Patents by Inventor Toshihide Orihashi

Toshihide Orihashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11480504
    Abstract: When the type is to be changed from serum (preceding sample) to urine (current sample), “serum” is set to a preceding type and “urine” is set to a measurement type at number 1 in a condition number. At condition number 1, the wash type is pattern 1, with washing performed once with detergent 1. Where the preceding sample is serum and the current sample is CSF, the condition number is 2 and the wash type is pattern 2, with washing performed twice using detergent 1 and once with detergent 2. Where the preceding sample is urine and the current sample is CSF, the condition number is 3 and the wash type is pattern 3, with washing performed once with detergent 1, once with detergent 2, and once with water. In the case of pattern 4, washing is performed three times with detergent 1.
    Type: Grant
    Filed: January 30, 2018
    Date of Patent: October 25, 2022
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Naoto Suzuki, Yoshiaki Saito, Yoichi Aruga, Toshihide Orihashi, Kazuhiro Nakamura
  • Patent number: 10962558
    Abstract: An automatic analyzer is capable of ensuring sufficient nozzle cleaning and suppressing of deterioration in the accuracy of analysis. When it is judged that there remains no analysis item of the sample, a judgment is made on whether the sample dispensation quantity of the n-th sample dispensation is less than a dispensation quantity threshold value or not, and if less, a cleaning pattern is selected by making a judgment on whether or not all the sample dispensation quantities of the first through (n?1)-th sample dispensations are less than the dispensation quantity threshold value. If the sample dispensation quantity of the n-th sample dispensation is the dispensation quantity threshold value or more, another cleaning pattern selected by making the judgment on whether or not all the sample dispensation quantities of the first through (n?1)-th sample dispensations are less than the dispensation quantity threshold value.
    Type: Grant
    Filed: January 3, 2018
    Date of Patent: March 30, 2021
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Akihiro Yasui, Hitoshi Tokieda, Toshihide Orihashi, Yoshiaki Saito, Naoto Suzuki
  • Patent number: 10732192
    Abstract: An automatic analyzer has a transport device which includes a specimen rack gripping mechanism that grips the specimen rack on a first transport path on which the specimen racks are transported by the specimen rack being sandwiched between gripping plates from both sides of flanks in the transport direction to transport the specimen rack along the first transport path and a gripping width controller that controls a distance between the gripping plates of the specimen rack gripping mechanism in accordance with a width of the specimen rack. Accordingly, an automatic analyzer capable of transporting a plurality of types of the specimen racks while suppressing an increase in size of the apparatus and also an increase in cost can be provided.
    Type: Grant
    Filed: May 22, 2015
    Date of Patent: August 4, 2020
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Satoru Chida, Kazuhiro Nakamura, Yoshihiro Suzuki, Toshihide Orihashi
  • Patent number: 10094844
    Abstract: In determining whether a rack inputted to the automatic analyzer by the user is to be transferred to an analysis section or not, samples existing in a route from a buffer to a sample dispensing position in the analysis section are identified, and the number of items in which suction by a nozzle has not been completed in analysis items requested for the samples is managed. When the number of items is reduced to be smaller than a given number, the conveyance of a next rack from the buffer to the analysis section is controlled, thereby limiting the number of analysis items requested for samples in a waiting state for analysis in the analysis section constantly to be smaller than a fixed number. As a result, a period of time until a measurement result of emergency samples is outputted can be reduced even when emergency samples are newly inputted.
    Type: Grant
    Filed: June 29, 2012
    Date of Patent: October 9, 2018
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yoshiaki Saito, Kazuhiro Nakamura, Naoto Suzuki, Toshihide Orihashi
  • Publication number: 20180156702
    Abstract: When the type is to be changed from serum (preceding sample) to urine (current sample), “serum” is set to a preceding type and “urine” is set to a measurement type at number 1 in a condition number. At condition number 1, the wash type is pattern 1, with washing performed once with detergent 1. Where the preceding sample is serum and the current sample is CSF, the condition number is 2 and the wash type is pattern 2, with washing performed twice using detergent 1 and once with detergent 2. Where the preceding sample is urine and the current sample is CSF, the condition number is 3 and the wash type is pattern 3, with washing performed once with detergent 1, once with detergent 2, and once with water. In the case of pattern 4, washing is performed three times with detergent 1.
    Type: Application
    Filed: January 30, 2018
    Publication date: June 7, 2018
    Inventors: Naoto SUZUKI, Yoshiaki SAITO, Yoichi ARUGA, Toshihide ORIHASHI, Kazuhiro NAKAMURA
  • Publication number: 20180128847
    Abstract: An automatic analyzer is capable of ensuring sufficient nozzle cleaning and suppressing of deterioration in the accuracy of analysis. When it is judged that there remains no analysis item of the sample, a judgment is made on whether the sample dispensation quantity of the n-th sample dispensation is less than a dispensation quantity threshold value or not, and if less, a cleaning pattern is selected by making a judgment on whether or not all the sample dispensation quantities of the first through (n?1)-th sample dispensations are less than the dispensation quantity threshold value. If the sample dispensation quantity of the n-th sample dispensation is the dispensation quantity threshold value or more, another cleaning pattern selected by making the judgment on whether or not all the sample dispensation quantities of the first through (n?1)-th sample dispensations are less than the dispensation quantity threshold value.
    Type: Application
    Filed: January 3, 2018
    Publication date: May 10, 2018
    Inventors: Akihiro Yasui, Hitoshi Tokieda, Toshihide Orihashi, Yoshiaki Saito, Naoto Suzuki
  • Patent number: 9945881
    Abstract: After an analysis start instruction is input in a state where a sample is not dispensed to all of reaction containers 104 mounted on a reaction disc 105, before completing an analysis preparation washing process for washing the reaction container 104 to be used in analyzing the sample to be first analyzed, a soaking and washing process for performing soaking and washing during a predetermined period of time is controlled to be started by dispensing a soaking and washing detergent to another reaction container 104 different from the reaction container 104. In this manner, the soaking and washing can be efficiently performed on the reaction container without hindering an analysis process.
    Type: Grant
    Filed: January 16, 2015
    Date of Patent: April 17, 2018
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yoshiaki Saito, Toshihide Orihashi, Kazuhiro Nakamura
  • Patent number: 9897519
    Abstract: When the type is to be changed from serum (preceding sample) to urine (current sample), “serum” is set to a preceding type and “urine” is set to a measurement type at number 1 in a condition number. At condition number 1, the wash type is pattern 1, with washing performed once with detergent 1. Where the preceding sample is serum and the current sample is CSF, the condition number is 2 and the wash type is pattern 2, with washing performed twice using detergent 1 and once with detergent 2. Where the preceding sample is urine and the current sample is CSF, the condition number is 3 and the wash type is pattern 3, with washing performed once with detergent 1, once with detergent 2, and once with water. In the case of pattern 4, washing is performed three times with detergent 1.
    Type: Grant
    Filed: December 14, 2012
    Date of Patent: February 20, 2018
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Naoto Suzuki, Yoshiaki Saito, Yoichi Aruga, Toshihide Orihashi, Kazuhiro Nakamura
  • Patent number: 9891240
    Abstract: An automatic analyzer is capable of ensuring sufficient nozzle cleaning and suppressing of deterioration in the accuracy of analysis. When it is judged that there remains no analysis item of the sample, a judgment is made on whether the sample dispensation quantity of the n-th sample dispensation is less than a dispensation quantity threshold value or not, and if less, a cleaning pattern is selected by making a judgment on whether or not all the sample dispensation quantities of the first through (n?1)-th sample dispensations are less than the dispensation quantity threshold value. If the sample dispensation quantity of the n-th sample dispensation is the dispensation quantity threshold value or more, another cleaning pattern selected by making the judgment on whether or not all the sample dispensation quantities of the first through (n?1)-th sample dispensations are less than the dispensation quantity threshold value.
    Type: Grant
    Filed: July 25, 2013
    Date of Patent: February 13, 2018
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Akihiro Yasui, Hitoshi Tokieda, Toshihide Orihashi, Yoshiaki Saito, Naoto Suzuki
  • Patent number: 9797827
    Abstract: A display is provided for an automatic analyzer to display statistics such as measurement results. A width of a display in a window that displays statistics may be adjusted and the amount of information to be displayed on the display is changed according to a level of detail of the information which the operator wants to confirm. Sample information, measurement results, and detailed information related to the measurement results are simultaneously displayed without a subwindow being displayed in overlapped form in the limited display area.
    Type: Grant
    Filed: September 10, 2015
    Date of Patent: October 24, 2017
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Toshihide Orihashi, Masaki Takano, Mariko Miyaki, Tatsuya Tokunaga
  • Publication number: 20170153261
    Abstract: An automatic analyzer has a transport device which includes a specimen rack gripping mechanism that grips the specimen rack on a first transport path on which the specimen racks are transported by the specimen rack being sandwiched between gripping plates from both sides of flanks in the transport direction to transport the specimen rack along the first transport path and a gripping width controller that controls a distance between the gripping plates of the specimen rack gripping mechanism in accordance with a width of the specimen rack. Accordingly, an automatic analyzer capable of transporting a plurality of types of the specimen racks while suppressing an increase in size of the apparatus and also an increase in cost can be provided.
    Type: Application
    Filed: May 22, 2015
    Publication date: June 1, 2017
    Inventors: Satoru CHIDA, Kazuhiro NAKAMURA, Yoshihiro SUZUKI, Toshihide ORIHASHI
  • Patent number: 9618526
    Abstract: An automated analyzer that can effectively reduce contamination of a diluted low-concentration specimen resulting from a high-concentration specimen not being diluted. The automated analyzer includes a specimen nozzle that performs both the function of pipetting a specimen from a specimen container accommodating the specimen and the function of pipetting a specimen diluted by the analyzer, and means for washing the specimen nozzle with a predetermined detergent. When a pipetting process of a high-concentration specimen not being diluted and a pipetting process of a low-concentration specimen diluted by the analyzer are consecutively performed for the same specimen by the specimen nozzle, between the pipetting process of a high-concentration specimen and the pipetting process of a low-concentration specimen, the analyzer performs a washing processing in which the specimen nozzle is washed with the predetermined detergent.
    Type: Grant
    Filed: July 8, 2013
    Date of Patent: April 11, 2017
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yoshiaki Saito, Yoichi Aruga, Toshihide Orihashi
  • Publication number: 20160341753
    Abstract: After an analysis start instruction is input in a state where a sample is not dispensed to all of reaction containers 104 mounted on a reaction disc 105, before completing an analysis preparation washing process for washing the reaction container 104 to be used in analyzing the sample to be first analyzed, a soaking and washing process for performing soaking and washing during a predetermined period of time is controlled to be started by dispensing a soaking and washing detergent to another reaction container 104 different from the reaction container 104. In this manner, the soaking and washing can be efficiently performed on the reaction container without hindering an analysis process.
    Type: Application
    Filed: January 16, 2015
    Publication date: November 24, 2016
    Inventors: Yoshiaki SAITO, Toshihide ORIHASHI, Kazuhiro NAKAMURA
  • Patent number: 9389238
    Abstract: An automatic analyzing device has an easy-to-use user interface. In particular, the automatic analyzing device for analyzing samples has a reaction disk to which samples are dispensed conveyed through a conveying path; a control unit that controls movement of the reaction disk; and a display unit that is controlled by the control unit and displays various screens. A sample list including sample IDs and states of analysis of the samples is displayed on a display screen of the display unit so that the sample IDs and the states of analysis can be selected, such that a menu displaying button for displaying processing menus for the sample selected in the sample list is displayed at the sample, and such that options of the menus for the sample are displayed as menu buttons when the menu displaying button is indicated.
    Type: Grant
    Filed: September 16, 2010
    Date of Patent: July 12, 2016
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Tatsuya Tokunaga, Masaki Takano, Toshihide Orihashi, Hiroki Mori
  • Patent number: 9341638
    Abstract: An automatic analyzer enables users to perform working steps easily and reliably by switching a display screen irrespective of a skill level of the user. The automatic analyzer, which determines a consistency of a test item, includes a display/input section to display a plurality of working steps relating to necessary work flow for measurement. The display/input section is adapted to selectively present a maximized workflow display and a reduced workflow display. The maximized workflow display shows a series of operations and works, and further shows a plurality of operations and works in an order that the plurality of operations and works are processed. In a reduced display of the work flow, the reduced workflow display shows details of a specific operation or work, and a position of the specific operation or work in a sequence that the entire series of operations and works are processed.
    Type: Grant
    Filed: May 22, 2012
    Date of Patent: May 17, 2016
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Sayaka Sarwar, Tatsuya Tokunaga, Miki Taki, Toshihide Orihashi, Hiroki Mori, Yoichi Aruga, Takashi Nakasawa
  • Patent number: 9316662
    Abstract: An automated analyzer includes a conveyance mechanism to convey a specimen, an analysis portion to analyze the specimen, and a device cover to cover a movable mechanism including the conveyance mechanism. The automated analyzer is provided with an interlock mechanism and an interlock release mechanism. The interlock mechanism stops an operation of the movable mechanism when the device cover is opened. The interlock release mechanism disables all or part of the interlock mechanism. The interlock mechanism is enabled when a lever 301 is in contact with a safety switch 302. The interlock mechanism is disabled or partially disabled when the lever 301 is not in contact with the safety switch 302. This enables to prevent a user from inadvertently touching the movable mechanism including a hazard region during analysis of the automated analyzer or a maintenance task. Only a specific maintenance task can be performed with the device cover opened.
    Type: Grant
    Filed: August 6, 2012
    Date of Patent: April 19, 2016
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Ryohei Ishigami, Toshihide Orihashi, Goro Yoshida, Kenichi Nishigaki, Hideyuki Yanami
  • Publication number: 20150377771
    Abstract: A display is provided for an automatic analyzer to display statistics such as measurement results. A width of a display in a window that displays statistics may be adjusted and the amount of information to be displayed on the display is changed according to a level of detail of the information which the operator wants to confirm. Sample information, measurement results, and detailed information related to the measurement results are simultaneously displayed without a subwindow being displayed in overlapped form in the limited display area.
    Type: Application
    Filed: September 10, 2015
    Publication date: December 31, 2015
    Inventors: Toshihide ORIHASHI, Masaki TAKANO, Mariko MIYAKI, Tatsuya TOKUNAGA
  • Patent number: 9164112
    Abstract: A display is provided for an automatic analyzer to display statistics such as measurement results. A width of a display in a window that displays statistics may be adjusted and the amount of information to be displayed on the display is changed according to a level of detail of the information which the operator wants to confirm. Sample information, measurement results, and detailed information related to the measurement results are simultaneously displayed without a subwindow being displayed in overlapped form in the limited display area.
    Type: Grant
    Filed: August 28, 2009
    Date of Patent: October 20, 2015
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Toshihide Orihashi, Masaki Takano, Mariko Miyaki, Tatsuya Tokunaga
  • Publication number: 20150204895
    Abstract: An automatic analyzer is capable of ensuring sufficient nozzle cleaning and suppressing of deterioration in the accuracy of analysis. When it is judged that there remains no analysis item of the sample, a judgment is made on whether the sample dispensation quantity of the n-th sample dispensation is less than a dispensation quantity threshold value or not, and if less, a cleaning pattern is selected by making a judgment on whether or not all the sample dispensation quantities of the first through (n?1)-th sample dispensations are less than the dispensation quantity threshold value. If the sample dispensation quantity of the n-th sample dispensation is the dispensation quantity threshold value or more, another cleaning pattern selected by making the judgment on whether or not all the sample dispensation quantities of the first through (n?1)-th sample dispensations are less than the dispensation quantity threshold value.
    Type: Application
    Filed: July 25, 2013
    Publication date: July 23, 2015
    Inventors: Akihiro Yasui, Hitoshi Tokieda, Toshihide Orihashi, Yoshiaki Saito, Naoto Suzuki
  • Publication number: 20150153370
    Abstract: The present invention provides an automated analyzer that can effectively reduce contamination of a diluted low-concentration specimen resulting from a high-concentration specimen not being diluted. The automated analyzer includes a specimen nozzle that performs both the function of pipetting a specimen from a specimen container accommodating the specimen and the function of pipetting a specimen diluted by the analyzer, and means for washing the specimen nozzle with a predetermined detergent. When a pipetting process of a high-concentration specimen not being diluted and a pipetting process of a low-concentration specimen diluted by the analyzer are consecutively performed for the same specimen by the specimen nozzle, between the pipetting process of a high-concentration specimen and the pipetting process of a low-concentration specimen, the analyzer performs a washing processing in which the specimen nozzle is washed with the predetermined detergent.
    Type: Application
    Filed: July 8, 2013
    Publication date: June 4, 2015
    Inventors: Yoshiaki Saito, Yoichi Aruga, Toshihide Orihashi