Patents by Inventor Toshiaki HAMANO

Toshiaki HAMANO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220137002
    Abstract: An ultrasonic flaw detection device includes: an ultrasonic probe that detects waveform data of ultrasonic echoes emitted to an inspection area of an inspection target; a processing unit that stores pieces of sampling data obtained by sampling the waveform data obtained by the ultrasonic probe at predetermined sampling intervals in a storage unit continuously in time series; and a display control unit that divides the inspection area into a plurality of divided areas and displays each of the plurality of divided areas on a display, wherein the processing unit directly or indirectly links a divided area of the plurality of divided areas to one or more waveform data containing sampling data of one or more sampling point included in the divided area.
    Type: Application
    Filed: February 28, 2020
    Publication date: May 5, 2022
    Applicant: IHI CORPORATION
    Inventor: Toshiaki HAMANO
  • Publication number: 20210390680
    Abstract: An ultrasonic flaw detection device (A) includes: an ultrasonic probe (2) that emits ultrasonic waves to an inspection object (P) and detects reflected waves; a sheet material (1) attached to a surface of the inspection object and having two-dimensional patterns, the two-dimensional patterns being arranged on the inspection object and indicating positions on the inspection object; an imaging device (3) attached to the ultrasonic probe and imaging the two-dimensional patterns (1a); and a processing unit (21) that reads position information indicating a position on the inspection object from a captured image captured by the imaging device and relates a detection result of the ultrasonic probe to the position information, wherein the processing unit determines an index indicating the degree of quality of the detection result based on an air pocket area (HA) that is an area in which air pockets are shown in a predetermined area (H) of the captured image.
    Type: Application
    Filed: August 26, 2021
    Publication date: December 16, 2021
    Applicant: IHI CORPORATION
    Inventor: Toshiaki HAMANO
  • Patent number: 10801996
    Abstract: An inspection system includes: a sheet material that is attached to a surface of a pipe and has two-dimensional patterns drawn thereon that are arranged on the pipe and indicate positions on the pipe; a reader that is mounted to an ultrasonic probe and reads the two-dimensional patterns; and a calculation unit that acquires position data on the pipe based on the two-dimensional patterns read by the reader. The inspection system associates the position data with a flaw detection result obtained from a detection result based on the ultrasonic probe.
    Type: Grant
    Filed: April 21, 2016
    Date of Patent: October 13, 2020
    Assignee: IHI CORPORATION
    Inventors: Eisuke Shiina, Toshiaki Hamano, Takuya Shimomura
  • Patent number: 10365151
    Abstract: Disclosed is an inspection probe of an inspection system that includes an ultrasonic probe that is freely movable on a test object and irradiates the test object with an ultrasonic wave to detect a reflected wave, and a calculation unit that executes arithmetic processing according to a detection result according to the ultrasonic probe to acquire a flaw detection result of the test object. The inspection probe includes a chassis that is freely movable on a sheet material where a two-dimensional pattern disposed on the test object and indicating a position on the test object is drawn. The ultrasonic probe is fixed to the chassis so that an incident point of an ultrasonic wave that is incident onto an opposing surface of the test object from the ultrasonic probe is within an angle of view of the reader which reads the two-dimensional pattern.
    Type: Grant
    Filed: April 19, 2017
    Date of Patent: July 30, 2019
    Assignee: IHI CORPORATION
    Inventors: Toshiaki Hamano, Eisuke Shiina
  • Publication number: 20170219422
    Abstract: Disclosed is an inspection probe of an inspection system that includes an ultrasonic probe that is freely movable on a test object and irradiates the test object with an ultrasonic wave to detect a reflected wave, and a calculation unit that executes arithmetic processing according to a detection result according to the ultrasonic probe to acquire a flaw detection result of the test object. The inspection probe includes a chassis that is freely movable on a sheet material where a two-dimensional pattern disposed on the test object and indicating a position on the test object is drawn. The ultrasonic probe is fixed to the chassis so that an incident point of an ultrasonic wave that is incident onto an opposing surface of the test object from the ultrasonic probe is within an angle of view of the reader which reads the two-dimensional pattern.
    Type: Application
    Filed: April 19, 2017
    Publication date: August 3, 2017
    Applicant: IHI CORPORATION
    Inventors: Toshiaki HAMANO, Eisuke SHIINA
  • Publication number: 20160231284
    Abstract: An inspection system includes: a sheet material that is attached to a surface of a pipe and has two-dimensional patterns drawn thereon that are arranged on the pipe and indicate positions on the pipe; a reader that is mounted to an ultrasonic probe and reads the two-dimensional patterns; and a calculation unit that acquires position data on the pipe based on the two-dimensional patterns read by the reader. The inspection system associates the position data with a flaw detection result obtained from a detection result based on the ultrasonic probe.
    Type: Application
    Filed: April 21, 2016
    Publication date: August 11, 2016
    Applicant: IHI CORPORATION
    Inventors: Eisuke SHIINA, Toshiaki HAMANO, Takuya SHIMOMURA