Patents by Inventor Toshihiro Yamaoka

Toshihiro Yamaoka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230266276
    Abstract: An ultrasonic tester includes an ultrasonic sensor that applies ultrasound to a test object; a casing that holds the ultrasonic sensor immersed in a contact medium that allows the ultrasound to propagate therethrough, the casing including a test object-facing opening Further, there is circuitry configured to, when the test object-facing opening of the casing is passing an opening of the test object in a test direction of the test object, control a moving speed of the casing such that a region of contact between the test object and the contact medium entering the opening of the test object is kept within the opening of the test object.
    Type: Application
    Filed: April 3, 2023
    Publication date: August 24, 2023
    Applicant: KAWASAKI JUKOGYO KABUSHIKI KAISHA
    Inventors: Ryosuke ARIKI, Katsumi NAGATA, Kenji TSUBAKI, Toshihiro YAMAOKA
  • Patent number: 10161918
    Abstract: An ultrasonic device includes: a first and second flaw detection head; a moving mechanism that causes the first flaw detection head and the second flaw detection head to perform scanning; a calibration area in which a calibration standard sample is disposed; a flaw detection area in which an inspection object is disposed; and a controller that performs a first calibration process or a second calibration process, the first calibration process being a process of causing the first flaw detection head to scan the calibration standard sample to perform calibration using the calibration standard sample, the second calibration process being a process of causing the second flaw detection head to scan the calibration standard sample to perform calibration using the calibration standard sample when performing a first flaw detection process of performing ultrasonic flaw detection inspection of the inspection object by the first flaw detection head.
    Type: Grant
    Filed: August 27, 2014
    Date of Patent: December 25, 2018
    Assignee: KAWASAKI JUKOGYO KABUSHIKI KAISHA
    Inventor: Toshihiro Yamaoka
  • Patent number: 10101302
    Abstract: An ultrasonic flaw detector includes: a flaw detection head including a probe that transmits an ultrasonic wave to an inspection object formed by a composite member and receives the ultrasonic wave that has reflected on the inspection object; a moving mechanism, which causes the flaw detection head to perform scanning; and a support mechanism disposed such that the support mechanism comes into contact with a lower surface of the inspection object, the support mechanism supporting the inspection object. The support mechanism is configured to come into contact with the inspection object over a predetermined area such that a waveform of the ultrasonic wave that has reflected on a position where the support mechanism is in contact with the inspection object and that is received by the probe is within a noise level.
    Type: Grant
    Filed: August 27, 2014
    Date of Patent: October 16, 2018
    Assignee: KAWASAKI JUKOGYO KABUSHIKI KAISHA
    Inventor: Toshihiro Yamaoka
  • Publication number: 20160209375
    Abstract: An ultrasonic device includes: a first and second flaw detection head; a moving mechanism that causes the first flaw detection head and the second flaw detection head to perform scanning; a calibration area in which a calibration standard sample is disposed; a flaw detection area in which an inspection object is disposed; and a controller that performs a first calibration process or a second calibration process, the first calibration process being a process of causing the first flaw detection head to scan the calibration standard sample to perform calibration using the calibration standard sample, the second calibration process being a process of causing the second flaw detection head to scan the calibration standard sample to perform calibration using the calibration standard sample when performing a first flaw detection process of performing ultrasonic flaw detection inspection of the inspection object by the first flaw detection head.
    Type: Application
    Filed: August 27, 2014
    Publication date: July 21, 2016
    Applicant: KAWASAKI JUKOGYO KABUSHIKI KAISHA
    Inventor: Toshihiro YAMAOKA
  • Publication number: 20160209373
    Abstract: An ultrasonic flaw detector includes: a flaw detection head including a probe that transmits an ultrasonic wave to an inspection object formed by a composite member and receives the ultrasonic wave that has reflected on the inspection object; a moving mechanism, which causes the flaw detection head to perform scanning; and a support mechanism disposed such that the support mechanism comes into contact with a lower surface of the inspection object, the support mechanism supporting the inspection object. The support mechanism is configured to come into contact with the inspection object over a predetermined area such that a waveform of the ultrasonic wave that has reflected on a position where the support mechanism is in contact with the inspection object and that is received by the probe is within a noise level.
    Type: Application
    Filed: August 27, 2014
    Publication date: July 21, 2016
    Applicant: KAWASAKI JUKOGYO KABUSHIKI KAISHA
    Inventor: Toshihiro YAMAOKA
  • Patent number: 9297788
    Abstract: A determination assist system including a first image generating section for generating a first planar image based on data of a first test index; a second image generating section for generating a second planar image based on data of a second test index; a differentiation section which differentiates the first planar image and the second planar image to generate a first differential image and a second differential image, respectively; a binarization section which binarizes the first differential image to generate a first binary image including a first region which is not less than a first threshold and a second region which is less than the first threshold, and binarizes the second differential image to generate a second binary image including a third region which is not less than a second threshold and a fourth region which is less than the second threshold; and a determination image generating section.
    Type: Grant
    Filed: October 10, 2014
    Date of Patent: March 29, 2016
    Assignee: KAWASAKI JUKOGYO KABUSHIKI KAISHA
    Inventors: Kenji Tsubaki, Katsumi Nagata, Toshihiro Yamaoka, Hideyuki Hirasawa, Hironori Okauchi
  • Publication number: 20150020594
    Abstract: A determination assist system including a first image generating section for generating a first planar image based on data of a first test index; a second image generating section for generating a second planar image based on data of a second test index; a differentiation section which differentiates the first planar image and the second planar image to generate a first differential image and a second differential image, respectively; a binarization section which binarizes the first differential image to generate a first binary image including a first region which is not less than a first threshold and a second region, which is less than the first threshold, and binarizes the second differential image to generate a second binary image including a third region which is not less than a second threshold and a fourth region which is less than the second threshold; and a determination image generating section.
    Type: Application
    Filed: October 10, 2014
    Publication date: January 22, 2015
    Inventors: Kenji TSUBAKI, Katsumi NAGATA, Toshihiro YAMAOKA, Hideyuki HIRASAWA, Hironori OKAUCHI
  • Patent number: 8934703
    Abstract: A determination assist system including a first image generating section for generating a first planar image based on data of a first test index; a second image generating section for generating a second planar image based on data of a second test index; a differentiation section which differentiates the first planar image and the second planar image to generate a first differential image and a second differential image, respectively; a binarization section which binarizes the first differential image to generate a first binary image including a first region which is not less than a first threshold and a second region which is less than the first threshold, and binarizes the second differential image to generate a second binary image including a third region which is not less than a second threshold and a fourth region which is less than the second threshold; and a determination image generating section.
    Type: Grant
    Filed: October 4, 2010
    Date of Patent: January 13, 2015
    Assignee: Kawasaki Jukogyo Kabushiki Kaisha
    Inventors: Kenji Tsubaki, Katsumi Nagata, Toshihiro Yamaoka, Hideyuki Hirasawa, Hironori Okauchi
  • Publication number: 20120250970
    Abstract: A determination assist system including a first image generating section for generating a first planar image based on data of a first test index; a second image generating section for generating a second planar image based on data of a second test index; a differentiation section which differentiates the first planar image and the second planar image to generate a first differential image and a second differential image, respectively; a binarization section which binarizes the first differential image to generate a first binary image including a first region which is not less than a first threshold and a second region which is less than the first threshold, and binarizes the second differential image to generate a second binary image including a third region which is not less than a second threshold and a fourth region which is less than the second threshold; and a determination image generating section.
    Type: Application
    Filed: October 4, 2010
    Publication date: October 4, 2012
    Applicant: KAWASAKI JUKOGYO KABUSHIKI KAISHA
    Inventors: Kenji Tsubaki, Katsumi Nagata, Toshihiro Yamaoka, Hideyuki Hirasawa, Hironori Okauchi
  • Publication number: 20120013721
    Abstract: An audio/video processing device includes a signal processing circuit and a video reproduction circuit. The signal processing circuit supplies an audio signal to a hearing aid, and delays a video signal from the audio signal by a delay time of the hearing aid and supplies the delayed video signal to a video reproduction circuit. The hearing aid performs a hearing aid process on the audio signal supplied from the signal processing circuit to reproduce a sound. The video reproduction circuit reproduces an image from the video signal supplied from the signal processing circuit.
    Type: Application
    Filed: September 23, 2011
    Publication date: January 19, 2012
    Applicant: PANASONIC CORPORATION
    Inventors: Takatoshi NISHIO, Kenjl Nabara, Toshihiro Yamaoka