditions with the polarizer; and a detecting section which detects defects of the sample by comparing the obtained pupil image with a previously stored pupil image. Conformity of the pattern on a substrate to be inspected can be judged in a short time.

Abstract: An illuminating optical system of an inspection device selects an arbitrary wavelength region from the light source, and epi-illuminates the sample via the polarizer and the objective lens. A detecting optical system includes an analyzer having a polarization plane intersected with a polarization direction of the polarizer. Then, the detecting optical system detects light from the sample via the objective lens and the analyzer, and acquires a Fourier image of a sample surface based on this light. An imaging section images the Fourier image. An analyzing section performs computation for processing for determining a notable area to be affected by a state of the pattern more than other areas in the Fourier image.

Abstract: The present invention provides an optical amplifying apparatus having: a CPU 11 for processing various signals; a plurality of circuits 17, 18 for controlling respective devices 4, 9 required for optical amplification; a first storing unit 14 for storing a program supplied from a user a gate array 12 for storing various parameters for controlling the devices 4, 9, the gate array being updated based on the program which is stored in the first storing unit 14 and sent via the CPU 11; a latch unit 13, provided between the gate array 12 and the circuits 17, 18, for interrupting a signal path from the gate array 12 to the circuits 17, 18 after receiving a starting signal of an update from the CPU 11 until the update being finished and for controlling the circuits 17, 18 based on the parameters stored in the gate array 12 before the signal path is interrupted; and a second storing unit 16 for, at least during the update, storing the various parameters which are stored in the gate array 12 before the update.

Abstract: An inspecting apparatus (1) obtains a pixel from among pixels of a DMD element (31) for guiding light from a wafer (W) to detecting elements (36a, 36b, 36c), based on luminance information on Fourier image obtained by detection by a two-dimensional imaging element (33) when the inspecting apparatus is set to guide all the light from the wafer (W) to the two-dimensional imaging element (33) by having all the pixels (micro mirrors) of the DMD element (31) in the on-state. Then, the inspecting device brings the obtained pixel of the DMD element (31) into the off-state, reflects a part of the light from the wafer (W) by the pixel in the off-state and guides the light to the detecting elements (36a, 36b, 36c).

Abstract: An illuminating optical system of an inspection device selects an arbitrary wavelength region from the light source, and epi-illuminates the sample via the polarizer and the objective lens. A detecting optical system includes an analyzer having a polarization plane intersected with a polarization direction of the polarizer. Then, the detecting optical system detects light from the sample via the objective lens and the analyzer, and acquires a Fourier image of a sample surface based on this light. An imaging section images the Fourier image. An analyzing section performs computation for processing for determining a notable area to be affected by a state of the pattern more than other areas in the Fourier image.

Abstract: A defect inspecting apparatus inspects defects of a sample having a pattern formed on the surface. The defect inspecting apparatus is provided with a stage which has a sample placed thereon and linearly moves and turns; a light source; an illuminating optical system, which selects a discretionary wavelength region from the light source and epi-illuminates the sample surface through a polarizer and an objective lens; a detecting optical system, which obtains a pupil image, by passing through reflection light applied by the illuminating optical system from the surface of the sample through the objective lens and an analyzer which satisfies the cross-nichols conditions with the polarizer; and a detecting section which detects defects of the sample by comparing the obtained pupil image with a previously stored pupil image. Conformity of the pattern on a substrate to be inspected can be judged in a short time.