Patents by Inventor Toshihide Sasaki
Toshihide Sasaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11963760Abstract: A measuring device includes a total internal reflection prism having a total reflection plane that an object to be measured contacts, a light source to emit light to make the light having a wavelength equal to or greater than 7 micrometers (?m) and equal to or less than 12 ?m incident on the total reflection plane, and a sensor to detect light intensity of the light reflected by the total reflection plane. In the measuring device, an equation arc ? sin ? ( n ? 2 n ? 1 ) < ? ? c < arc ? sin ? ( n ? 2 n ? 1 ) + 5. [ DEG ] is satisfied, where n1 denotes a refractive index of a base material of the total internal reflection prism for the light having a wavelength of 10 ?m, n2 denotes a refractive index of the object to be measured for the light having the wavelength of 10 ?m and n2 takes a value 1.32 or 1.44, and ?c denotes an incident angle of a center of light flux emitted from the light source.Type: GrantFiled: March 13, 2023Date of Patent: April 23, 2024Assignee: RICOH COMPANY, LTD.Inventors: Yoshihiro Oba, Ryosuke Kasahara, Toshihide Sasaki, Nobuto Hosono
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Publication number: 20240125691Abstract: A biological information measuring technique with improved reliability is proposed. A method of measuring biological information using an optical element with a totally reflecting surface, which is to be brought into contact with an object to be observed, is provided. The method includes, after the optical element has been in contact with the object to be observed, acquiring an absorbance at the totally reflecting surface in a state where the optical element is not in contact with the object to be observed, and determining by an information processing apparatus whether the object to be observed needs to be cleaned, based on the absorbance.Type: ApplicationFiled: March 4, 2022Publication date: April 18, 2024Inventors: Yoshihiro OBA, Ryosuke KASAHARA, Toshihide SASAKI, Yoshio WADA
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Publication number: 20230293052Abstract: A measuring device includes a total internal reflection prism having a total reflection plane that an object to be measured contacts, a light source to emit light to make the light having a wavelength equal to or greater than 7 micrometers (?m) and equal to or less than 12 ?m incident on the total reflection plane, and a sensor to detect light intensity of the light reflected by the total reflection plane. In the measuring device, an equation arc ? sin ? ( n ? 2 n ? 1 ) < ? ? c < arc ? sin ? ( n ? 2 n ? 1 ) + 5. [ DEG ] is satisfied, where n1 denotes a refractive index of a base material of the total internal reflection prism for the light having a wavelength of 10 ?m, n2 denotes a refractive index of the object to be measured for the light having the wavelength of 10 ?m and n2 takes a value 1.32 or 1.44, and ?c denotes an incident angle of a center of light flux emitted from the light source.Type: ApplicationFiled: March 13, 2023Publication date: September 21, 2023Inventors: Yoshihiro OBA, Ryosuke KASAHARA, Toshihide SASAKI, Nobuto HOSONO
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Publication number: 20230288323Abstract: A measuring apparatus includes a light source configured to emit light in a mid-infrared region, the light including: first-wavelength light having a wave number of from 970 cm-1 or more to 1010 cm-1 or less; and second-wavelength light different from the first-wavelength light, the second-wavelength light having a wave number of from 950 cm-1 or more to 990 cm-1 or less; a photosensor configured to detect the light emitted from the light source and reflected by a measurement target; and an information processing device configured to: obtain a first absorbance of the first-wavelength light and a second absorbance of the second-wavelength light from an output of the photosensor; and determine a biomarker of the measurement target based on the first absorbance and the second absorbance.Type: ApplicationFiled: July 8, 2021Publication date: September 14, 2023Inventors: Ryosuke KASAHARA, Yoshio WADA, Yoshihiro OBA, Toshihide SASAKI
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Publication number: 20220386875Abstract: A measuring apparatus (100a, 1a) includes a light source (110) configured to emit probe light; a total reflection member (16) in contact with a to-be-measured object and configured to cause total reflection of the probe light that is incident; a light intensity detector (17) configured to detect light intensity of the probe light exiting from the total reflection member (16); an output unit (2) configured to output a measurement value obtained on the basis of the light intensity; a first support (31) supporting the light source (110) and the light intensity detector (17); and a second support (32) provided to the first support (31), detachable from the first support (31), and supporting the total reflection member (16).Type: ApplicationFiled: October 23, 2020Publication date: December 8, 2022Inventors: Yoshihiro OBA, Ryosuke KASAHARA, Yoshio WADA, Toshihide SASAKI
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Publication number: 20220369963Abstract: A biological information measuring device (100a) includes a light source configured to emit probe light; a total reflection member (16) configured to totally reflect the probe light with the total reflection member (16) brought into contact with a subject (S) to be measured; a light intensity detector configured to detect light intensity of the probe light reflected from the total reflection member (16); a biological information output unit (2a) configured to output biological information, the biological information being acquired based on the light intensity; and a display unit (506) configured to display the light intensity or an absorbance of the probe light, the absorbance being acquired based on the light intensity. Preferably a pressure detector is provided configured to detect a pressure of the subject (S) with respect to the total reflection member (16).Type: ApplicationFiled: October 26, 2020Publication date: November 24, 2022Inventors: Yoshihiro OBA, Ryosuke KASAHARA, Yoshio WADA, Toshihide SASAKI
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Publication number: 20210259586Abstract: A measurement apparatus includes a total reflection member configured to totally reflect an incoming probe beam in a state being in contact with a measured object; and a temperature adjuster configured to maintain, to a predetermined temperature, a temperature of a contact region of the total reflection member with the measured object.Type: ApplicationFiled: January 29, 2021Publication date: August 26, 2021Applicant: Ricoh Company, Ltd.Inventors: Yoshihiro OBA, Ryosuke KASAHARA, Yoshio WADA, Toshihide SASAKI
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Patent number: 10393676Abstract: A radiation image acquiring system is provided. An X-ray image acquiring system irradiates X-rays to a subject from an X-ray source, and detects X-rays transmitted through the subject. The X-ray image acquiring system includes a first detector for detecting X-rays that are transmitted through the subject to generate first image data, a second detector arranged in parallel to the first detector with a dead zone region sandwiched therebetween, for detecting X-rays that are transmitted through the subject to generate second image data, and a timing control section for controlling detection timing of the second detector based on a dead zone width of the dead zone region so that first image data to be generated by the first detector and second image data to be generated by the second detector mutually correspond.Type: GrantFiled: January 17, 2017Date of Patent: August 27, 2019Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
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Patent number: 10292590Abstract: A method of performing an optical examination on a test object and an optical examination device. The method includes obtaining a first detection light quantity distribution that is a detection light quantity distribution obtained for each of a plurality of optical models that simulate the test object, obtaining, using the optical sensor, a second detection light quantity distribution that is a distribution of an amount of light detected on the test object, and selecting based on the first light quantity distribution and the second detection light quantity distribution, an optical model suited to the test object from the plurality of optical models. The optical examination device includes an optical sensor, and a control system to control the irradiation system to obtain an amount of light detected by the detection system.Type: GrantFiled: June 13, 2016Date of Patent: May 21, 2019Assignee: RICOH COMPANY, LTD.Inventors: Toshihiro Ishii, Yoichiro Takahashi, Toshihide Sasaki, Masayuki Fujiwara
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Patent number: 10177530Abstract: An optical sensor, an optical examination device, and a method of detecting optical properties. The optical sensor includes an irradiation system including light irradiator to irradiate a test object with light, and a detection system to detect the light that is emitted from the irradiation system to the test object and has propagated through the test object. The light irradiator includes a multilayered structure having an active layer, and the multilayered structure includes a surface-emitting laser element and a photo-sensing element optically connected to the surface-emitting laser element. The optical examination device includes the optical sensor, and a controller to calculate optical properties of the test object based on a detection result of the optical sensor. The method includes performing optical simulation to obtain a detection light quantity distribution for an optical model and performing inverse problem estimation.Type: GrantFiled: December 15, 2016Date of Patent: January 8, 2019Assignee: RICOH COMPANY, LTD.Inventors: Toshihiro Ishii, Yoichiro Takahashi, Sunao Chubachi, Masayuki Fujiwara, Toshihide Sasaki, Kazuhiko Adachi
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Patent number: 10067056Abstract: An optical sensor including an irradiation system including at least one light irradiator, the at least one irradiator including a surface emitting laser array having a plurality of light-emitting units, and a lens disposed in an optical path of the plurality of rays of light emitted from the plurality of light-emitting units to cause light exit directions of at least two of the plurality of light-emitting units to be not parallel to each other, such that the at least one irradiator irradiates a same point of a test object with a plurality of rays of light that are not parallel to each other. The optical sensor also including a detection system configured to detect the plurality of rays of light that are emitted from the irradiation system and propagated inside the test object.Type: GrantFiled: December 29, 2015Date of Patent: September 4, 2018Assignee: Ricoh Company, Ltd.Inventors: Masayuki Fujiwara, Toshihiro Ishii, Yoichiro Takahashi, Toshihide Sasaki
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Publication number: 20170184514Abstract: A radiation image acquiring system is provided. An X-ray image acquiring system irradiates X-rays to a subject from an X-ray source, and detects X-rays transmitted through the subject. The X-ray image acquiring system includes a first detector for detecting X-rays that are transmitted through the subject to generate first image data, a second detector arranged in parallel to the first detector with a dead zone region sandwiched therebetween, for detecting X-rays that are transmitted through the subject to generate second image data, and a timing control section for controlling detection timing of the second detector based on a dead zone width of the dead zone region so that first image data to be generated by the first detector and second image data to be generated by the second detector mutually correspond.Type: ApplicationFiled: January 17, 2017Publication date: June 29, 2017Inventors: Toshiyasu SUYAMA, Tadashi MARUNO, Toshihide SASAKI, Junichi SONODA, Shinji TAKIHI
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Publication number: 20170179682Abstract: An optical sensor, an optical examination device, and a method of detecting optical properties. The optical sensor includes an irradiation system including light irradiator to irradiate a test object with light, and a detection system to detect the light that is emitted from the irradiation system to the test object and has propagated through the test object. The light irradiator includes a multilayered structure having an active layer, and the multilayered structure includes a surface-emitting laser element and a photo-sensing element optically connected to the surface-emitting laser element. The optical examination device includes the optical sensor, and a controller to calculate optical properties of the test object based on a detection result of the optical sensor. The method includes performing optical simulation to obtain a detection light quantity distribution for an optical model and performing inverse problem estimation.Type: ApplicationFiled: December 15, 2016Publication date: June 22, 2017Applicant: RICOH COMPANY, LTD.Inventors: Toshihiro ISHII, Yoichiro TAKAHASHI, Sunao CHUBACHI, Masayuki FUJIWARA, Toshihide SASAKI, Kazuhiko ADACHI
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Patent number: 9594031Abstract: A radiation image acquiring system is provided. An X-ray image acquiring system irradiates X-rays to a subject from an X-ray source, and detects X-rays transmitted through the subject. The X-ray image acquiring system includes a first detector for detecting X-rays that are transmitted through the subject to generate first image data, a second detector arranged in parallel to the first detector with a dead zone region sandwiched therebetween, for detecting X-rays that are transmitted through the subject to generate second image data, and a timing control section for controlling detection timing of the second detector based on a dead zone width of the dead zone region so that first image data to be generated by the first detector and second image data to be generated by the second detector mutually correspond.Type: GrantFiled: January 23, 2015Date of Patent: March 14, 2017Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
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Publication number: 20160360966Abstract: A method of performing an optical examination on a test object and an optical examination device. The method includes obtaining a first detection light quantity distribution that is a detection light quantity distribution obtained for each of a plurality of optical models that simulate the test object, obtaining, using the optical sensor, a second detection light quantity distribution that is a distribution of an amount of light detected on the test object, and selecting based on the first light quantity distribution and the second detection light quantity distribution, an optical model suited to the test object from the plurality of optical models. The optical examination device includes an optical sensor, and a control system to control the irradiation system to obtain an amount of light detected by the detection system.Type: ApplicationFiled: June 13, 2016Publication date: December 15, 2016Applicant: Ricoh Company, Ltd.Inventors: Toshihiro ISHII, Yoichiro TAKAHASHI, Toshihide SASAKI, Masayuki FUJIWARA
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Publication number: 20160195473Abstract: An optical sensor including an irradiation system including at least one light irradiator, the at least one irradiator including a surface emitting laser array having a plurality of light-emitting units, and a lens disposed in an optical path of the plurality of rays of light emitted from the plurality of light-emitting units to cause light exit directions of at least two of the plurality of light-emitting units to be not parallel to each other, such that the at least one irradiator irradiates a same point of a test object with a plurality of rays of light that are not parallel to each other. The optical sensor also including a detection system configured to detect the plurality of rays of light that are emitted from the irradiation system and propagated inside the test object.Type: ApplicationFiled: December 29, 2015Publication date: July 7, 2016Inventors: Masayuki FUJIWARA, Toshihiro ISHII, Yoichiro TAKAHASHI, Toshihide SASAKI
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Publication number: 20150139387Abstract: A radiation image acquiring system is provided. An X-ray image acquiring system irradiates X-rays to a subject from an X-ray source, and detects X-rays transmitted through the subject. The X-ray image acquiring system includes a first detector for detecting X-rays that are transmitted through the subject to generate first image data, a second detector arranged in parallel to the first detector with a dead zone region sandwiched therebetween, for detecting X-rays that are transmitted through the subject to generate second image data, and a timing control section for controlling detection timing of the second detector based on a dead zone width of the dead zone region so that first image data to be generated by the first detector and second image data to be generated by the second detector mutually correspond.Type: ApplicationFiled: January 23, 2015Publication date: May 21, 2015Inventors: Toshiyasu SUYAMA, Tadashi MARUNO, Toshihide SASAKI, Junichi SONODA, Shinji TAKIHI
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Patent number: 8964939Abstract: A radiation image acquiring system is provided. An X-ray image acquiring system irradiates X-rays to a subject from an X-ray source, and detects X-rays transmitted through the subject. The X-ray image acquiring system includes a first detector for detecting X-rays that are transmitted through the subject to generate first image data, a second detector arranged in parallel to the first detector with a dead zone region sandwiched therebetween, for detecting X-rays that are transmitted through the subject to generate second image data, and a timing control section for controlling detection timing of the second detector based on a dead zone width of the dead zone region so that first image data to be generated by the first detector and second image data to be generated by the second detector mutually correspond.Type: GrantFiled: June 27, 2012Date of Patent: February 24, 2015Assignee: Hamamatsu Photonics K.K.Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
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Patent number: 8869774Abstract: An engine includes: a carburetor configured to supply an air-fuel mixture of fuel and air; a crank case defining a crank chamber; a cylinder block which includes: a cylinder bore in which a reciprocable piston is disposed; and an intake port which supplies the air-fuel mixture supplied from the carburetor to the crank chamber; a control valve configured to open and close the intake port; and a controller configured to control the control valve. The controller controls the number of times that the control valve closes the intake port with respect to the number of times that the piston moves up to thereby reduce pressure of the crank chamber.Type: GrantFiled: June 7, 2011Date of Patent: October 28, 2014Assignee: Hitachi Koki Co., Ltd.Inventors: Toshihide Sasaki, Shigetoshi Ishida, Hiroki Nagase
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Patent number: 8649409Abstract: A surface-emitting laser device includes a lower reflector, a resonator structure having an active layer and an upper reflector on an inclined substrate, and an emission region emitting laser light enclosed by an electrode. The upper reflector includes a confinement structure having a current passing region enclosed by an oxide containing at least an oxide generated as a result of partial oxidation of a layer containing aluminum subject to selective oxidation, and a dielectric film formed within the emission region, the dielectric film at least enclosing a partial region including a center of the emission region. In viewing from a direction orthogonal to the emission region, a center of a region enclosed by the dielectric film is located at a position distant from the center of the emission region based on a size of the confinement structure relative to a direction orthogonal to an inclined axis of the inclined substrate.Type: GrantFiled: July 31, 2012Date of Patent: February 11, 2014Assignee: Ricoh Company, Ltd.Inventors: Toshihide Sasaki, Kazuhiro Harasaka