Abstract: A circuit board inspecting apparatus includes a rotary table having a mount surface, a rotary table support section, a suction device, a suction path having a first end connected to the suction device and a second end located at the mount surface, an adsorption mechanism that adsorbs the board onto the mount surface so that the suction device sucks in gas in the suction path, a flow rate detection section that detects a flow rate of gas flowing through a portion of the suction path, the portion located inside the rotary table support section, a flow rate determination section that determines whether the flow rate of the gas detected by the flow rate detection section is equal to or more than a predetermined value, a contactless detection section that detects a placement state of the board on the mount surface in a contactless manner, and an inspection section.

Abstract: An image processing unit including: a pad region extraction unit that executes pad region extraction processing of extracting a substantially rectangular pad region surrounding a plurality of pads from an image of an inspection target object; an imaginary straight line setting unit that executes imaginary straight line setting processing of setting an imaginary first straight line parallel to a side extending in an X direction of the pad region and setting an imaginary second straight line parallel to a side extending in a Y direction of the pad; and a reference point setting unit that executes reference point setting processing of setting an intersection between the first straight line and the second straight line as the reference point.

Abstract: An inspection apparatus is provided with a holder configured to set an inspection target thereon, the inspection target configured to detect a contact position on the inspection target touched by a human finger; pseudo finger(s) configured to be detected as the human finger upon contact with the inspection target; a positioner configured to move the pseudo finger(s) relative to the inspection target and to change the contact position of the pseudo finger(s) relative to the inspection target; a memory configured to store, respectively, a value of a pressing force in a range of pressing forces said range including a zero pressing force for each of the pseudo finger(s) on the inspection target; a controller configured to regulate the pressing force for pseudo finger(s) of the pseudo finger(s) based on the respective value; and a sensor configured to acquire an electric signal output from the inspection target.

Abstract: An inspection apparatus is provided with a holder configured to set an inspection target thereon, the inspection target configured to detect a contact position on the inspection target touched by a human finger; pseudo finger(s) configured to be detected as the human finger upon contact with the inspection target; a positioner configured to move the pseudo finger(s) relative to the inspection target and to change the contact position of the pseudo finger(s) relative to the inspection target; a memory configured to store, respectively, a value of a pressing force in a range of pressing forces said range including a zero pressing force for each of the pseudo finger(s) on the inspection target; a controller configured to regulate the pressing force for pseudo finger(s) of the pseudo finger(s) based on the respective value; and a sensor configured to acquire an electric signal output from the inspection target.

Abstract: A flexible circuit board inspecting apparatus for conducting an inspection on a flexible circuit board includes a transport path and an inspection part mechanism. The transport path is configured to successively transport the flexible circuit board having a plurality of unit circuit boards arranged thereon. The inspection part mechanism is configured to bring and distance a jig for inspecting the flexible circuit board transported on the transport path close to and from the flexible circuit board. The transport path includes a longitudinal transport portion for transporting the flexible circuit board in a downward vertical direction. The inspection part mechanism moves the jig in a direction perpendicular to the flexible circuit board transported on the longitudinal transport portion to bring and distance the jig close to and from the flexible circuit board.

Abstract: An inspection apparatus is provided with a holder configured to set an inspection target thereon, the inspection target configured to detect a contact position on the inspection target touched by a human finger; pseudo finger(s) configured to be detected as the human finger upon contact with the inspection target; a positioner configured to move the pseudo finger(s) relative to the inspection target and to change the contact position of the pseudo finger(s) relative to the inspection target; a memory configured to store, respectively, a value of a pressing force in a range of pressing forces said range including a zero pressing force for each of the pseudo finger(s) on the inspection target; a controller configured to regulate the pressing force for pseudo finger(s) of the pseudo finger(s) based on the respective value; and a sensor configured to acquire an electric signal output from the inspection target.

Abstract: A substrate inspection system includes a plurality of processing units, and each processing unit is provided with a transport mechanism configured to transport an substrate to be inspected along a transport passage which extends substantially horizontally, a lift mechanism configured to lift the substrate to be inspected to a height position, at a set position on the transport passage, and processors each configured to perform a predetermined process on the substrate to be inspected positioned at the height position. The processing units are arranged such that transport passages thereof are aligned and such that the transport directions thereof are the same direction. Between two adjacent transport passages, the substrate to be inspected is delivered from the transport passage on an upstream side to the transport passage on a downstream side.

Abstract: Provided is a method of designing a circuit board inspecting jig having a contact to be brought into conductive contact with a test point on a circuit board to be inspected. The method includes: preparing temporary design data by temporarily designing the circuit board inspecting jig based on design data for the circuit board to be inspected (a first designing process); acquiring an expansion and contraction ratio of the circuit board based on a condition upon manufacturing the circuit board (and an environmental condition upon inspecting the circuit board) (an expansion and contraction ratio acquiring process); and obtaining design data for the circuit board inspecting jig to be actually manufactured by scaling the temporary design data up and down by the expansion and contraction ratio (a second designing process).

Abstract: A flexible circuit board inspecting apparatus for conducting an inspection on a flexible circuit board includes a transport path and an inspection part mechanism. The transport path is configured to successively transport the flexible circuit board having a plurality of unit circuit boards arranged thereon. The inspection part mechanism is configured to bring and distance a jig for inspecting the flexible circuit board transported on the transport path close to and from the flexible circuit board. The transport path includes a longitudinal transport portion for transporting the flexible circuit board in a downward vertical direction. The inspection part mechanism moves the jig in a direction perpendicular to the flexible circuit board transported on the longitudinal transport portion to bring and distance the jig close to and from the flexible circuit board.

Abstract: A touch panel inspecting apparatus includes a workpiece holder, a pseudo finger, an X-Y movement mechanism, a memory part, an electric pneumatic regulator, and a panel signal acquiring part. The workpiece holder allows a touch panel, which is an inspection target, to be set thereon. The pseudo finger is contactable with the touch panel set on the workpiece holder. The X-Y movement mechanism moves the pseudo finger relative to the touch panel. The memory part stores therein a set value of pressing force of the pseudo finger, in a changeable manner. The electric pneumatic regulator regulates the pressing force to bring the pseudo finger into contact with the touch panel, based on the set value stored in the memory part. The panel signal acquiring part acquires an electric signal output from the touch panel.

Abstract: A contact head unit provided in a contact apparatus may be provided with a contact rod, a housing, a thrust air passage, and a cancel air passage. The housing supports the contact rod linearly movably by a static pressure air bearing, which allows the contact rod to be brought into contact with an object. If a compressed air is supplied to the thrust air passage, a force in a direction of approaching the object acts on the contact rod. If the compressed air is supplied to the cancel air passage, a force in an opposite direction acts on the contact rod. A control unit sets applied pressure on the object by controlling the pressure of the compressed air of the thrust air passage and the pressure of the compressed air of the cancel air passage while the contact rod is in contact with the object.

Abstract: A substrate inspection system includes a plurality of processing units, and each processing unit is provided with a transport mechanism configured to transport an substrate to be inspected along a transport passage which extends substantially horizontally, a lift mechanism configured to lift the substrate to be inspected to a height position, at a set position on the transport passage, and processors each configured to perform a predetermined process on the substrate to be inspected positioned at the height position. The processing units are arranged such that transport passages thereof are aligned and such that the transport directions thereof are the same direction. Between two adjacent transport passages, the substrate to be inspected is delivered from the transport passage on an upstream side to the transport passage on a downstream side.