Patents by Inventor Toshihiko NISHIZAKI

Toshihiko NISHIZAKI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9863897
    Abstract: There is provided an X-ray nondestructive testing device which irradiates X-rays to an article, the article including a substrate having a predetermined X-ray absorption coefficient and a measurement target object disposed therein and having another X-ray absorption coefficient differing from that of the substrate, the device including: an X-ray source configured to irradiate the X-rays to the article; a detector configured to detect the transmission amounts of the X-rays passed through the article at at least paired different locations; a detection position specifying designator configured to specify the paired different locations as a set of paired locations based on a pre-stored design information; a driving mechanism configured to move the detector to the set of paired locations; and an operation calculator configured to calculate the thickness of the measurement target object based on the transmission amounts of the X-rays detected by the detector.
    Type: Grant
    Filed: September 3, 2015
    Date of Patent: January 9, 2018
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Naozo Sugimoto, Toshihiko Nishizaki, Masahiro Inoue, Masuo Amma, Masaru Nakamura
  • Publication number: 20150377801
    Abstract: There is provided an X-ray nondestructive testing device which irradiates X-rays to an article, the article including a substrate having a predetermined X-ray absorption coefficient and a measurement target object disposed therein and having another X-ray absorption coefficient differing from that of the substrate, the device including: an X-ray source configured to irradiate the X-rays to the article; a detector configured to detect the transmission amounts of the X-rays passed through the article at at least paired different locations; a detection position specifying designator configured to specify the paired different locations as a set of paired locations based on a pre-stored design information; a driving mechanism configured to move the detector to the set of paired locations; and an operation calculator configured to calculate the thickness of the measurement target object based on the transmission amounts of the X-rays detected by the detector.
    Type: Application
    Filed: September 3, 2015
    Publication date: December 31, 2015
    Inventors: Naozo SUGIMOTO, Toshihiko NISHIZAKI, Masahiro INOUE, Masuo YASUMA, Yu NAKAMURA