Patents by Inventor Toshihiro Ishii

Toshihiro Ishii has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230050179
    Abstract: A biological-measurement device includes a light-emitting unit configured to emit light on a body of a test-subject, a light-detecting unit configured to detect light reflected in the body of the test-subject, a control-unit configured to calculate information regarding a pulse-wave of the body of the test-subject based on the light detected by the light-detecting unit, a circuit-board that is flexible and has a first-surface on which the light-emitting unit and the light-detecting unit are provided, the circuit-board further having wiring connecting the light-emitting unit and the control-unit together and connecting the light-detecting unit and the control-unit together, a shielding-unit that is provided on the first-surface, the shielding-unit being situated between the light-emitting unit and the light-detecting unit and configured to protrude beyond the light-emitting unit and the light-detecting unit in a direction perpendicular to the first-surface, and an adhesive-part for firmly contacting with the b
    Type: Application
    Filed: July 29, 2022
    Publication date: February 16, 2023
    Applicant: Ricoh Company, Ltd.
    Inventors: Toshihiro ISHII, Ikuo KATOH, Mitsuru SUZUKI
  • Publication number: 20220304606
    Abstract: A magnetic measurement apparatus includes a concentrating structure and a magnetic sensor. The concentrating structure includes a band portion and a plurality of protruding portions. The band portion is configured to concentrate a magnetic flux from a subject. The plurality of protruding portions are configured to transmit the concentrated magnetic flux to a magnetic sensor. The magnetic sensor is magnetically connected between two opposing protruding portions.
    Type: Application
    Filed: March 11, 2022
    Publication date: September 29, 2022
    Inventors: Toshihiro ISHII, Hirofumi MORISE
  • Patent number: 11215945
    Abstract: An optical sensor includes a light source; and an optical detector detecting intensity of light that is reflected by a recording medium, the light from the light source and irradiated onto the recording medium. Further, when an incident angle of the light incident to the recording medium from the light source relative to a normal line of the recording medium is given as ?1, a formula 75°??1?85° is satisfied.
    Type: Grant
    Filed: February 12, 2020
    Date of Patent: January 4, 2022
    Assignee: RICOH COMPANY, LTD.
    Inventors: Toshihiro Ishii, Yoshihiro Oba, Fumikazu Hoshi, Satoru Sugawara
  • Patent number: 10768095
    Abstract: An optical sensor includes a light emitter configured to irradiate a surface of an object with a plurality of non-parallel light beams, a light detector configured to detect a plurality of light beams that have been reflected within the object and have returned to the surface from a plurality of directions, a recording unit configured to store pre-calculated results of a plurality of models having different optical properties and physical structures, and a calculating unit configured to calculate a light amount ratio of the plurality of reflected light beams, and estimate an optical property of the object based on the calculated light amount ratio and the pre-calculated results.
    Type: Grant
    Filed: July 9, 2019
    Date of Patent: September 8, 2020
    Assignees: Ricoh Company, Ltd, ADVANCED TELECOMMUNICATIONS RESEARCH INSTITUTE INTERNATIONAL
    Inventors: Yoichiro Takahashi, Takeaki Shimokawa, Toshihiro Ishii
  • Publication number: 20200183314
    Abstract: An optical sensor includes a light source; and an optical detector detecting intensity of light that is reflected by a recording medium, the light from the light source and irradiated onto the recording medium. Further, when an incident angle of the light incident to the recording medium from the light source relative to a normal line of the recording medium is given as ?1, a formula 75°??1?85° is satisfied.
    Type: Application
    Filed: February 12, 2020
    Publication date: June 11, 2020
    Applicant: RICOH COMPANY, LTD.
    Inventors: Toshihiro Ishii, Yoshihiro Oba, Fumikazu Hoshi, Satoru Sugawara
  • Patent number: 10606204
    Abstract: An optical sensor includes a light source; and an optical detector detecting intensity of light that is reflected by a recording medium, the light from the light source and irradiated onto the recording medium. Further, when an incident angle of the light incident to the recording medium from the light source relative to a normal line of the recording medium is given as ?1, a formula 75°??1?85° is satisfied.
    Type: Grant
    Filed: May 19, 2017
    Date of Patent: March 31, 2020
    Assignee: RICOH COMPANY, LTD.
    Inventors: Toshihiro Ishii, Yoshihiro Oba, Fumikazu Hoshi, Satoru Sugawara
  • Publication number: 20200064253
    Abstract: An optical sensor includes a light emitter configured to irradiate a surface of an object with a plurality of non-parallel light beams, a light detector configured to detect a plurality of light beams that have been reflected within the object and have returned to the surface from a plurality of directions, a recording unit configured to store pre-calculated results of a plurality of models having different optical properties and physical structures, and a calculating unit configured to calculate a light amount ratio of the plurality of reflected light beams, and estimate an optical property of the object based on the calculated light amount ratio and the pre-calculated results.
    Type: Application
    Filed: July 9, 2019
    Publication date: February 27, 2020
    Applicants: Ricoh Company, Ltd., ADVANCED TELECOMMUNICATIONS RESEARCH INSTITUTE INTERNATIONAL
    Inventors: Yoichiro TAKAHASHI, Takeaki SHIMOKAWA, Toshihiro ISHII
  • Patent number: 10292590
    Abstract: A method of performing an optical examination on a test object and an optical examination device. The method includes obtaining a first detection light quantity distribution that is a detection light quantity distribution obtained for each of a plurality of optical models that simulate the test object, obtaining, using the optical sensor, a second detection light quantity distribution that is a distribution of an amount of light detected on the test object, and selecting based on the first light quantity distribution and the second detection light quantity distribution, an optical model suited to the test object from the plurality of optical models. The optical examination device includes an optical sensor, and a control system to control the irradiation system to obtain an amount of light detected by the detection system.
    Type: Grant
    Filed: June 13, 2016
    Date of Patent: May 21, 2019
    Assignee: RICOH COMPANY, LTD.
    Inventors: Toshihiro Ishii, Yoichiro Takahashi, Toshihide Sasaki, Masayuki Fujiwara
  • Patent number: 10175169
    Abstract: An optical sensor is provided. The optical sensor has an emitting system including at least one light emitting device which emits light onto an object; and a detecting system detecting the light which has been emitted by the emitting system and which has propagated through the object. The light emitting device is capable of emitting a plurality of light beams with different wavelengths onto substantially the same position of the object.
    Type: Grant
    Filed: October 29, 2015
    Date of Patent: January 8, 2019
    Assignee: RICOH COMPANY, LTD.
    Inventors: Toshihiro Ishii, Yoichiro Takahashi
  • Patent number: 10177530
    Abstract: An optical sensor, an optical examination device, and a method of detecting optical properties. The optical sensor includes an irradiation system including light irradiator to irradiate a test object with light, and a detection system to detect the light that is emitted from the irradiation system to the test object and has propagated through the test object. The light irradiator includes a multilayered structure having an active layer, and the multilayered structure includes a surface-emitting laser element and a photo-sensing element optically connected to the surface-emitting laser element. The optical examination device includes the optical sensor, and a controller to calculate optical properties of the test object based on a detection result of the optical sensor. The method includes performing optical simulation to obtain a detection light quantity distribution for an optical model and performing inverse problem estimation.
    Type: Grant
    Filed: December 15, 2016
    Date of Patent: January 8, 2019
    Assignee: RICOH COMPANY, LTD.
    Inventors: Toshihiro Ishii, Yoichiro Takahashi, Sunao Chubachi, Masayuki Fujiwara, Toshihide Sasaki, Kazuhiko Adachi
  • Patent number: 10067056
    Abstract: An optical sensor including an irradiation system including at least one light irradiator, the at least one irradiator including a surface emitting laser array having a plurality of light-emitting units, and a lens disposed in an optical path of the plurality of rays of light emitted from the plurality of light-emitting units to cause light exit directions of at least two of the plurality of light-emitting units to be not parallel to each other, such that the at least one irradiator irradiates a same point of a test object with a plurality of rays of light that are not parallel to each other. The optical sensor also including a detection system configured to detect the plurality of rays of light that are emitted from the irradiation system and propagated inside the test object.
    Type: Grant
    Filed: December 29, 2015
    Date of Patent: September 4, 2018
    Assignee: Ricoh Company, Ltd.
    Inventors: Masayuki Fujiwara, Toshihiro Ishii, Yoichiro Takahashi, Toshihide Sasaki
  • Patent number: 10039452
    Abstract: An optical sensor includes an irradiation system including at least one light irradiator to irradiate light onto an object under test; and a detection system detecting the light that is irradiated from the irradiation system and is propagated in the object under test. Further, the light irradiator irradiates non-parallel plural light beams on a same position of the object under test.
    Type: Grant
    Filed: September 26, 2014
    Date of Patent: August 7, 2018
    Assignee: RICOH COMPANY, LTD.
    Inventors: Toshihiro Ishii, Yoichiro Takahashi, Satoru Sugawara, Takeaki Shimokawa, Okito Yamashita, Masaaki Sato
  • Publication number: 20180011015
    Abstract: An optical sensor is provided. The optical sensor has an emitting system including at least one light emitting device which emits light onto an object; and a detecting system detecting the light which has been emitted by the emitting system and which has propagated through the object. The light emitting device is capable of emitting a plurality of light beams with different wavelengths onto substantially the same position of the object.
    Type: Application
    Filed: October 29, 2015
    Publication date: January 11, 2018
    Applicant: RICOH COMPANY, LTD.
    Inventors: Toshihiro ISHII, Yoichiro TAKAHASHI
  • Patent number: 9831633
    Abstract: A disclosed surface-emitting laser module includes a surface-emitting laser formed on a substrate to emit light perpendicular to its surface, a package including a recess portion in which the substrate having the surface-emitting laser is arranged, and a transparent substrate arranged to cover the recess portion of the package and the substrate having the surface-emitting laser such that the transparent substrate and the package are connected on a light emitting side of the surface-emitting laser. In the surface-emitting laser module, a high reflectance region and a low reflectance region are formed within a region enclosed by an electrode on an upper part of a mesa of the surface-emitting laser, and the transparent substrate is slanted to the surface of the substrate having the surface-emitting laser in a polarization direction of the light emitted from the surface-emitting laser determined by the high reflectance region and the low reflectance region.
    Type: Grant
    Filed: January 20, 2016
    Date of Patent: November 28, 2017
    Assignee: RICOH COMPANY, LTD.
    Inventors: Toshihiro Ishii, Satoru Sugawara, Yoshihiro Ohba, Kazuhiro Harasaka, Shunichi Sato, Kazuhiko Adachi
  • Publication number: 20170261903
    Abstract: An optical sensor includes a light source; and an optical detector detecting intensity of light that is reflected by a recording medium, the light from the light source and irradiated onto the recording medium. Further, when an incident angle of the light incident to the recording medium from the light source relative to a normal line of the recording medium is given as ?1, a formula 75°??1?85° is satisfied.
    Type: Application
    Filed: May 19, 2017
    Publication date: September 14, 2017
    Applicant: RICOH COMPANY, LTD.
    Inventors: Toshihiro ISHII, Yoshihiro OBA, Fumikazu HOSHI, Satoru SUGAWARA
  • Patent number: 9696674
    Abstract: An optical sensor includes a light source; and an optical detector detecting intensity of light that is reflected by a recording medium, the light from the light source and irradiated onto the recording medium. Further, when an incident angle of the light incident the recording medium from the light source relative to a normal line of the recording medium is given as ?1, a formula 75°??1?85° is satisfied.
    Type: Grant
    Filed: May 28, 2013
    Date of Patent: July 4, 2017
    Assignee: RICOH COMPANY, LTD.
    Inventors: Toshihiro Ishii, Yoshihiro Oba, Fumikazu Hoshi, Satoru Sugawara
  • Publication number: 20170179682
    Abstract: An optical sensor, an optical examination device, and a method of detecting optical properties. The optical sensor includes an irradiation system including light irradiator to irradiate a test object with light, and a detection system to detect the light that is emitted from the irradiation system to the test object and has propagated through the test object. The light irradiator includes a multilayered structure having an active layer, and the multilayered structure includes a surface-emitting laser element and a photo-sensing element optically connected to the surface-emitting laser element. The optical examination device includes the optical sensor, and a controller to calculate optical properties of the test object based on a detection result of the optical sensor. The method includes performing optical simulation to obtain a detection light quantity distribution for an optical model and performing inverse problem estimation.
    Type: Application
    Filed: December 15, 2016
    Publication date: June 22, 2017
    Applicant: RICOH COMPANY, LTD.
    Inventors: Toshihiro ISHII, Yoichiro TAKAHASHI, Sunao CHUBACHI, Masayuki FUJIWARA, Toshihide SASAKI, Kazuhiko ADACHI
  • Patent number: 9678006
    Abstract: In an optical sensor, a light emission system emits an irradiated light of a linear polarization in a first polarization direction toward a surface of a target object having a sheet shape from an incident direction which is inclined with respect to a normal direction of the surface. A first light detection system includes a first light detector arranged on a first light path of a specular reflected light, which is emitted from the light emission system and is specularly reflected from the target object. A second light detection system includes a second light detector arranged on a second light path of a diffuse reflected light which is diffusely reflected from an incident plane on the target object. The second light detector receives second light passed by an optical element which passes a linear polarization component of a second polarization direction perpendicular to the first polarization direction.
    Type: Grant
    Filed: September 9, 2016
    Date of Patent: June 13, 2017
    Assignee: RICOH COMPANY, LTD.
    Inventors: Yoshihiro Ohba, Satoru Sugawara, Toshihiro Ishii, Fumikazu Hoshi
  • Publication number: 20160360966
    Abstract: A method of performing an optical examination on a test object and an optical examination device. The method includes obtaining a first detection light quantity distribution that is a detection light quantity distribution obtained for each of a plurality of optical models that simulate the test object, obtaining, using the optical sensor, a second detection light quantity distribution that is a distribution of an amount of light detected on the test object, and selecting based on the first light quantity distribution and the second detection light quantity distribution, an optical model suited to the test object from the plurality of optical models. The optical examination device includes an optical sensor, and a control system to control the irradiation system to obtain an amount of light detected by the detection system.
    Type: Application
    Filed: June 13, 2016
    Publication date: December 15, 2016
    Applicant: Ricoh Company, Ltd.
    Inventors: Toshihiro ISHII, Yoichiro TAKAHASHI, Toshihide SASAKI, Masayuki FUJIWARA
  • Patent number: 9513216
    Abstract: In an optical sensor, a light emission system emits an irradiated light of a linear polarization in a first polarization direction toward a surface of a target object having a sheet shape from an incident direction which is inclined with respect to a normal direction of the surface. A first light detection system includes a first light detector arranged on a first light path of a specular reflected light, which is emitted from the light emission system and is specularly reflected from the target object. A second light detection system includes a second light detector arranged on a second light path of a diffuse reflected light which is diffusely reflected from an incident plane on the target object. The second light detector receives second light passed by an optical element which passes a linear polarization component of a second polarization direction perpendicular to the first polarization direction.
    Type: Grant
    Filed: December 21, 2015
    Date of Patent: December 6, 2016
    Assignee: RICOH COMPANY, LTD.
    Inventors: Yoshihiro Ohba, Satoru Sugawara, Toshihiro Ishii, Fumikazu Hoshi