Patents by Inventor Toshihiko Kiwa

Toshihiko Kiwa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8710440
    Abstract: Provided are a measuring device and a measuring method that use terahertz light, by which a substance to be detected can be detected with high sensitivity and high accuracy. A measuring device using a pulsed electromagnetic wave is provided with a substance detection plate, a means for generating the pulsed electromagnetic wave having amplitude intensity dependent on the amount of a substance to be detected at an irradiation position by irradiating the substance detection plate with a pulsed laser beam, and a detection means for detecting the amplitude intensity of the pulsed electromagnetic wave, and measures the change of the state of a solution containing the substance to be detected on the basis of the amplitude intensity.
    Type: Grant
    Filed: February 7, 2011
    Date of Patent: April 29, 2014
    Assignee: National University Corporation Okayama University
    Inventors: Toshihiko Kiwa, Keiji Tsukada
  • Publication number: 20120305774
    Abstract: Provided are a measuring device and a measuring method that use terahertz light, by which a substance to be detected can be detected with high sensitivity and high accuracy. A measuring device using a pulsed electromagnetic wave is provided with a substance detection plate, a means for generating the pulsed electromagnetic wave having amplitude intensity dependent on the amount of a substance to be detected at an irradiation position by irradiating the substance detection plate with a pulsed laser beam, and a detection means for detecting the amplitude intensity of the pulsed electromagnetic wave, and measures the change of the state of a solution containing the substance to be detected on the basis of the amplitude intensity.
    Type: Application
    Filed: February 7, 2011
    Publication date: December 6, 2012
    Applicant: National University Corporation Okayama University
    Inventors: Toshihiko Kiwa, Keiji Tsukada
  • Patent number: 8300223
    Abstract: A material distribution measuring device (1) for measuring a reaction distribution or a concentration distribution of a material contained in a solution.
    Type: Grant
    Filed: October 10, 2008
    Date of Patent: October 30, 2012
    Assignee: National Univeristy Corporation Okayama Univeristy
    Inventors: Toshihiko Kiwa, Keiji Tsukada
  • Publication number: 20100220327
    Abstract: A material distribution measuring device (1) for measuring a reaction distribution or a concentration distribution of a material contained in a solution.
    Type: Application
    Filed: October 10, 2008
    Publication date: September 2, 2010
    Inventors: Toshihiko Kiwa, Keiji Tsukada
  • Patent number: 7759931
    Abstract: The present invention relates to a magnetic impedance measurement device comprising an apply coil for generating an alternate magnetic field of variable frequency, a power source for the apply coil, at least one magnetic sensor means comprising a pair of magnetic sensors for detecting orthogonal vector components of a magnetic field generated from a test object, the vector components being parallel to the face of the apply coil, a measurement means for the magnetic sensor for measuring a detected signal from said magnetic sensor mean, the measurement means being located at a distance from the face of the apply coil and facing the test object, a lock-in amplifier circuit for detecting from an output of the measurement means a signal having the same frequency as the frequency of the apply coil and an analysis means for analyzing intensity and phase changes of an output of the magnetic sensor means with the use of an output signal of the lock-in amplifier circuit.
    Type: Grant
    Filed: March 13, 2006
    Date of Patent: July 20, 2010
    Assignee: National University Corporation, Okayama University
    Inventors: Keiji Tsukada, Toshihiko Kiwa
  • Patent number: 7525308
    Abstract: The present invention discloses a magnetic detecting device comprising an apply coil 1 for generating an alternate magnetic field of variable frequency and a power source 2 for the apply coil; a magnetic sensor 5 for detecting a change in the magnetic field induced by a test object 9 placed at a distance from a surface of said apply coil and toward said test object, said magnetic sensor being provided with a cancel coil 6 for canceling a magnetic field generated at the position of the magnetic sensor by a direct magnetic field and/or said apply coil; a measurement circuit 7 for the magnetic sensor for measuring a detection signal of said magnetic sensor; a lock-in amplifier circuit 8 for detecting an output of said measurement circuit for the magnetic sensor into two signals having the same frequency as that of said apply coil and phases different from each other by 90 degrees; and an analysis means 10 for analyzing a phase change of the output of said magnetic sensor 5 using an output signal from said lock-i
    Type: Grant
    Filed: July 7, 2005
    Date of Patent: April 28, 2009
    Assignee: Okayama University
    Inventors: Keiji Tsukada, Toshihiko Kiwa
  • Publication number: 20080211492
    Abstract: The distribution of the impedance characteristic of a test object is detected by applying an alternate magnetic field of a low frequency to the test object and measuring the induced current generated therefrom.
    Type: Application
    Filed: March 13, 2006
    Publication date: September 4, 2008
    Applicant: NATIONAL UNIVERSITY CORPORATION OKAYAMA UNIVERSITY
    Inventors: Keiji Tsukada, Toshihiko Kiwa
  • Publication number: 20080074109
    Abstract: The present invention discloses a magnetic detecting device comprising an apply coil 1 for generating an alternate magnetic field of variable frequency and a power source 2 for the apply coil; a magnetic sensor 5 for detecting a change in the magnetic field induced by a test object 9 placed at a distance from a surface of said apply coil and toward said test object, said magnetic sensor being provided with a cancel coil 6 for canceling a magnetic field generated at the position of the magnetic sensor by a direct magnetic field and/or said apply coil; a measurement circuit 7 for the magnetic sensor for measuring a detection signal of said magnetic sensor; a lock-in amplifier circuit 8 for detecting an output of said measurement circuit for the magnetic sensor into two signals having the same frequency as that of said apply coil and phases different from each other by 90 degrees; and an analysis means 10 for analyzing a phase change of the output of said magnetic sensor 5 using an output signal from said lock-i
    Type: Application
    Filed: July 7, 2005
    Publication date: March 27, 2008
    Inventors: Keiji Tsukada, Toshihiko Kiwa